Uniform light irradiation to the measurement object is realized, and it is possible to obtain high resolution image information, to provide a reflective optical sensor. An optical sensor comprises a light irradiation unit for performing uniform light irradiation with respect to the measurement object, the viewing angle control plate for limiting the direction of the reflected light in the measurement object to the predetermined direction, a light detecting unit for acquiring image information showing the distribution of the reflected light obtained through the viewing angle control plate. The viewing angle control plate is a louver array film or a fiber optic plate.

In one embodiment, a method is provided. The method includes obtaining a sequence of images of a three-dimensional volume of a material. The method also includes determining a set of features based on the sequence of images and a first neural network. The set of features indicate microstructure features of the material. The method further includes determining a set of material properties of the three-dimensional volume of the material based on the set of features and a first transformer network.

In one embodiment, a method is provided. The method includes obtaining a sequence of images of a three-dimensional volume of a material. The method also includes determining a set of features based on the sequence of images and a first neural network. The set of features indicate microstructure features of the material. The method further includes determining a set of material properties of the three-dimensional volume of the material based on the set of features and a first transformer network.

A microfluidic device and a detection method for the microfluidic device are provided. The microfluidic device includes a driving substrate configured to drive a movement of a droplet; and a position detector configured to detect a position of the droplet on the driving substrate.

An indicator and method of use thereof, and indicator system and method of use thereof are provided to determine the degree of an oxidative treatment. An indicator is incorporated into the oxidative treatment. The object and the indicator are subjected to the oxidative treatment. A discoloration of the indicator occurs based on an oxidation of the polymer by a process condition of the oxidative treatment oxidizing the polymer. The discoloration of the indicator is measured against a threshold color value to determine the degree of the oxidative treatment.

An indicator and method of use thereof, and indicator system and method of use thereof are provided to determine the degree of an oxidative treatment. An indicator is incorporated into the oxidative treatment. The object and the indicator are subjected to the oxidative treatment. A discoloration of the indicator occurs based on an oxidation of the polymer by a process condition of the oxidative treatment oxidizing the polymer. The discoloration of the indicator is measured against a threshold color value to determine the degree of the oxidative treatment.

A terahertz gas spectrometer detection system is provided. The system includes: a terahertz generation module, a gas module, a terahertz detection module and a program-control and acquisition module. terahertz generation module is configured for generating and transmitting terahertz signals with different frequencies; gas module is configured for setting and storing to-be-detected gas, so that terahertz signals with different frequencies pass through the to-be-detected gas; terahertz detection module is configured for detecting amplitude signals of terahertz signals after passing through the to-be-detected gas through field effect transistor detector; program-control and acquisition module is configured for controlling the terahertz generation module to generate and transmit frequency of terahertz signal, and is further configured for acquiring amplitude detection signals of terahertz signals after passing through the to-be-detected gas, and generating spectrogram of to-be-detected gas.

An integrated optical system includes a wavelength tunable optical source and a photonic integrated circuit (PIC). The PIC includes a set of spatial waveguide switches having an input optically coupled to the wavelength tunable optical source and a plurality of outputs. The PIC also includes an optical emitter having a plurality of inputs, each being coupled to a respective one of the plurality of outputs of the set of spatial waveguide switches, the optical emitter configured to produce at an output an optical beam having a wavelength dependent emission direction that changes as light is switched by the set of spatial waveguide switches such that the optical beam may be steered in two dimensions.

An integrated optical system includes a wavelength tunable optical source and a photonic integrated circuit (PIC). The PIC includes a set of spatial waveguide switches having an input optically coupled to the wavelength tunable optical source and a plurality of outputs. The PIC also includes an optical emitter having a plurality of inputs, each being coupled to a respective one of the plurality of outputs of the set of spatial waveguide switches, the optical emitter configured to produce at an output an optical beam having a wavelength dependent emission direction that changes as light is switched by the set of spatial waveguide switches such that the optical beam may be steered in two dimensions.

Systems and methods are provided for performing photothermal dynamic imaging. An exemplary method includes: scanning a sample to produce a plurality of raw photothermal dynamic signals; receiving the raw photothermal dynamic signals of the sample; generating a plurality of second signals by matched filtering the raw photothermal dynamic signals to reject non-modulated noise; and performing an inverse operation on the second signals to retrieve at least one thermodynamic signal in a temporal domain.