An embodiment of a shutter assembly is described that comprises a support structure with a number of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein a first station comprises a first aperture, a first charged particle filter, and a first window; and a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window.

A radiation imaging apparatus includes an attenuation member for reducing reflection of components arranged on a backside of the radiation imaging apparatus generated by back scattered radiation that has reflected on a structure on the backside of the radiation imaging apparatus, the attenuation member being provided on the backside of the radiation incident plane of the radiation detection unit, wherein the attenuation member is made of a material with a higher atomic number and a material with a lower atomic number than a material with a highest atomic number among materials of the component, covers an end portion of an outer shape of the component overlapping the radiation detection unit in orthogonal projection onto the second plane, and is smaller in area than the radiation detection unit.

A detection scheme for x-ray small angle scattering is described. An x-ray small angle scattering apparatus may include a first grating and a complementary second grating. The first grating includes a plurality of first grating cells. The complementary second grating includes a plurality of second grating cells. The second grating is positioned relative to the first grating. A configuration of the first grating, a configuration of the second grating and the relative positioning of the gratings are configured to pass one or more small angle scattered photons and to block one or more Compton scattered photons and one or more main x-ray photons.

Embodiments may relate an x-ray filter. The x-ray filter may be configured to be positioned between an x-ray source output and a device under test (DUT) that is to be x-rayed. The x-ray filter may include at least 80% titanium (Ti) by weight. Other embodiments may be described or claimed.

This application relates to apparatus and method for x-ray fluorescence analysis. There is provided an X-ray fluorescence analysis apparatus for analysing a sample, The X-ray fluorescence analysis apparatus comprises an X-ray source, a measurement chamber for holding the sample in air, and an X-ray detector. The X-ray source is arranged to irradiate the sample with a primary X-ray beam, to cause the sample to fluoresce. The X-ray detector is arranged to detect characteristic X-rays emitted by the sample and to determine a measured X-ray intensity associated with the characteristic X-rays. An X-ray filter, which transmits the primary X-ray beam, is arranged between the X-ray source and the sample. The X-ray source comprises an anode of material having an atomic number that is less than 25. The X-ray fluorescence analysis apparatus further comprises a sensor arrangement configured to sense air pressure and air temperature. A processor receives the measured X-ray intensity. The processor also receives air pressure data and air temperature data from the sensor arrangement. The processor is configured to carry out a compensation calculation for adjusting the measured X-ray intensity using the air pressure data and the air temperature data.

Disclosed is a measurement probe for a measurement of elements in a mineral slurry. The measurement probe includes a housing having an X-ray window. The housing encloses: an X ray source positioned to emit source X-rays at the X-ray window; an X-ray detector positioned to detect X-rays from the X-ray window; and a control module. The control module is configured to: control an operation of the X-ray source and the X-ray detector; process X-rays detected by the X-ray detector to generate X-ray spectra data; and process the X-ray spectra data to determine a quantity of one or more elements of interest in the mineral slurry. The measurement probe further includes a probe mount adapted to couple the measurement probe to a pipe mount on a pipe carrying the mineral slurry; when the probe mount is coupled to the pipe mount, the X-ray window provides a transmission window for X-rays into a lumen of the pipe.

Methods, systems, and apparatus for performing scanning spectral tomographic reconstruction of an object. The imaging system includes a power source that is configured to provide an alternating high voltage. The imaging system includes an X-ray source. The X-ray source includes an array of X-ray emitters that allow fast switching “ON” and “OFF” using a grid electrode. The source is configured to generate an X-ray beam with an energy spectrum based on the alternating high voltage and uses X-ray filters. The imaging system includes a controller configured to operate synchronously with the alternating high voltage. The controller is also configured to drive an actuator to position the X-ray source with respect to an object and drive the source in a pre-defined trajectory about the object. At each position in the trajectory, the controller is configured to control the exposure timing of the emitters based on a predefined firing pattern.

Some disclosed embodiments include an electron detector comprising: a first semiconductor layer having a first portion and a second portion; a second semiconductor layer; a third semiconductor layer; a PIN region formed by the first, second, and third semiconductor layers; a power supply configured to apply a reverse bias between the first and the third semiconductor layers; and a depletion region formed within the PIN region by the reverse bias and configured to generate a detector signal based on a first subset of the plurality of signal electrons captured within the depletion region, wherein the second portion of the first semiconductor layer is not depleted and is configured to provide an energy barrier to block a second subset of the plurality of signal electrons and to allow the first subset of the plurality of signal electrons to pass through to reach the depletion region.

Inspection systems employing radiation filters with different attenuation characteristics to determine specimen irregularities, and related methods are disclosed. An inspection system includes a radiation emitter configured to emit a radiation beam along a radiation trajectory. Some of the radiation may be reflected by the specimen as backscatter and received by at least one radiation detector of the inspection system along the radiation trajectory. Irregularities and various materials of the specimen may produce backscatter radiation at different energies and/or scatter angles which may be identified by employing radiation filters having different attenuation characteristics. By employing these filters in communication with the radiation emitter and the radiation detector, the backscatter radiation passed through the filters may be measured and integrated at different positions of the radiation beam to produce a composite image of the specimen. In this manner, irregularities and associated materials within the specimen may be more easily identified.

A spectrum measurement and estimation method for tomographic reconstruction, beam hardening correction, dual-energy CT and system diagnosis, etc., comprises determining the spectra for combinations of source acceleration voltage, pre-filters and/or detectors and after measuring the transmission values of several pre-filters, calculating corrected spectra for the combinations of the source acceleration voltage, pre-filters and/or detectors.