A method for measuring the optical quality of a delineated region of a glazing, the delineated region being intended to be placed in front of an acquiring or measuring device such as a camera. The method is particularly suitable for measuring the optical quality of a delineated region of a transportation-vehicle glazing, such as an airplane or automobile windshield, in front of which an optical device for recording images or a device for measuring the environment outside the vehicle is placed with a view to enabling operation of an advanced driver-assistance system of the vehicle.

An inspection system is provided for detecting defects on surfaces. The system uses a pattern with varying color or darkness which faces the surface. A light illuminates the pattern on the surface so that the pattern and any defects on the surface are reflected and captured for image analysis. The processor then separates the pattern from the image in order to identify the locations of any defects on the surface.

An inspection system is provided for detecting defects on surfaces. The system uses a pattern with varying color or darkness which faces the surface. A light illuminates the pattern on the surface so that the pattern and any defects on the surface are reflected and captured for image analysis. The processor then separates the pattern from the image in order to identify the locations of any defects on the surface.

A method and installation of inspecting a fragmentation pattern of a tempered glass panel by deflectometry, following a fragmentation test, the method including: (i) positioning the tempered glass panel in contact with a support; (ii) projecting by a display device a structured light pattern on the surface of at least one portion of the tempered glass panel; (iii) capturing an image reflected by the surface of the first portion of the tempered glass panel using an image capture device; and (vi) processing the images to determine the fragmentation pattern by an image processing device.

An inspection system for detecting optical defects in a transparency includes a first rounded array of first elongated light elements, and a second rounded array of second elongated light elements. The second rounded array is positionable radially outboard of the first rounded array. The inspection system further includes a light-element-moving system configured to radially translate at least the first elongated light elements. The inspection system also includes an image recording device positionable on a side of the transparency opposite the first and second rounded arrays and configured to record images of the transparency during radial translation of at least the first elongated light elements during backlighting of the transparency. The inspection system includes a processor configured to analyze the images recorded during radial translation of at least the first elongated light elements, and detect optical defects in the transparency based on analysis of the images.

The present document describes methods and systems for the automatic inspection of material quality. A set of lights with a geometric pattern is cast on a material to be analyzed. Depending on the material being inspected, same may act as a mirror and the reflected image is captured by a capture device, or the light passes through the material being inspected and the image is captured by a capture device. Defects in the material can be detected by the distortion caused by same in the pattern of the reflected image or passing through. Finally, software is used to identify and locate these distortions, and consequently the defects in the material. This classification of defects is carried out using artificial intelligence techniques.

An inspection system for detecting optical defects in a transparency includes a first rounded array of first elongated light elements, and a second rounded array of second elongated light elements. The second rounded array is positionable radially outboard of the first rounded array. The inspection system further includes a light-element-moving system configured to radially translate at least the first elongated light elements. The inspection system also includes an image recording device positionable on a side of the transparency opposite the first and second rounded arrays and configured to record images of the transparency during radial translation of at least the first elongated light elements during backlighting of the transparency. The inspection system includes a processor configured to analyze the images recorded during radial translation of at least the first elongated light elements, and detect optical defects in the transparency based on analysis of the images.

An inspection system for detecting defects in a workpiece can include an illumination source for illuminating a first section of the workpiece with a patterned light, wherein the illumination source does not illuminate a second section of the workpiece. The inspection system further includes a feedback camera for imaging the first section and producing a first output, and a background camera for imaging the second section and producing a second output. A processor compares the first output with the second output, and a controller alters the patterned light that is output by the illumination source based on the comparison. This feedback control continues until the background is suitably homogeneous or camouflaged compared to the defect, such that the visibility and/or detectability of the defect is increased.

A measuring apparatus includes a light receiving device, a housing, an optical window, an electrical connection line, and a line enclosure. The light receiving device receives light and output a signal. The housing, made of a conductive material, covers the light receiving device. The optical window transmits the light. The optical window includes a conductive part having conductivity. The electrical connection line transmits the signal. The line enclosure is disposed around the electrical connection line and electrically connected to the conductive part and the housing.

An inspection system for detecting defects in a workpiece can include an illumination source for illuminating a first section of the workpiece with a patterned light, wherein the illumination source does not illuminate a second section of the workpiece. The inspection system further includes a feedback camera for imaging the first section and producing a first output, and a background camera for imaging the second section and producing a second output. A processor compares the first output with the second output, and a controller alters the patterned light that is output by the illumination source based on the comparison. This feedback control continues until the background is suitably homogeneous or camouflaged compared to the defect, such that the visibility and/or detectability of the defect is increased.