A computer-implemented method for testing a modulation transfer function or spatial frequency response of an imaging system includes, on a computing device, generating a plurality of accumulation cells running along an accumulation line. A boundary delineation divides a first segment of a digital test image captured by the imaging system from a second segment, and the plurality of accumulation cells collectively comprise a one-dimensional accumulation array. For each of the accumulation cells, a projection ray is generated that extends through the accumulation cell and through the digital test image Each accumulation cell is loaded with an accumulated pixel value based on pixel values sampled from each of a plurality of sampling locations along the projection ray. The modulation transfer function or spatial frequency response of the imaging system is derived from the one-dimensional accumulation array.

A camera testing system for determining performance of a camera comprising an imaging sensor and a lens, the system comprising a processing system comprising at least one processor and memory. The processing system may be configured to: control the camera to capture, using the imaging sensor, a first image through the lens of a target disposed at a first distance from the camera; determine a first modulation transfer function (MTF) value from the first image; control the camera to capture, using the imaging sensor, a second image through the lens of the target disposed at a second distance from the camera that is different from the first distance; determine a second MTF value from the second image; and determine performance of the camera based on the first MTF value, the second MTF value and a difference between the first MTF value and the second MTF value.

A wavefront sensor includes a splitting element configured to split an incident light beam into a plurality of light beams, an image sensor configured to receive the plurality of light beams, and a processing unit configured to calculate a wavefront of the incident light beam based on an intensity distribution of the plurality of light beams received by the image sensor. The splitting element is either in direct contact with the image sensor or in contact with the image sensor via a plate glass. In the calculation of the wavefront, the processing unit corrects a relative positional deviation between the splitting element and the image sensor by calculating a rotation about a rotation axis.

An optical device and method of forming the optical device include a substrate having an integrated metal pattern proximate a detector or top absorber layer to minimize diffraction effects. The integrated metal pattern is aligned with selective regions of the pixel array structure of the detector layer for masking pixels of the pixel array structure. The pattern of the integrated metal pattern may be used for alignment with modulation transfer function (MTF) structures of the detector layer for MTF testing, for alignment with reference pixels of the detector layer for spatial reference used during calibration of the optical device, or for forming a polarizer grid.

An optical apparatus includes a first light source, a second light source, a chart, an optical system, and a light receiving system. The chart is configured to guide light emitted from the first light source to a target optical system. The optical system is configured to form a point image by using light emitted from the second light source. The light receiving system is configured to receive first light emitted from the chart via the target optical system and second light emitted from the point image via the target optical system. The first light and the second light enter different positions of the target optical system.

A device for measuring the Modulation Transfer Function (MTF) of an optical system, the device including a six-axis manipulator and an internal focusing collimator. The internal focusing collimator is fixedly installed on a flange of the manipulator. The manipulator is used to adjust the exit pupil of the internal focusing collimator and the posture of the internal focusing collimator. The tool control points of the manipulator are set at the exit pupil of the internal focusing collimator. The exit pupil of the focus collimator is located at the entrance pupil of the optical system to be measured so that the exit pupil of the inner focus collimator and the entrance pupil of the optical system to be measured are arranged in parallel. The device uses a manipulator to surround the tool point, only changing the posture and does not change the characteristics of the position transformation.

A system and method for high-throughput testing and module integration of rotationally variant optical lens systems is provided. In some examples, the system may be a metrology system that includes a light source to generate optical illumination. The metrology system may also include a null element. The null element may generate, using the optical illumination from the light source, a prescribed wavefront corresponding to a unit under test (UUT). In addition, the metrology system may further include a null element fixture to position the null element with respect to the unit under test (UUT).

An amount obtained by multiplying a vector amount obtained by Fourier transform of a wavefront of a spectacle lens by a preset predetermined vector amount is adopted as an evaluation index of the spectacle lens, and the evaluation index is evaluated based on the evaluation index.

A method of manufacturing a polymer film includes melting a resin, extruding the melted resin through a die to produce a polymer film, shaping the polymer film, cooling the polymer film, capturing an image of a test pattern through the polymer film, calculating a modulation transfer function value from the image, and adjusting a process parameter of the melting, the extruding, the shaping, or the cooling based on the calculated modulation transfer function value.

Systems and methods for evaluating an optical device include a pattern source that provides a pattern suitable for use in the evaluating the optical device. The optical device images the pattern to provide an image. The optical device has an optical device and an image sensor, with an associated image sensor plane. An image analysis system determines, from the image, a tip and a tilt for a component of the optical device relative to the image sensor plane that maximizes a depth of focus for the optical device.