A method of operating a radiation inspection system includes identifying a regulatory region along a predetermined path where public access is restricted based upon criteria other than radiation exposure, measuring a radiation exposure level from a radiation source of the radiation inspection system within the regulatory region, irradiating a target within the regulatory region using the radiation source and without erecting a physical barricade, and determining a restricted area around the radiation source. The restricted area corresponds to an area where a radiation exposure rate exceeds a predetermined threshold. The radiation exposure rate may be determined by the radiation exposure level from the radiation source and a speed of the radiation inspection system. The method may include operating the radiation inspection system to dynamically adjust the restricted area so that it does not extend beyond the regulatory region. The radiation inspection system may be moveable along the predetermined path.

An X-ray fluorescence analyzer is provided with: a sample stage on which a sample subjected to an analysis is mounted; an X-ray source configured to irradiate the sample with primary X-rays; a detector configured to detect fluorescent X-rays emitted from the sample irradiated with the primary X-rays; an imaging unit configured to capture an image of a predetermined field-of-view area on the sample stage; a display unit configured to display the field-of-view area of the image captured by the imaging unit; and a pointer irradiation unit configured to irradiate the sample stage with a visible light at an irradiation position within an area that is outside the field-of-view area and near the field-of-view area.

The present invention provides a bright, focused visible light source that is part of a visible light alignment assembly that is coupled to an X-ray generator. The visible light source projects a bright, focused visible light beam from the X-ray generator through a collimator and object or part to be radiographed and to a detector or film, just as a subsequent X-ray beam eventually is. This allows the operator to quickly and easily visually assess the eventual position and coverage or spread of the X-ray beam and align the X-ray generator, collimator, object or part to be radiographed, and/or detector or film, with a minimum of test radiographs.

An X-ray imaging device that includes an X-ray source, an X-ray sensor that acquires intensity information of X-rays, a distance sensor that obtains distance information to a surface of an imaging object, and an information processing device that obtains imaging information by using the intensity information and the distance information. The information processing device includes an extraction unit that extracts information used in generation of the imaging information from the intensity information by using at least the distance information, and a reconstruction unit that generates the imaging information by using the intensity information.

A diffraction analysis device and a method for a full-field X-ray fluorescence imaging analysis are disclosed. The device includes a switching assembly, collimation assemblies, an X-ray source, an X-ray detector, a laser indicator, and a computer control system. The switching assembly combines with the collimation assemblies to achieve a functional effect that is previously achieved by two different types of devices through only one device by changing the positioning layout of the X-ray source and the X-ray detector. The full-field X-ray fluorescence imaging analysis can be realized, and the crystal phase composition information and the element distribution imaging information of the sample can be quickly obtained through the same device without scanning, which not only greatly improves the utilization rate of each assembly in the device, reduces the assemblies cost of the device, makes the device structure more compact, but also greatly improves the analysis efficiency and detection accuracy.

In an embodiment, a method of navigational calibration for an x-ray inspection system including an optical camera is provided. The method employs a novel two-dimensional calibration phantom. The calibration phantom can be employed to validate a navigational calibration between positions within camera images and an x-ray beam axis. The calibration phantom can be further employed to identify and compensate for incorrect navigational calibration.

The radiation detection device according to the present invention comprises: a sample holding unit; an irradiation unit configured to irradiate a sample held by the sample holding unit with radioactive rays; a detection unit configured to detect radioactive rays generated from the sample; a distance calculation unit configured to calculate a distance from a predetermined base point to an irradiated part, which is to be irradiated with radioactive rays, of the sample held by the sample holding unit; a size specification unit configured to specify a size of the irradiated part on the sample based on the calculated distance; and a display unit configured to display the specified size of the irradiated part.

An X-ray diffraction measurement method includes an arranging step of arranging a shielding plate and a two-dimensional detector on an outgoing optical axis, and a calculating step of calculating a diffraction profile indicating an X-ray intensity with respect to a diffraction angle of the object to be measured, on the basis of a two-dimensional X-ray image detected by the two-dimensional detector. In the arranging step, the shielding plate is arranged in a manner so that the slit is inclined at least in a direction about the outgoing optical axis with respect to an orthogonal direction which is orthogonal to both the incident optical axis and the outgoing optical axis.

Systems, methods, apparatuses, and computer program products for nonintrusive scanning of objects using x-ray electromagnetic radiation. One method may include adjusting, by a computed tomography scanning device, at least one operation parameter including a grey value threshold based upon a material composition of a scan target; and collecting, by the computed tomography scanning device, at least one x-ray frame of the scan target based upon the at least one adjusted operation parameter.

An X-ray imaging device that includes an X-ray source, an X-ray sensor that acquires intensity information of X-rays, a distance sensor that obtains distance information to a surface of an imaging object, and an information processing device that obtains imaging information by using the intensity information and the distance information. The information processing device includes an extraction unit that extracts information used in generation of the imaging information from the intensity information by using at least the distance information, and a reconstruction unit that generates the imaging information by using the intensity information.