A fluorescent probe includes one or more metal binding functional group, such as phosphonic acid group and an arsonic acid group, in which the functional group is covalently linked to a fluorescent core via a sp.sup.2-carbon atom of the fluorescent core. In embodiments, the fluorescent core is an organic fluorescent compound/moiety, that can be a tetrapyrrole derivative, such as porphyrin or phthalocyanine, acridine, BODIPY, cyanine or cyanine derivatives, carbazole, coumarine or coumarine derivatives, xanthene or xanthene derivatives such as fluorescein or rhodamine. The fluorescent probe can bind to calcium and/or a calcification, such as hydroxyapatite (HAP). In a further aspect, a fluorescent probe is used in a method of detecting calcium, such as a calcification or HAP, in a bodily tissue. The use of the fluorescent probe is also provided for detecting calcium, a calcification and/or HAP, such as calcium depositions in a bodily tissue.

A charged particle beam device includes: a movement mechanism configured to hold and move a sample; a charged particle source configured to emit charged particles with which the sample is irradiated to obtain an image of the sample; and a control unit configured to control the movement mechanism to move the sample and to obtain the image of the sample. The control unit obtains a reference image of the sample in a reference arrangement state by the charged particles, generates a goal image of the sample in a target arrangement state different from the reference arrangement state by calculation from the reference image, moves the sample to each of different arrangement states by the movement mechanism, obtains a candidate image of the sample in each of the different arrangement states by the charged particles, and generates a comparison result between respective candidate images and the goal image.

A charged particle beam device includes: a movement mechanism configured to hold and move a sample; a charged particle source configured to emit charged particles with which the sample is irradiated to obtain an image of the sample; and a control unit configured to control the movement mechanism to move the sample and to obtain the image of the sample. The control unit obtains a reference image of the sample in a reference arrangement state by the charged particles, generates a goal image of the sample in a target arrangement state different from the reference arrangement state by calculation from the reference image, moves the sample to each of different arrangement states by the movement mechanism, obtains a candidate image of the sample in each of the different arrangement states by the charged particles, and generates a comparison result between respective candidate images and the goal image.

The present disclosure provides a method for analyzing the signal of a neutral atom imaging unit, including: preparing a neutral atom imaging unit, which includes a semiconductor detector array and modulation grids disposed at intervals in front of the semiconductor detector array; preparing a neutral atom source plane, energetic neutral atoms emitted by the neutral atom source plane are received by the semiconductor detector array after passing through the modulation grids, and the modulation grids form a projection on the semiconductor detector array; obtaining a response function of the imaging unit according to the projection; calculating the data signal obtained by the neutral atom imaging unit; and performing inversion imaging on the neutral atom emission source according to the response function of the imaging unit and the data signal. The method well inverts the neutral atom emission source to obtain the intensity and size of the neutral atom emission source.

The present disclosure provides a method for analyzing the signal of a neutral atom imaging unit, including: preparing a neutral atom imaging unit, which includes a semiconductor detector array and modulation grids disposed at intervals in front of the semiconductor detector array; preparing a neutral atom source plane, energetic neutral atoms emitted by the neutral atom source plane are received by the semiconductor detector array after passing through the modulation grids, and the modulation grids form a projection on the semiconductor detector array; obtaining a response function of the imaging unit according to the projection; calculating the data signal obtained by the neutral atom imaging unit; and performing inversion imaging on the neutral atom emission source according to the response function of the imaging unit and the data signal. The method well inverts the neutral atom emission source to obtain the intensity and size of the neutral atom emission source.

The present invention relates to a system (S) and a process for determining the water equivalent content of a snowpack (Snow Water EquivalentSWE)

The present invention relates to a system (S) and a process for determining the water equivalent content of a snowpack (Snow Water EquivalentSWE).