The present invention relates to the technical field of identification on adulterated meat, and in particular, to a method for identifying raw meat and high-quality fake meat based on a gradual linear array change of a component. The present invention spatially characterizes changing rules of featured components in the meat with the utilization of sensitivities of the visible/near-infrared spectral signals to changes of the components in the meat and the advantage that spectral scanning can acquire optical signals of the samples spatially and consecutively, further constructs the identification model according to differences in components and spectra of a region of interest in the hyperspectral image by taking a derivative for characterizing rates of change of the featured components.

A system for providing active real-time characterization of an article under test is disclosed. An infrared light source, a first visible light source and a second visible light source each outputs and directs a beam of coherent light at a particular area on the article under test. A visible light camera and a visible light second harmonic generation camera, an infrared camera and an infrared second harmonic generation camera, a sum frequency camera and a third order camera are each configured to receive a respective predetermined return beam of light from the particular area on the article under test. A processor receives signals from the cameras and calculates in real time respective spectroscopic signals and compares each calculated signal with each other calculated signal and with a predetermined baseline signal to ensure that the article under test conforms to an expected value.

A method of testing the structural integrity of a rigid container comprises performing a sampling process on the rigid container comprising sampling a volume of sample gas from a sampling region associated with the rigid container, wherein the method further comprises performing a detection process comprising producing one or more laser beams for excitation of one or more materials that may be in the volume of sample gas, wherein the one or more materials are representative of a gas and/or vapour and/or a liquid leak from the rigid container and detecting light that has passed through the volume of sample gas, and determining the presence and/or absence and/or amount of said one or more materials in the volume of sample gas based on detected light.

A method for fabricating a semiconductor device is provided. The method includes: loading a substrate on a stage of an apparatus for inspecting the substrate; extracting a first light having a first wavelength from a light by using a light source; acquiring first position information on at least one focal point, formed on the substrate, based on the first wavelength by using a controller, the at least one focal point being a pre-calculated at least one focal point; adjusting a position of at least one from among an objective lens and at least one microsphere in a vertical direction by using the first position information in the controller; condensing the first light, which has passed through the at least one microsphere, on the at least one focal point formed on the substrate; and inspecting the substrate by using the first light condensed on the at least one focal point.

Methods and systems for monitoring the quality of a semiconductor measurement in a targeted manner are presented herein. Rather than relying on one or more general indices to determine overall measurement quality, one or more targeted measurement quality indicators are determined. Each targeted measurement quality indicator provides insight into whether a specific operational issue is adversely affecting measurement quality. In this manner, the one or more targeted measurement quality indicators not only highlight deficient measurements, but also provide insight into specific operational issues contributing to measurement deficiency. In some embodiments, values of one or more targeted measurement quality indicators are determined based on features extracted from measurement data. In some embodiments, values of one or more targeted measurement quality indicators are determined based on features extracted from one or more indications of a comparison between measurement data and corresponding measurement data simulated by a trained measurement model.

A method for inspecting a surface of a wafer, includes steps of: irradiating a surface of the wafer with a laser beam having three or more distinct wavelengths; detecting a reflected light from the surface of the wafer when the surface of the wafer is irradiated with the laser beam; and determining whether a foreign matter exists on the surface of the wafer based on reflectances of the surface of the wafer with respect to the laser beam having the three or more distinct wavelengths, wherein the step of determining whether the foreign matter exists includes a step of determining whether the foreign matter is a metal or a non-metal.

A manual inspection workstation, including abase and a body pivotally connected to one another and moveable between an upright position and compacted stowed position. A hood is connected to the body opposite the base and at least partially houses a light source. The manual inspection workstation includes a surface coating with physical properties that meet and exceed various FDA and U.S. Pharmacopeia guidelines and requirements. The light source includes a plurality of lighting options including intensity, color output, hue, and saturation. The light source further includes a communications module that allows multiple light sources to be wired together In a sequence or ring. The communications module further includes wireless connectivity to a remote computing device. The light source may further include an internal microprocessor and memory for instituting certain preconfigured light profile protocols.

Methods of deep ultraviolet fluorescence (DUVF) and multi spectral imaging (MSI) detection are disclosed herein for the detection and identification of pathogens on plants. DUV light and visible or near-infrared light are used to illuminate plants or plant leaves such that the light intensity reflected or emitted by the plant or plant leaves can be used to identify the type of pathogen and measure the amount of pathogen on the plant or plant leaves and, additionally, be used to measure the plant's stress response to such pathogen. Also provided herein is a biophotonic analyzer device that uses both DUVF and MSI detection for the monitoring and surveillance of plant health and for the identification and enumeration of pathogens on plants or plant leaves.

A substrate inspection apparatus configured to inspect a substrate by using an image of a surface of the substrate includes a holder configured to hold the substrate; a first light source unit configured to emit visible light to the substrate; a second light source unit configured to emit ultraviolet light to the substrate; a first imaging sensor configured to perform capturing of a visible light image of the substrate by receiving reflected light from the substrate; a second imaging sensor configured to perform capturing of an ultraviolet light image of the substrate by receiving reflected light or scattered light from the substrate; and a controller configured to acquire the visible light image from the first imaging sensor and the ultraviolet light image from the second imaging sensor. The visible light image and the ultraviolet light image are images obtained by imaging a common region of the substrate.

The invention relates to a method for the manufacture of a prophylactic article, especially of a glove, from a (carboxylated) diene rubber, according to which a layer of a (carboxylated) diene latex is applied on a former and the (carboxylated) diene latex is cross-linked with a cross-linking agent, which is immobilized on inorganic and/or organic particles with formation of modified particles, and the modified particles are added to the (carboxylated) diene latex.