A heating system for use in mechanical testing at scales of microns or less includes a stage heater. The stage heater having a stage plane, and a stage heating element distributed across the stage plane. Two or more support mounts are on opposed sides of the stage plane. A first bridge extends from the stage plane to a first mount of the two or more support mounts, and a second bridge extends from the stage plane to a second mount of the two or more support mounts. The first and second bridges provide a plurality of supports between the stage plane and two or more support mounts to accordingly support the stage plane. In another example, the heating system includes a probe heater configured to heat a probe as part of mechanical testing.

The invention relates to a device for carrying out bending tests on panel-shaped or beam-shaped samples (1), in which two rotary drives are arranged at a distance from one another and a flange (3) is fastened to each of the drive shafts of the rotary drives, said drive shafts being oriented parallel to one another. At least two bar-shaped bending elements (2) oriented parallel to the axis of rotation of the drive shafts and arranged at a distance from the axis of rotation and at a distance from one another are provided on each of the flanges (3). A panel-shaped or beam-shaped sample (1) can be introduced between the two bar-shaped bending elements (2) on the two flanges (3). In the event of rotation of the rotary drives in opposite directions of rotation, bending forces are exerted on the sample (1) and each of the two rotary drives can be controlled individually and connected to an electronic open-loop or closed-loop control unit.

An assembly for shock testing a specimen, the assembly including first and second opposing brackets and opposing lower and upper caps. The opposing brackets include lower and upper angled surfaces. The lower cap includes lower angled surfaces configured to engage the lower angled surfaces of the left and right brackets. The upper cap includes upper angled surfaces configured to engage the upper angled surfaces of the left and right brackets. The first and second brackets are configured to be drawn toward each other via fasteners, thereby wedging the lower and upper caps toward each other against the specimen.

An assembly for shock testing a specimen, the assembly including first and second opposing brackets and opposing lower and upper caps. The opposing brackets include lower and upper angled surfaces. The lower cap includes lower angled surfaces configured to engage the lower angled surfaces of the left and right brackets. The upper cap includes upper angled surfaces configured to engage the upper angled surfaces of the left and right brackets. The first and second brackets are configured to be drawn toward each other via fasteners, thereby wedging the lower and upper caps toward each other against the specimen.

An assembly for shock testing a specimen, the assembly including first and second opposing brackets and opposing lower and upper caps. The opposing brackets include lower and upper angled surfaces. The lower cap includes lower angled surfaces configured to engage the lower angled surfaces of the left and right brackets. The upper cap includes upper angled surfaces configured to engage the upper angled surfaces of the left and right brackets. The first and second brackets are configured to be drawn toward each other via fasteners, thereby wedging the lower and upper caps toward each other against the specimen.

An assembly for shock testing a specimen, the assembly including first and second opposing brackets and opposing lower and upper caps. The opposing brackets include lower and upper angled surfaces. The lower cap includes lower angled surfaces configured to engage the lower angled surfaces of the left and right brackets. The upper cap includes upper angled surfaces configured to engage the upper angled surfaces of the left and right brackets. The first and second brackets are configured to be drawn toward each other via fasteners, thereby wedging the lower and upper caps toward each other against the specimen.

Provided are a striking device and a natural frequency measuring device capable of simply and accurately measuring a natural frequency of a system including force detector. The striking device includes an arm capable of swinging around a spindle, and a steel ball arranged in an end part of the arm on a side opposite to the spindle. The spindle is supported by a supporting part capable of lifting up and down relative to a post erected on a magnet stand. A supporting part for supporting a supporting plate is arranged at a position in the post and above the supporting part. A permanent magnet is placed above the supporting plate. The steel ball falls down in an arc shape from a standby height position when the permanent magnet is removed.

Provided are a material testing machine and a gripping force detecting method that can easily judge whether a test piece is gripped with an appropriate gripping force by a gripper. A controlling section is connected to a FFT transforming section via a load cell; the FFT transforming section calculates a natural frequency of a system comprising a test piece and an upper gripper which is connected to a load cell based on a detected value of a force of the load cell. In addition, the controlling section is connected to a storing section which stores the natural frequency calculated by the FFT transforming section. Furthermore, the controlling section is also connected to a comparing section which compares the natural frequency calculated by the FFT transforming section and the natural frequency stored by the storing section before a test starts.

An example flexible substrate testing system includes: a first substrate support structure configured to hold a first portion of a flexible substrate under test; a second substrate support structure configured to hold a second portion of the flexible substrate; one or more actuators configured to move the first and second substrate support structures at respective angles to fold the flexible substrate; and load cells configured to measure loads on the first substrate support structure and the second substrate support structure while the actuator moves the first substrate support structure and the second substrate support structure.

The invention relates to a device for carrying out bending tests on panel-shaped or beam-shaped samples (1), in which two rotary drives are arranged at a distance from one another and a flange (3) is fastened to each of the drive shafts of the rotary drives, said drive shafts being oriented parallel to one another. At least two bar-shaped bending elements (2) oriented parallel to the axis of rotation of the drive shafts and arranged at a distance from the axis of rotation and at a distance from one another are provided on each of the flanges (3). A panel-shaped or beam-shaped sample (1) can be introduced between the two bar-shaped bending elements (2) on the two flanges (3). In the event of rotation of the rotary drives in opposite directions of rotation, bending forces are exerted on the sample (1) and each of the two rotary drives can be controlled individually and connected to an electronic open-loop or closed-loop control unit.