Described herein is a modulation device for periodically modulating light emitted by a light source. The modulation device includes at least one enclosing tube being rotatable about a cylinder axis of the enclosing tube. The enclosing tube includes at least one aperture disposed within a cylindrical wall of the enclosing tube. The modulation device further includes at least one driving system for rotating the enclosing tube about the cylinder axis. Also described herein are a modulated illumination device and a spectrometer device.

An X-ray imaging apparatus and method are provided. The X-ray imaging apparatus according to an aspect includes an X-ray source configured to radiate X-rays onto a subject region, an X-ray detector configured to detect the radiated X-rays and obtain a plurality of frame images of the subject region, and an ROI filter located between the X-ray source and the X-ray detector, configured to move toward the X-ray source and the X-ray detector, and configured to filter the X-rays radiated from the X-ray source.

Apertures having references edges are situated to define a sample irradiation zone and a shielded zone. The sample irradiation zone includes a portion proximate the shielded zone that is conjugate to a detector. A sample is scanned into the sample irradiation zone from the shielded zone so that the sample can remain unexposed until situated properly with respect to the detector for imaging. Irradiation exposure of the sample is reduced, permitting superior imaging.

An analysis apparatus comprises: a moveable stage assembly; a sample holder on a top surface of the stage assembly; a first photon source and a first photon detector or detector array, the first photon source being configured to emit a first beam of photons that intercepts the surface of a sample at a first location on the sample and the first photon detector or detector array being configured to detect photons that are emitted from the first location; and a second photon source and a second photon detector or detector array, the second photon source being configured to emit a second beam of photons that intercepts the surface of the sample at a second location on the sample, the second location being spaced apart from the first location, and the second photon detector or detector array being configured to detect photons that are emitted from the second location.

Apertures having references edges are situated to define a sample irradiation zone and a shielded zone. The sample irradiation zone includes a portion proximate the shielded zone that is conjugate to a detector. A sample is scanned into the sample irradiation zone from the shielded zone so that the sample can remain unexposed until situated properly with respect to the detector for imaging. Irradiation exposure of the sample is reduced, permitting superior imaging.

An inspection portal includes a first x-ray source configured to emit a first beam, a first backscatter detector configured to detect backscatter from the first beam, a second x-ray source configured to emit a second beam, a second backscatter detector configured to detect backscatter from the second beam, and at least one first collimator and at least one second collimator, each oriented to detect backscatter from the associated beam and to block scatter from the other beam. The first and second backscatter detectors are configured to weight signals acquired using each of their detector element based on the first and second beams. The first backscatter detector is configured to use signal processing techniques to mitigate crosstalk due to scatter from the second beam, and the second backscatter detector is configured to use the signal processing techniques to mitigate crosstalk due to scatter from the first beam.

An analysis apparatus comprises: a moveable stage assembly; a sample holder on a top surface of the stage assembly; a first photon source and a first photon detector or detector array, the first photon source being configured to emit a first beam of photons that intercepts the surface of a sample at a first location on the sample and the first photon detector or detector array being configured to detect photons that are emitted from the first location; and a second photon source and a second photon detector or detector array, the second photon source being configured to emit a second beam of photons that intercepts the surface of the sample at a second location on the sample, the second location being spaced apart from the first location, and the second photon detector or detector array being configured to detect photons that are emitted from the second location.

A chopper wheel assembly includes a collimator configured to narrow an x-ray beam, a chopper wheel has a planar surface configured to face in a direction of the collimator and a housing configured to receive the chopper wheel. The chopper wheel includes a central axis, a plurality of slits in the planar surface, a first projection extending from the planar surface in a direction of the collimator and a second projection extending from the planar surface in the direction of the collimator. The slits extend in radially-outward direction relative to the central axis. The first projection is located radially outward of the plurality of slits and the second projection is located radially inward of the plurality of slits. Each projection is provided for 360 degrees about the central axis. The housing includes an interior wall including a first groove configured to receive the first projection and a second groove configured to receive the second projection with the chopper wheel received within the housing.

A support unit and a collimator are relatively rotated about the axis of rotation by a rotation driving device. The collimator has a blocking region that blocks X-rays and a transmission region that allows X-rays to pass therethrough. The transmission region has a vertex positioned on the axis of rotation, and the circumferential length of the transmission region increases proportionally as it advances outward from the vertex. A sample supported by the support unit is irradiated with X-rays by an X-ray source through the transmission region of the collimator, and the fluorescent X-rays from the sample are detected by the detector. The analysis of a composition of a sample is performed based on the fluorescent X-rays detected by the detector.

A support unit and a collimator are relatively rotated about the axis of rotation by a rotation driving device. The collimator has a blocking region that blocks X-rays and a transmission region that allows X-rays to pass therethrough. The transmission region has a vertex positioned on the axis of rotation, and the circumferential length of the transmission region increases proportionally as it advances outward from the vertex. A sample supported by the support unit is irradiated with X-rays by an X-ray source through the transmission region of the collimator, and the fluorescent X-rays from the sample are detected by the detector. The analysis of a composition of a sample is performed based on the fluorescent X-rays detected by the detector.