The invention described herein is a spectrometer having components allowing remote orientation of crystal analyzer and detector.

The invention described herein is a spectrometer having components allowing remote orientation of crystal analyzer and detector.

A spectrometer having components allowing remote orientation of crystal analyzer and detector. The spectrometer may comprise a detector and a crystal analyzer. The crystal analyzer can be operably attached to a first arm and the detector may be operably attached to a second arm. The first arm and the second arm may be linked. The detector and crystal analyzer may move rotationally around a first axis and independently of each other.

A method of Particle-Induced X-Ray Emission (PIXE) analysis comprises: (a) delivering a first ion beam from a first ion source and comprising ions having a first composition onto an area of a sample, wherein the kinetic energy of the ions is not greater than 50 kilo-electron-Volts (keV); (b) simultaneously with the delivering of the first ion beam onto the sample area, delivering a second ion beam from a second ion source onto the sample area, the second ion beam comprising ions having a second composition, wherein the kinetic energy of the ions of the second ion beam is not greater than 50 keV; and (c) detecting X-rays that are emitted from the sample area in response to the simultaneous delivery of the first and second ion beams thereto.