G01N2223/318

Method for security inspection and kit of parts with a detachable single-use inlay for an X-ray tray
11385378 · 2022-07-12 ·

This disclosure relates to a method for security inspection of baggage and/or personal items. This disclosure also relates to a kit of parts with a detachable single-use inlay and an X-ray tray of a security check at an airport.

Method for security inspection and kit of parts with a detachable single-use inlay for an X-ray tray
11300704 · 2022-04-12 ·

A method for security inspection of baggage and/or personal items and a kit of parts include a detachable single-use inlay and an X-ray tray of a security check, for example, at an airport. A single-use inlay as such is also described. Furthermore, this disclosure relates to use of the kit of parts and/or the single-use inlay for the prevention of transfer of pathogenic agents. At least one metal organic framework (MOF) provided on the outer side and/or inner side of the single-use inlay is adapted and arranged to detect at least one explosive or any other hazardous compound, and/or detect at least one drug.

METHOD FOR SECURITY INSPECTION AND KIT OF PARTS WITH A DETACHABLE SINGLE-USE INLAY FOR AN X-RAY TRAY
20210310964 · 2021-10-07 ·

A method for security inspection of baggage and/or personal items and a kit of parts include a detachable single-use inlay and an X-ray tray of a security check, for example, at an airport. A single-use inlay as such is also described. Furthermore, this disclosure relates to use of the kit of parts and/or the single-use inlay for the prevention of transfer of pathogenic agents. At least one metal organic framework (MOF) provided on the outer side and/or inner side of the single-use inlay is adapted and arranged to detect at least one explosive or any other hazardous compound, and/or detect at least one drug.

System and method for cabinet x-ray systems with stationary x-ray source array

The present disclosure relates to the field of a cabinet x-ray incorporating a stationary x-ray source array, and an x-ray detector, for the production of organic and non-organic images. Stationary x-ray digital cabinet tomosynthesis systems and related methods are disclosed. According to one aspect, the subject matter described herein can include an x-ray tomosynthesis system having a plurality of stationary field emission x-ray sources configured to irradiate a location for positioning an object to be imaged with x-ray beams to generate projection images of the object. An x-ray detector can be configured to detect the projection images of the object. A projection image reconstruction function can be configured to reconstruct tomography images of the object based on the projection images of the object. In the preferred embodiment, the x-ray source or sources are statically affixed in a range from about 350° to and including about 10°.

METHOD FOR SECURITY INSPECTION AND KIT OF PARTS WITH A DETACHABLE SINGLE-USE INLAY FOR AN X-RAY TRAY
20210003516 · 2021-01-07 ·

This disclosure relates to a method for security inspection of baggage and/or personal items. This disclosure also relates to a kit of parts with a detachable single-use inlay and an X-ray tray of a security check at an airport.

Method for security inspection and kit of parts with a detachable single-use inlay for an X-ray tray
10794842 · 2020-10-06 ·

This disclosure relates to a method for security inspection of baggage and/or personal items. This disclosure also relates to a kit of parts with a detachable single-use inlay and an X-ray tray of a security check at an airport.

SYSTEM AND METHOD FOR CABINET X-RAY SYSTEMS WITH STATIONARY X-RAY SOURCE ARRAY

The present disclosure relates to the field of a cabinet x-ray incorporating a stationary x-ray source array, and an x-ray detector, for the production of organic and non-organic images. Stationary x-ray digital cabinet tomosynthesis systems and related methods are disclosed. According to one aspect, the subject matter described herein can include an x-ray tomosynthesis system having a plurality of stationary field emission x-ray sources configured to irradiate a location for positioning an object to be imaged with x-ray beams to generate projection images of the object. An x-ray detector can be configured to detect the projection images of the object. A projection image reconstruction function can be configured to reconstruct tomography images of the object based on the projection images of the object. In the preferred embodiment, the x-ray source or sources are statically affixed in a range from about 350 to and including about 10.

METHOD FOR SECURITY INSPECTION AND KIT OF PARTS WITH A DETACHABLE SINGLE-USE INLAY FOR AN X-RAY TRAY
20200110043 · 2020-04-09 ·

This disclosure relates to a method for security inspection of baggage and/or personal items. This disclosure also relates to a kit of parts with a detachable single-use inlay and an X-ray tray of a security check at an airport.

XRF instrument with removably attached window protecting film assembly

Herein disclosed is an x-ray florescence (XRF) test system which comprises an XRF test instrument used for testing a test target's responses to X-rays, the instrument including a test window allowing the X-ray and its responsive energy to pass through, and a window protecting film assembly allowing X-rays to pass through and providing protection to the window, the film assembly being configured to be coupled with the window in a fashion to be removed from or applied or reapplied over the window. The corresponding calibration mode can be manually or automatically applied according to the specific film assembly presently in use. An embodiment of the film assembly comprises a thin film fixed with an adhesive layer to a supporting frame having a closely spaced array of apertures.

Method for measuring thickness and optical properties of multi-layer film

A method for measuring a thickness and optical constants of a multi-layer film comprises the following steps: 1: depositing films on a substrate to form a multi-layer film; 2: measuring an ellipsometric spectrum of the multi-layer film; 3: when the film layer of the multi-layer film is the diamond film, step 41 is executed; when the film layer of the multi-layer film is the diamond-like film, steps 42, 5, and 6 are executed; 41: obtaining optical constants and a thickness of the film layer of the multi-layer film; 42: selecting a spectral region defining a transparent section of the film layer of the multi-layer film, and obtaining optical constants and a thickness of the film layer of the multi-layer film; 5: adjusting an amplitude and a width of an oscillator model according to the ellipsometric spectrum; and 6: evaluating a difference between an experimental value and a fitted value.