G01N21/17

Sample analyzer and analyzing method thereof

The present disclosure provides a sample analyzer and an analyzing method thereof. The sample analyzer includes a first beam source configured to provide a first energy beam to a sample, a second beam source configured to provide a second energy beam, which is different from the first energy beam, to the sample, a reflected beam sensor disposed between the second beam source and the sample to detect a reflected beam of the second energy beam, which is reflected by one side of the sample, and a transmitted beam sensor disposed adjacent to the other side of the sample to detect a transmitted beam of the second energy beam.

Sample analyzer and analyzing method thereof

The present disclosure provides a sample analyzer and an analyzing method thereof. The sample analyzer includes a first beam source configured to provide a first energy beam to a sample, a second beam source configured to provide a second energy beam, which is different from the first energy beam, to the sample, a reflected beam sensor disposed between the second beam source and the sample to detect a reflected beam of the second energy beam, which is reflected by one side of the sample, and a transmitted beam sensor disposed adjacent to the other side of the sample to detect a transmitted beam of the second energy beam.

Photothermal imaging device and system

Mid-infrared photothermal heterodyne imaging (MIR-PHI) techniques described herein overcome the diffraction limit of traditional MIR imaging and uses visible photodiodes as detectors. MIR-PHI experiments are shown that achieve high sensitivity, sub-diffraction limit spatial resolution, and high acquisition speed. Sensitive, affordable, and widely applicable, photothermal imaging techniques described herein can serve as a useful imaging tool for biological systems and other submicron-scale applications.

APPARATUS AND METHODS FOR COMBINED BRIGHTFIELD, DARKFIELD, AND PHOTOTHERMAL INSPECTION

Disclosed are methods and apparatus for detecting defects or reviewing defects in a semiconductor sample. The system has a brightfield (BF) module for directing a BF illumination beam onto a sample and detecting an output beam reflected from the sample in response to the BF illumination beam. The system has a modulated optical reflectance (MOR) module for directing a pump and probe beam to the sample and detecting a MOR output beam from the probe spot in response to the pump beam and the probe beam. The system includes a processor for analyzing the BF output beam from a plurality of BF spots to detect defects on a surface or near the surface of the sample and analyzing the MOR output beam from a plurality of probe spots to detect defects that are below the surface of the sample.

METHOD FOR MONITORING SLIDING CONTACTS

The invention relates to a measuring system for measuring a sample in an automated analysis machine. The measuring system comprises a measuring device for recording measurement values of a measured variable and a first controller and a second controller for processing the measurement values and a sliding contact system with sliding contacts, wherein the measurement values are transferred from the measuring device to the first controller and wherein the measurement values are transferred from the first controller to the second controller via the sliding contacts. The measuring system comprises an error counter which captures the errors occurring during the transfer of the measurement values from the first controller to the second controller via the sliding contacts.

KIT FOR DETECTING VIRUS

The present invention relates to a kit for detecting a virus, a composition for detecting a virus and a method for detecting a virus. According to the present invention, viruses may be detected with high efficiency at low cost within a short period of time.

KIT FOR DETECTING VIRUS

The present invention relates to a kit for detecting a virus, a composition for detecting a virus and a method for detecting a virus. According to the present invention, viruses may be detected with high efficiency at low cost within a short period of time.

Arrangement for Measuring Gas Concentrations
20180011007 · 2018-01-11 · ·

An arrangement for measuring gas concentrations in a gas absorption method, wherein the arrangement includes a plurality of light sources, a measuring cell, at least one measuring receiver and an evaluation apparatus. The measuring cell has a narrow, longitudinally-extended beam path with an entrance-side opening diameter B and an absorption length L with L>B, wherein the measuring cell has a gas inlet and a gas outlet wherein a plurality of light sources of different wavelength spectra is grouped into a first light source group wherein an optical homogeniser is interposed between the first light source group and the measuring cell, wherein, in particular, the homogeniser is coupled to the light source group directly or via a common optical assembly.

Optical Vibration Detection System and Method
20180011006 · 2018-01-11 · ·

A system includes at least one earpiece wherein each earpiece comprises an earpiece housing, a light source operatively connected to each earpiece housing and configured to transmit substantially coherent light toward an outer surface of a user's body, a light receiver operatively connected to the earpiece housing proximate to the light source and configured to receive reflected light from the outer surface of the user's body, and one or more processors disposed within the earpiece housing and operatively connected to the light source and light receiver, wherein one or more processors is configured to determine bone vibration measurements from the reflected light. A method of determining bone vibrations includes providing at least one earpiece, transmitting substantially coherent light toward an outer surface of a user's body using the earpiece, receiving reflected light from the outer surface of the user's body using the earpiece, and determining bone vibration measurements using the earpiece.

MULTIPOINT PHOTO-ACOUSTIC MEASURING DEVICE
20230003636 · 2023-01-05 ·

A method comprises non-destructive contact-free physical characterization of a sample by repeated excitations of the surface of a sample with a sequence of pulses comprising at least one pump pulse by a first “pump” laser followed by a succession of L temporarily offset pulses by a second “probe” laser, and the analysis of the beam emitted by the surface of the sample by an activated photodetector, for the acquisition of signals delivered by the photodetectors during constant time windows.