The present disclosure relates to methods of obtaining electron diffraction data of microcrystalline samples.

A gantry for a computed tomography device has a support structure, a pivot bearing, a rotating frame, a first braking resistor configured to electromotively brake a rotational movement of the rotating frame, and a heat conductor configured to dissipate heat from the first braking resistor. A heat conductor and a pressure duct wall are interconnected to form a heat-conductor-to-pressure-duct-wall connection that is detachable, form-fitting, planar, and thermally conductive. The heat is transferrable from the first braking resistor to the airflow via the heat conductor, the heat-conductor-to-pressure-duct-wall connection and the pressure duct wall.

An X-ray imaging system including: an X-ray Talbot imaging apparatus which is provided with an object table, an X-ray source, a plurality of gratings, and an X-ray detector side by side in a direction of an X-ray radiation axis, and irradiates the X-ray detector with an X-ray from the X-ray source through an object and the plurality of gratings to obtain a moire image required for forming a reconstruction image of the object; and an object housing inside which the object is housed and an environmental condition independent of an external environment is set, wherein the object housing is provided detachably with respect to the object table.

The present disclosure may provide a detector module of an imaging apparatus. The detector module may include a detector assembly configured to detect a signal associated with an object; a cover assembly configured to accommodate the detector assembly; and at least one cooling assembly operably coupled to the cover assembly. The at least one cooling assembly may be configured to cool the detector assembly by providing a cooling medium to the cover assembly.

A qualification process for a sample to be examined by means of cryo-electron microscopy. The, sample (12) is applied to a sample carrier (10) provided for cryo-electron microscopy and subsequently the sample (12) arranged on the sample carrier is examined by means of dynamic light scattering. The particle size distribution within the sample (12) is determined by means of the dynamic light scattering. Further, a sample holder designed to carry out the qualification process.

There is provided systems and methods for generating 3D structure estimation of at least one target from a set of 2D Cryo-electron microscope particle images. The method includes: receiving the set of 2D particle images of the target from a Cryo-electron microscope; splitting the set of particle images into at least a first half-set and a second half-set; iteratively performing: determining local resolution estimation and local filtering on at least a first half-map associated with the first half-set and a second half-map associated with the second half-set; aligning 2D particles from each of the half-sets using at least one region of the associated half-map; for each of the half-maps, generating an updated half-map using the aligned 2D particles from the associated half-set; and generating a resultant 3D map using all the half-maps.

This invention is intended to allow an experimenter to work at amenable temperatures while viewing and/or manipulating aqueous protein crystals or other specimens under a dissection microscope at close to 4° C. or other controlled temperatures. The invention provides a specimen stage chamber large enough to fit a multi-well plate containing the specimens. The temperature of this specimen stage chamber is controlled by transparent coolant circulated through its walls and through a transparent chamber beneath the specimen stage chamber, without blocking the light path of the microscope. An additional chamber cools the air above the specimen stage chamber. In one version of this apparatus, circulation of most coolants is replaced by an array of Peltier coolers. The apparatus is open to the air above, giving the experimenter direct access to the crystals for manipulation. The invention may have wider application for manipulation of other specimens under a microscope

A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.

An X-ray analyzer includes an X-ray excitation device, an X-ray detection device, and a gate valve. The X-ray excitation device includes a sample chamber in which a sample as an analysis target can be disposed. The X-ray detection device includes a TES which can detect a characteristic X-ray emitted from the sample, and a room-temperature shield which surrounds the TES. The gate valve is disposed between the X-ray excitation device and the X-ray detection device. The inside of the room-temperature shield is provided to enable communication with the inside of the sample chamber. The gate valve includes a partition plate provided to enable blocking of a communication between the inside of the sample chamber and the inside of the room-temperature shield. The partition plate has a pressure-resistant X-ray window.

An in-situ X-ray analysis apparatus includes: a potentiostat connected to an in-situ electrochemical cell and configured to control a voltage, current, and time of the in-situ electrochemical cell, or to record voltage, current, resistance, capacity, and time information of the in-situ electrochemical cell; an X-ray analysis apparatus configured to obtain X-ray diffraction information of the in-situ electrochemical cell; and a controller connected to the X-ray analysis apparatus and the potentiostat and configured to provide or receive a signal to or from each of the X-ray analysis apparatus and the potentiostat.