A sample observation device includes: an emission optical system that emits planar light to a sample on an XZ plane; a scanning unit that scans the sample in a Y-axis direction so as to pass through an emission surface of the planar light; an imaging optical system that has an observation axis inclined with respect to the emission surface and forms an image of observation light generated in the sample; an image acquisition unit that acquires a plurality of pieces of XZ image data corresponding to an optical image of the observation light; and an image generation unit 8 that generates XY image data based on the plurality of pieces of XZ image data. The image generation unit extracts an analysis region of the plurality of pieces of XZ image data acquired in the Y-axis direction, integrates brightness values of at least the analysis region in a Z-axis direction to generate X image data, and combines the X image data in the Y-axis direction to generate the XY image data.

A measuring apparatus is configured to acquire information on a target. The measuring apparatus includes an irradiating unit configured to irradiate a specific area of the target with irradiation light, a detecting unit configured to receive exit light from the target which is caused by irradiating the specific area with the irradiation light, and a processing unit configured to process a signal output from the detecting unit. The processing unit causes the irradiating unit to shape a wavefront of the irradiation light by feeding back a first signal output from the detecting unit that has received the exit light. The processing unit acquires information about the specific area using a second signal output from the detecting unit that has received exit light from the target which is by irradiating the specific area with irradiation light having a shaped wavefront.

A measuring apparatus is configured to acquire information on a target. The measuring apparatus includes an irradiating unit configured to irradiate a specific area of the target with irradiation light, a detecting unit configured to receive exit light from the target which is caused by irradiating the specific area with the irradiation light, and a processing unit configured to process a signal output from the detecting unit. The processing unit causes the irradiating unit to shape a wavefront of the irradiation light by feeding back a first signal output from the detecting unit that has received the exit light. The processing unit acquires information about the specific area using a second signal output from the detecting unit that has received exit light from the target which is by irradiating the specific area with irradiation light having a shaped wavefront.

The present disclosure describes a method and apparatus of measuring dynamic light scattering of a sample. In an embodiment, the apparatus includes a platen, a light source underneath the platen and configured to emit emitted light through the platen and into the sample, collector optics underneath the platen and configured to capture scattered light, and an optical absorber configured to be in contact with the sample, configured to absorb transmitted light, and configured to redirect reflected light away from the collector optics. In an embodiment, the method includes depositing a sample on a platen, emitting emitted light from a light source underneath the platen through the platen and into the sample, capturing via collector optics underneath the platen scattered light, contacting the sample with an optical absorber, absorbing via the absorber transmitted light, and redirecting via the absorber reflected light away from the collector optics.

The present disclosure describes a method and apparatus of measuring dynamic light scattering of a sample. In an embodiment, the apparatus includes a platen, a light source underneath the platen and configured to emit emitted light through the platen and into the sample, collector optics underneath the platen and configured to capture scattered light, and an optical absorber configured to be in contact with the sample, configured to absorb transmitted light, and configured to redirect reflected light away from the collector optics. In an embodiment, the method includes depositing a sample on a platen, emitting emitted light from a light source underneath the platen through the platen and into the sample, capturing via collector optics underneath the platen scattered light, contacting the sample with an optical absorber, absorbing via the absorber transmitted light, and redirecting via the absorber reflected light away from the collector optics.

A system with a deformable membrane for speckle mitigation. In some embodiments, the system includes a laser for producing laser light; a photodetector for detecting the laser light after interaction of the laser light with a sample; and a silicon deformable membrane, for modulating the phase of the laser light.

Laser light is emitted from a laser into a scattering layer. An ultrasound signal is emitted into a sample. A signal is generated with a light detector in response to a measurement beam of laser light exiting the light scattering layer into the light detector. At least a portion of the measurement beam formed between the laser and the light detector is wavelength-shifted by the ultrasound signal subsequent to the ultrasound signal propagating through the sample.

A measurement method and a measurement apparatus are capable of measuring the transmittance of a quartz crucible accurately. A measurement method includes: emitting a parallel light from a light source disposed on a side of one wall surface of a quartz crucible toward a predetermined measurement point of the quartz crucible; measuring reception levels of light transmitted through the quartz crucible at a plurality of positions by disposing a detector at the plurality of positions on a circle centered around an exit point of the parallel light on the other wall surface of the quartz crucible; and calculating a transmittance of the quartz crucible at the predetermined measurement point based on a plurality of the reception levels of the transmitted light measured at the plurality of positions.

A measurement method and a measurement apparatus are capable of measuring the transmittance of a quartz crucible accurately. A measurement method includes: emitting a parallel light from a light source disposed on a side of one wall surface of a quartz crucible toward a predetermined measurement point of the quartz crucible; measuring reception levels of light transmitted through the quartz crucible at a plurality of positions by disposing a detector at the plurality of positions on a circle centered around an exit point of the parallel light on the other wall surface of the quartz crucible; and calculating a transmittance of the quartz crucible at the predetermined measurement point based on a plurality of the reception levels of the transmitted light measured at the plurality of positions.

The disclosure relates to system and method for determining at least one property of a porous medium and includes performing a first measurement on a sample of the porous medium obtaining an optical path through pores of the porous medium using a first sensor applied utilizing a first optical technology; performing a second measurement on the sample of the porous medium obtaining a total optical path through the porous medium using a second sensor utilizing a second optical technology different from the first optical technology; and calculating an optical porosity of the porous medium based on the optical path through the pores and the total optical path through the porous medium.