G01N2223/3106

X-ray imaging system containing x-ray apparatus having gratings and object housing for setting environmental condition independent of external environment

An X-ray imaging system including: an X-ray Talbot imaging apparatus which is provided with an object table, an X-ray source, a plurality of gratings, and an X-ray detector side by side in a direction of an X-ray radiation axis, and irradiates the X-ray detector with an X-ray from the X-ray source through an object and the plurality of gratings to obtain a moire image required for forming a reconstruction image of the object; and an object housing inside which the object is housed and an environmental condition independent of an external environment is set, wherein the object housing is provided detachably with respect to the object table.

Method for evaluating semiconductor substrate

The present invention provides a method for evaluating a semiconductor substrate subjected to a defect recovery heat treatment to recover a crystal defect in the semiconductor substrate having the crystal defect, flash lamp annealing is performed as the defect recovery heat treatment, and the method includes steps of measuring the crystal defect in the semiconductor substrate, which is being recovered, by controlling treatment conditions for the flash lamp annealing and analyzing a recovery mechanism of the crystal defect on the basis of a result of the measurement. Consequently, the method for evaluating a semiconductor substrate which enables evaluating a recovery process of the crystal defect is provided.

IN-SITU X-RAY DIFFRACTION ANALYSIS APPARATUS INCLUDING PELTIER-TYPE TEMPERATURE CONTROL UNIT AND ANALYZING METHOD USING THE SAME

An in-situ X-ray analysis apparatus includes: a potentiostat connected to an in-situ electrochemical cell and configured to control a voltage, current, and time of the in-situ electrochemical cell, or to record voltage, current, resistance, capacity, and time information of the in-situ electrochemical cell; an X-ray analysis apparatus configured to obtain X-ray diffraction information of the in-situ electrochemical cell; and a controller connected to the X-ray analysis apparatus and the potentiostat and configured to provide or receive a signal to or from each of the X-ray analysis apparatus and the potentiostat.

Device, system and method for X-ray diffraction analysis of an electrode of an electrochemical cell, at operating temperature and under current

A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.

APPARATUS FOR REAL-TIME MONITORING OF ORGANIC MATTER POROSITY EVOLUTION USING SELECTIVE PHOTO-THERMAL LASER AS A HEAT SOURCE TO TARGET ORGANIC MATTER ONLY
20230375457 · 2023-11-23 · ·

A rock testing system includes a rock sample having organic matter provided on a stand in a testing device and a photothermal laser that emits a selected wavelength corresponding to an absorption peak of the organic matter. Methods for testing the rock sample include irradiating the rock sample with the photothermal laser to selectively heat the organic matter and monitoring porosity of the rock sample as the organic matter is heated.

STRUCTURE FOR PRESSURIZATION ANALYSIS, X-RAY DIFFRACTION APPARATUS AND PRESSURIZATION ANALYSIS SYSTEM
20220099603 · 2022-03-31 · ·

A structure for pressurization analysis includes a sample accommodating unit (10) for accommodating an all-solid-state battery (S) therein, and a pressurizing unit (30) having a pressurizing mechanism for causing pressure to act on the all-solid-state battery (S). The all-solid-state battery (S) is pressurized inside the sample accommodating unit (10) while being sandwiched between a pressure receiving member (21) and a pressing member (22). Further, an X-ray window (14) is provided in an outer radial direction orthogonal to an acting direction of the pressure from the pressurizing unit (30), and reflection type X-ray diffraction measurement can be performed through the X-ray window (14).

DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELECTRODE OF AN ELECTROCHEMICAL CELL, AT OPERATING TEMPERATURE AND UNDER CURRENT
20210109043 · 2021-04-15 ·

A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.

Device for clamping and controlling the temperature of planar samples for x-ray diffractometry

The invention relates to an apparatus (1) for clamping flat samples (6), in particular pouch battery cells, for x-ray diffractometry, wherein the apparatus has a housing (2) having a sample holder (4), which has holding elements (5) that are able to be tensioned in relation to one another for clamping the sample (6), at least two x-ray windows (11a, 11b, 12) for letting in and out x-rays, and at least one first temperature control device (7) for controlling the temperature of the sample (6). At least one first temperature control device (7) is in each case attached to the holding elements (5), wherein the first temperature control devices (7) are thermally coupled to the housing (2), and the apparatus has at least one second temperature control device (9), which is configured to dissipate heat, which is output by the first temperature control device (7) to the housing (2), out of the housing (3) to the outside and/or to introduce heat from the outside into the housing (2).

Visible test system and rock mass heating method

A visible test system includes a test chamber system, a heating system, a pressure control system, and a high-energy accelerator CT detection system configured to scan and detect the seepage and migration of magnetic fluid in fractures in a sample. The test chamber system includes a pressure chamber and a sample encapsulation device immersed in hydraulic oil arranged inside the pressure chamber. The heating system includes a magnetic fluid heating device, a resistance wire heating device and a temperature detection device. The magnetic fluid heating device includes a magnetic fluid loading pump configured to supply the magnetic fluid injected into the sample encapsulation device and an alternating magnetic field control device configured to provide an alternating magnetic field for heating the magnetic fluid. The resistance wire heating device is configured to heat the hydraulic oil. The present invention makes the fracture connectivity change during rock mass fracture visible.

X-RAY IMAGING SYSTEM CONTAINING X-RAY APPARATUS HAVING GRATINGS AND OBJECT HOUSING FOR SETTING ENVIRONMENTAL CONDITION INDEPENDENT OF EXTERNAL ENVIRONMENT
20200319120 · 2020-10-08 ·

An X-ray imaging system including: an X-ray Talbot imaging apparatus which is provided with an object table, an X-ray source, a plurality of gratings, and an X-ray detector side by side in a direction of an X-ray radiation axis, and irradiates the X-ray detector with an X-ray from the X-ray source through an object and the plurality of gratings to obtain a moire image required for forming a reconstruction image of the object; and an object housing inside which the object is housed and an environmental condition independent of an external environment is set, wherein the object housing is provided detachably with respect to the object table.