Patent classifications
G01N2021/95638
Method Of And Optical System For Illuminating A Sample Surface
Various embodiments may provide a method of illuminating a sample surface. The method may include arranging an illumination subsystem, the illumination subsystem including an optical source and at least one lens, having an optic axis at an incident angle greater than 0° and less than 90° to a normal of the sample surface such that a reference illumination distribution is directly generated on the sample surface based on optical light emitted by the illumination subsystem. The method may also include arranging an adjustment optical subsystem such that an adjusted illumination distribution which is more symmetrical compared to the reference illumination distribution is generated on the sample surface based on optical light emitted by the illumination subsystem.
EXTERNAL APPEARANCE INSPECTION APPARATUS AND EXTERNAL APPEARANCE INSPECTION METHOD
An object is to shorten time required for visual inspection. A visual inspection device (1) configured to inspect an appearance of an inspection object (30), the visual inspection device (1) including: an imager (3) configured to image the inspection object (30) arranged at a predetermined position of the visual inspection device (1); and a height measurer (11, 12) configured to measure a height of the inspection object (30) carried into the visual inspection device (1) or carried out from the visual inspection device (1).
INSPECTION APPARATUS AND INSPECTION METHOD
An inspection apparatus includes a light source unit, cameras, a keyboard, and a controller that determines a wavelength of the excitation light, based on the information on the emission color received by the keyboard, and that controls the light source unit so that the light source unit generates excitation light with the determined wavelength. The controller determines a wavelength longer than an absorption edge wavelength of the substrate of the sample and shorter than a peak wavelength of an emission spectrum of the light-emitting element, the peak wavelength being specified from the information on the emission color, to be the wavelength of the excitation light.
METHOD OF AUTOMATICALLY SETTING OPTICAL PARAMETERS AND AUTOMATED OPTICAL INSPECTION SYSTEM USING THE SAME
A method of automatically setting optical parameters, using Automatic Optical Inspection (AOI) System, the method includes: obtaining a recommended object image when the AOI system under a first recommended optical parameter set; performing computation on a standard image of a and a recommended image of the to-be-measured object according to an optimized error function to obtain a recommended error value between the standard image and the recommended image; determining whether the recommended error value converges, when determining that the recommended error value does not converge, performing computation according to the recommended error value and first recommended optical parameter set to obtain a second recommended optical parameter set; when the recommended error value converges, deciding the first recommended optical parameter set as the best optical parameter set of the AOI system.
MEASUREMENT MACHINE AND METHOD FOR DETECTING A DEFECT IN SOLDER JOINTS
Example implementations relate to an inspection method for training a measurement machine to accurately measure side joint lengths and detecting a defect among a plurality of solder joints. The method includes receiving a first data representing the side joint lengths of the plurality of solder joints measured by a first measurement machine and a second data representing the side joint lengths measured by a second measurement machine. Further, the method includes determining a correlation value based on a statistical analysis of a relationship between the first data and the second data. The method further includes updating an algorithm used by the first measurement machine to measure the side joint lengths, based on the correlation value to reduce deviation between the first data and the second data. Later, the updated algorithm is used as a dimensional metrology in the first measurement machine for detecting the defect in the solder joints.
INSPECTION DEVICE AND INSPECTION METHOD
The present disclosure provides an inspection device for use in a mounting system including a mounting device for disposing a component on a board, including a control section configured to extract a mass area included in a captured image resulting from imaging a processing target object where a viscous fluid is formed at a predetermined part, obtain a center of gravity of the mass area so extracted, and determine whether the center of gravity is included in a normal range of the predetermined part as a reference of the captured image to thereby determine whether a bridge has occurred where the viscous fluid is formed over adjacent predetermined parts.
Remote video inspection system
The embodiments of the Remote Video Inspection System comprise a remote video inspection hardware assembly and a video inspection software system. The remote video inspection hardware assembly is comprised of a camera and a stage assembly. The stage assembly is comprised of a horizontal gimbal, an outer gimbal, and an inner gimbal, a base plate, and a component table. The video inspection software system is comprised of both a local and remote component. The local component is operated by a technician who oversees the remote inspection, and allows for setup, manual positioning, and manual camera adjustment. The remote component is operated by an inspector, and provides video feed to them, as well as a system to control the viewing angle and position of the component/camera.
System and Method for Inspection of Multiple Features of Patterned Objects in the Manufacture of Electrical Circuits
A method for inspection of multiple features of patterned objects in the manufacture of electrical circuits, the method including performing defect detection on the patterned object, employing an optical defect detection machine (ODDM) and employing the ODDM to measure at least one of spatial coordinates and physical attributes of at least some of the multiple features.
Inspection device and inspection method
An inspection device includes: an analyzer to calculate a parameter representing a feature of image data of an object having no defect by performing dimensionality reduction on the image data, and perform dimensionality reduction on image data of an object to be inspected by using the parameter; a restorer to generate restored data obtained by restoring the image data of the object to be inspected subjected to the dimensionality reduction; a corrector to filter the restored data by using a filter for correcting an error between the restored data and the image data of the object to be inspected, thereby generating corrected restored data; a determiner to output a determination result indicating whether the object to be inspected is defective, based on a difference of each pixel between the image data of the object to be inspected and the corrected restored data; and an interface to output the determination result.
3D IMAGE ACQUISITION SYSTEM FOR OPTICAL INSPECTION AND METHOD FOR OPTICAL INSPECTION OF OBJECTS, IN PARTICULAR ELECTRONIC ASSEMBLIES, ELECTRONIC BOARDS AND THE LIKE
An automatic 3D image acquisition system for optical inspection of objects (B) includes one or more light sources (including a laser source) configured to emit a light toward a field of view wherein an object (B) to be inspected is placed, and at least one digital sensor that acquires at least part of the light reflected by the object (B) to be inspected.
The the-digital sensor includes and intensity sensor and is operatively connected to a data processing unit configured to determine physical and/or geometric features of the object (B) to be inspected on the basis of the light acquired by the digital sensor.
The automatic optical inspection system includes an image intensifier apparatus and optical elements which define a path of the laser light pulse from the laser source to the field of view and from the field of view to the image intensifier apparatus.