According to one embodiment, an inspection system for a secondary battery includes an image sensor, a detector, and an inspection processor. The image sensor captures an image of an electrode structure of a secondary battery. The electrode structure includes an electrode and a fiber layer formed on a surface of the electrode. The electrode includes a current collector and an active material layer. The detector detects a color in data of the image captured with the image sensor. The inspection processor inspects a residue of an organic material in the fiber layer, based on the color detected with the detector.

A method of evaluating a laminate formed of two or more layers bonded to each other includes an image obtaining step of obtaining a two-dimensional image of the laminate; a detecting step of detecting air-pocket corresponding regions from a two-dimensional image; a characteristic value obtaining step of determining a characteristic value related to areas of the air-pocket corresponding regions; and an evaluation step of evaluating the laminate based on the characteristic value. is a method of evaluating a laminate.

A method of evaluating a laminate formed of two or more layers bonded to each other includes an image obtaining step of obtaining a two-dimensional image of the laminate; a detecting step of detecting air-pocket corresponding regions from a two-dimensional image; a characteristic value obtaining step of determining a characteristic value related to areas of the air-pocket corresponding regions; and an evaluation step of evaluating the laminate based on the characteristic value. is a method of evaluating a laminate.

Provided are a defect inspection device, a defect inspection method, and a program, and a printing device and a method of manufacturing a printed matter, in which a defect of a printed matter is inspected by performing registration between reference data and imaging data of the printed matter printed on the basis of the reference data with high accuracy at high speed. The reference data and the imaging data of the printed matter printed on the basis of the reference data by a single-pass type printing device that includes an inkjet head having a plurality of nozzles disposed in a nozzle direction are acquired, registration between the imaging data and the reference data in the nozzle direction is performed by using nozzle mapping information indicating a correspondence relationship between positions of the plurality of nozzles and pixel positions of the imaging data in the nozzle direction, and a defect of the printed matter is inspected in response to an input of the imaging data and the reference data that have been subjected to registration.

Provided are a defect inspection device, a defect inspection method, and a program, and a printing device and a method of manufacturing a printed matter, in which a defect of a printed matter is inspected by performing registration between reference data and imaging data of the printed matter printed on the basis of the reference data with high accuracy at high speed. The reference data and the imaging data of the printed matter printed on the basis of the reference data by a single-pass type printing device that includes an inkjet head having a plurality of nozzles disposed in a nozzle direction are acquired, registration between the imaging data and the reference data in the nozzle direction is performed by using nozzle mapping information indicating a correspondence relationship between positions of the plurality of nozzles and pixel positions of the imaging data in the nozzle direction, and a defect of the printed matter is inspected in response to an input of the imaging data and the reference data that have been subjected to registration.

According to one embodiment, a grain size estimation device includes an acquisition unit that acquires a captured image of a surface segment of an object inducing metal; and an estimation unit that estimates a grain size of the surface segment of the object indicated in the acquired image, based on a predictive model generated by machine learning using images of metal surfaces and grain sizes in the metal surfaces as training data.

A surface detection system and method for continuous casting billet using two-dimensional and three-dimensional combined imaging. The detection system comprises an encoder (2), a position sensing mechanism, and a mounting rack (3), sequentially provided along a running direction of a continuous casting billet (1). The mounting rack (3) is provided with a three-dimensional imaging mechanism (4) and a two-dimensional imaging mechanism (5) sequentially along the running direction of the continuous casting billet (1). The position sensing mechanism starts the encoder (2), which records position information of the continuous casting billet (1). The mounting rack (3) is further provided with a lifting device (6). The three-dimensional imaging mechanism (4) moves up and down along the lifting device (6). The mounting rack (3) is further provided with an insulation plate (7). The two-dimensional imaging mechanism (5) is located above the insulation plate (7), and the continuous casting billet (1) is located below the insulation plate (7). Two-dimensional image data information and three-dimensional image data information are integrated to effectively detect real defects on the surface of the continuous casting billet (1) and filter pseudo defects.

A pistachio sorting device capable of accurately detecting BGY fluorescence emitted from a fluorescent material adhered to a shell of an in-shell pistachio to perform pass/fail determination and sort out defective products at high speed is provided. The pistachio sorting device comprises a lighting device 11 for irradiating in-shell pistachios which are objects to be sorted in an inspection region with ultraviolet light having a maximum peak wavelength within a range of 345 nm to 390 nm, an optical filter 12 for selectively transmitting light within a wavelength range of 500 nm to 600 nm, a sensor 13 for detecting a two-dimensional intensity distribution of the fluorescence transmitted through the optical filter 12 to generate two-dimensional image data indicating a two-dimensional intensity distribution of fluorescence in the inspection region, and a determining device for determining a pass/fail of for each object to be sorted 10 based on the two-dimensional image data.

A defect inspection apparatus includes a first slit light source together with a machine base in which a through hole is formed. A second slit light source and a half mirror are provided inside the through hole. First slit light from the first slit light source is directly incident on an object to be photographed (for example, an automobile body). On the other hand, second slit light from the second slit light source proceeds in a direction perpendicular to the direction in which the first slit light proceeds, and thereafter, is refracted by the half mirror, led out from the through hole, and made incident on the object to be photographed.

A defect inspection apparatus includes a first slit light source together with a machine base in which a through hole is formed. A second slit light source and a half mirror are provided inside the through hole. First slit light from the first slit light source is directly incident on an object to be photographed (for example, an automobile body). On the other hand, second slit light from the second slit light source proceeds in a direction perpendicular to the direction in which the first slit light proceeds, and thereafter, is refracted by the half mirror, led out from the through hole, and made incident on the object to be photographed.