A laser microdissectate specimen collector for a laser microdissection device includes a collecting chamber configured to receive a dissectate. The collecting chamber has, on a specimen side, an opening open to the environment for receiving the dissectate. The collecting chamber also has a first valve. The first valve, in a closed state thereof, forms a closure of the collecting chamber opposite to the opening for retaining the dissectate. A capillary line is connected downstream of the first valve to the collecting chamber such that the capillary line is configured to transport the dissectate out of the collecting chamber.

Polymer hydrogels and methods for selective retrieval of microbial targets from microwells and other cell culture devices. The methods use semi-permeable, photodegradable hydrogel membranes that permit exchange of nutrients and waste products but seals motile bacteria and other microbes within microwells. Light exposure can be used to degrade the hydrogel membrane in a targeted manner and release the microbes from targeted microwells for further study.

Methods and apparatus are disclosed for the preparation of microscopic samples using light pulses. Material volumes greater than 100 μm.sup.3 are removed. The methods include inspecting an object with a scanning electron microscope (SEM) or a focused ion beam (FIB). The inspection includes recording an image of the object. The methods also includes delineating within the object a region to be investigated, and delineating a laser-machining path based on the image of the object so that a sample can be prepared out of the object. The methods further include using laser-machining along the delineated laser-machining path to remove a volume that is to be ablated, and inspecting the object with the scanning electron microscope (SEM) or a focused ion beam (FIB).

A method for calibrating a laser deflection device in a reflected light device of a microscope of a laser microdissection system having a digital image capturing unit comprising an image evaluation module includes generating a laser beam; guiding the laser beam through a microscope objective; directing the laser beam to a position defined by actuation signals; placing a calibration object in the object plane of the microscope objective; actuating the laser deflection device using first actuation signals and first calibration values, making at least one calibration mark on the calibration object; capturing an image of the calibration object by the digital image capturing unit; determining actual position values for the at least one calibration mark: and determining second calibration values based on a relationship between the default position values and the actual position values.

A method for preparing a sample of organic material for laser induced breakdown spectroscopy (LIBS) may include obtaining granular organic material, forming a portion of the granular organic material into a sample pellet, and searing the organic material. The searing may include searing only an exposed end surface of the sample pellet on which LIBS analysis is to be performed. The method may include pressing the seared sample pellet to consolidate the material comprising the seared end surface.

A method for laser microdissection includes: processing a microscopic examination object by a laser beam using tuples of coordinate values which respectively indicate positions of target points on the examination object at least in a first spatial direction and a second spatial direction orthogonal to the first spatial direction, positions of at least three reference points being ascertained beforehand in each case in the first and second spatial directions and also in a third spatial direction orthogonal to the first and second spatial directions; defining a reference plane based on the positions of the reference points; and determining, for the target points, further coordinate values indicating an expected position of the target points on the examination object in the third spatial direction in each case, as determined further coordinate values, the determining of the further coordinate values being performed depending on the defined reference plane.

According to the present invention, a system (1; 1′) for processing at least one substrate (2) containing a dried fluid sample (21) is provided, the system (1; 1′) comprising a support (12) configured to position the substrate (2), a laser device (3) for directing a laser beam (31) to the substrate (2), configured to cut at least one area of the substrate (2) containing the dried fluid sample (21) by means of the laser beam (31), a container holder (4; 4′) configured to hold and position a container (5) for receiving the cut area, the container holder (4; 4′) being arranged below the substrate (2), and an extraction subsystem (6) for extracting fume and/or dust generated when laser cutting the substrate (2), wherein the extraction subsystem (6) consists of at least two extraction components (61, 62) sandwiching the substrate (2) there between. Furthermore, a method for automated processing at least one substrate (2) containing a dried fluid (21) sample by means of such a system (1; 1′) is provided.

Systems and methods are described for securing fabric, paper, and film samples for analysis by laser ablation. A method embodiment includes, but is not limited to, securing a thin, solid sample with a sample holder system, the sample holder system configured to hold the thin, solid sample in a taut configuration between a piston and a sample holder base; transferring the sample holder system to a laser ablation system; and ablating at least a portion of the thin, solid sample in the taut configuration with the laser ablation system to provide an ablated sample.

A method includes applying a liquid cover to a microscopic sample to obtain a processed microscopic sample, generating at least one marker for a part of the processed microscopic sample using an imaging system, removing at least a part of the liquid cover from the processed microscopic sample to obtain an uncovered microscopic sample, and extracting a part of the uncovered microscopic sample, based on the at least one marker, to obtain an extracted part.

The present application provides a method for preparing a test sample of a semiconductor device. In an initial orientation, a side surface of the sample substrate exposes a cross section of the semiconductor device to be tested. The semiconductor device has a porous structure on the cross section. Then a filling material is deposited on the porous structure on the cross section to be tested. Next, cutting the sample substrage in a direction perpendicular to the sample substrate, when the sample substrate is in the initial orientation to obtain a sheet test sample, wherein a side surface of the sheet test sample is the cross section to be tested. The method mitigate porous structure effect on a prepared TEM sample, thereby improving quality of a TEM image.