An embodiment of a shutter assembly is described that comprises a support structure with a number of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein a first station comprises a first aperture, a first charged particle filter, and a first window; and a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window.

A device for examining a sample by means of X-radiation is provided, the device comprising: a radiation generation system for generating primary radiation; a first goniometer arm on which the radiation generation system is mounted and which is pivotable about a goniometer axis; a detection system configured to detect secondary radiation emanating from the sample; a second goniometer arm on which the detection system is mounted and which is pivotable about the goniometer axis; an evacuable sample chamber within which the sample is arrangeable in a sample region encompassing a portion of the goniometer axis, the sample chamber being delimited by a sample chamber wall which has a transmission region which is transmissive to the primary radiation and is vacuum-tight, in order to allow the primary radiation to penetrate into the sample chamber and to impinge on the sample region at different angles of incidence; wherein the sample chamber has a first opening in a detection beam path, at which the sample chamber and the detection system are connectable in a vacuum-tight manner so that the detection beam path is evacuable.

Disclosed is a measurement probe for a measurement of elements in a mineral slurry. The measurement probe includes a housing having an X-ray window. The housing encloses: an X ray source positioned to emit source X-rays at the X-ray window; an X-ray detector positioned to detect X-rays from the X-ray window; and a control module. The control module is configured to: control an operation of the X-ray source and the X-ray detector; process X-rays detected by the X-ray detector to generate X-ray spectra data; and process the X-ray spectra data to determine a quantity of one or more elements of interest in the mineral slurry. The measurement probe further includes a probe mount adapted to couple the measurement probe to a pipe mount on a pipe carrying the mineral slurry; when the probe mount is coupled to the pipe mount, the X-ray window provides a transmission window for X-rays into a lumen of the pipe.

An X-ray analyzer includes an X-ray excitation device, an X-ray detection device, and a gate valve. The X-ray excitation device includes a sample chamber in which a sample as an analysis target can be disposed. The X-ray detection device includes a TES which can detect a characteristic X-ray emitted from the sample, and a room-temperature shield which surrounds the TES. The gate valve is disposed between the X-ray excitation device and the X-ray detection device. The inside of the room-temperature shield is provided to enable communication with the inside of the sample chamber. The gate valve includes a partition plate provided to enable blocking of a communication between the inside of the sample chamber and the inside of the room-temperature shield. The partition plate has a pressure-resistant X-ray window.

A scan window for an imaging system includes at least one flexible sheet made of an X-ray transparent material and having a first end and a second end. The scan window also includes at least one tapered joint formed between the first end and the second end and secured via a bonding agent to form a joined member with the at least one flexible sheet.

A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.

An embodiment of a shutter assembly is described that comprises a support structure with a number of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein a first station comprises a first aperture, a first charged particle filter, and a first window; and a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window.

An X-ray detector for an X-ray diffraction analysis apparatus comprises a sensor, a readout circuit, a processor and a display output for communicating a display signal to a display device. The sensor detects X-ray photons by converting an X-ray photon incident on the sensor into a sensor output signal. The readout circuit receives the sensor output signal from the sensor and determines an X-ray photon count, by counting the sensor output signal. The processor is configured to calculate an X-ray intensity value using the X-ray photon count, and to generate a display signal for displaying an image representing the X-ray intensity value. The display output is configured to communicate the display signal to a display device for displaying the X-ray intensity value.

Provided is an X-ray fluorescence analyzer capable of reducing consumption of a gas constituting a measurement atmosphere. The X-ray fluorescence analyzer is provided with a sample chamber configured to place a sample therein, a measurement chamber arranged adjacent to the sample in the sample chamber, an X-ray tube configured to irradiate the sample with X-rays, and a detector configured to detect the X-rays reflected by the sample. The detector is provided with a passage through which the X-rays reflected by the sample pass, the passage being positioned in the measurement chamber-, and a hole connecting the passage and an outside of the detector.

A device for examining a sample by X-radiation having a radiation generation system for generating primary radiation, a first goniometer arm on which the radiation generation system is mounted and which is pivotable about a goniometer axis, a detection system configured to detect secondary radiation emanating from the sample, a second goniometer arm on which the detection system is mounted and which is pivotable about the goniometer axis, and an evacuable sample chamber within which the sample is arrangeable in a sample region encompassing a portion of the goniometer axis, the sample chamber being delimited by a sample chamber wall which has a transmission region which is transmissive to the primary radiation and is vacuum-tight, in order to allow the primary radiation to penetrate into the sample chamber and to impinge on the sample region at different angles of incidence.