A method for illumination of an object to be observed to be observed and the background, the method comprising the steps of: obtaining a relationship between wavelength and spectral radiance of the object while the object and the background are illuminated by a first light source that emits light that has a continuous spectrum in the wavelength range from 380 nanometers and 780 nanometers, and determining a value of representative wavelength that corresponds to a maximum value of the spectral radiance of the object plotted against wavelength or values of representative wavelength that correspond to maximum values of the spectral radiance of the object plotted against wavelength; determining a value or values of comparative wavelength; and illuminating the object and the background with light of the value or values of representative wavelength and light of the value or values of comparative wavelength.

The invention relates to a method in the preparation of samples for microscopic examination onto which a coverslip is applied. The method is notable for the fact that the coverslipping quality is checked automatically and at least partly optically. The invention further relates to an apparatus for carrying out the method, and to an apparatus for checking the coverslipping quality of samples onto which a coverslip is applied.

An image inspection device and a lighting device capable of setting an irradiation solid angle for each location of a visual field and capable of miniaturization are provided. The image inspection device includes a photographing portion that photographs the target, and a light transmissible lighting portion that is disposed between the target and the photographing portion and configured to irradiate light in a direction toward the target. The lighting portion includes a plurality of light-emitting portions that is arranged in a matrix form and configured to be capable of selectively emitting light, and an optical system configured to control irradiation directions of the light emitted from each of the plurality of light-emitting portions to be directions corresponding to positions of each of the plurality of light-emitting portions.

In accordance with some embodiments of the present disclosure, an inspection method of a photomask includes performing a first inspection process, unloading the photomask from the inspection system, and performing a second inspection process. In the first inspection process, a common Z calibration map of an objective lens of an optical module with respect to the photomask is generated and stored, and a first image of the photomask is captured by using an image sensor while focusing the objective lens of the optical module based on the common Z calibration map. The photomask is unloaded from the inspection system. In the second inspection process, the photomask is loaded on the inspection system and a second image of the photomask is captured by using an image sensor while focusing an objective lens of an optical module based on the common Z calibration map generated in the first inspection process.

The invention relates to a method for the manufacture of a prophylactic article, especially of a glove, from a (carboxylated) diene rubber, according to which a layer of a (carboxylated) diene latex is applied on a former and the (carboxylated) diene latex is cross-linked with a cross-linking agent, which is immobilized on inorganic and/or organic particles with formation of modified particles, and the modified particles are added to the (carboxylated) diene latex.

An image acquisition method includes storing a coefficient of a relational expression between a parameter corresponding to a light quantity incident on an imaging sensor including a photo sensor element and an output value of the imaging sensor in the case of the light incident on the imaging sensor which employs a reference image accumulation time, inputting a desired image accumulation time, and calculating a parameter for obtaining a desired output value of the imaging sensor by using a corrected relational expression obtained by correcting using an output value of the imaging sensor employing the desired image accumulation time in the case of the incident light quantity being zero, adjusting the light quantity incident on the imaging sensor to be a calculated parameter, and acquiring a target image by the imaging sensor on which an adjusted light quantity is incident, and outputting data of the acquired image.

A combined OCD and photoreflectance system and method for improving the OCD performance in measurements of optical properties of a target sample. The system comprises (a) either a single channel OCD set-up comprised of a single probe beam configured in a direction normal/oblique to the target sample or a multi-channel OCD set-up having multiple probe beams configured in normal and oblique directions to the target sample for measuring the optical properties of the target sample, (b) at least one laser source for producing at least one laser beam, (c) at least one modulation device to turn the at least one laser beam into at least one alternatingly modulated laser beam, and (d) at least one spectrometer for measuring spectral components of the at least one light beam reflecting off said target sample; wherein the at least one alternatingly modulated laser beam is alternatingly modulating the spectral reflectivity of the target sample,

The invention relates to a luminaire element (10, 11) for an inspection tunnel (100), in particular for checking shiny surfaces, in particular painted surfaces, comprising at least two, preferably strip-like, arrangements (12) of light sources (13) in a luminaire housing (14) having at least two edge regions (15) lying opposite one another along a longitudinal extension (L) of the luminaire housing (14), wherein the strip-like arrangements (12) of the light sources (13) are formed along the longitudinal extension (L) at the edge regions (16), wherein a light exit surface (20) of the luminaire housing (14) has a higher radiation intensity along the edge regions (16) than in a central region (30). The invention further relates to a luminaire strip (50) having an arrangement of luminaire elements (10, 11) of this kind and to an inspection tunnel having an arrangement of a plurality of luminaire strips (50).

A fluorescent optical system and a fluorescent image inspection system are provided. The fluorescent optical system includes a platform, at least one light source device, and at least one first filter. The platform is configured for placement of a sample to be inspected. The at least one light source device is configured to illuminate the sample to be inspected, so that the sample to be inspected is stimulated to generate a fluorescent light. The at least one first filter is correspondingly arranged in an optical path of the at least one light source device, so that an excitation light passes through the at least one first filter. An incident angle is formed between the excitation light and the platform, and the incident angle is less than 90 degrees.

In one embodiment, systems and methods include using a workforce augmenting inspection device (“WAND”) to measure a parameter of an aircraft. The WAND comprises a body, wherein the body comprises one or more buttons configured to actuate the WAND to perform one or more functions. The WAND further comprises a head comprising a camera and a light source, wherein the light source is disposed around the camera operable to produce light in conjunction with operation of the camera, wherein the camera is operable to capture an image within a scope of view of the camera. The WAND further comprises a standoff wheel, wherein the standoff wheel is operable to rotate independently of the head. The WAND further comprises a power source operable to provide power to the WAND, wherein the power source comprises a controller configured to actuate the head, camera, and light source.