Described herein are a computed tomography scanning system for inspecting an object and methods incorporating the same. The system includes an imaging assembly including a frame positioned within an underground chamber below a ground surface, a platform coupled to and translatable with respect to the frame, and a stage coupled to and rotatable with respect to the platform. The platform is translatable to raise the object above the ground surface and lower the object below the ground surface when the object is on the stage. The imaging assembly also includes an X-ray source fixed with respect to the frame and configured to emit radiation that is attenuated by the object as the platform translates and the stage rotates, and an X-ray detector fixed with respect to the frame, the X-ray detector configured to detect the radiation transmitted through the object and generate a signal representative of the transmitted radiation.

Methods include holding a sample with a movement stage configured to rotate the sample about a rotation axis, directing an imaging beam to a first sample location with the sample at a first rotational position about the rotation axis and detecting a first transmitted imaging beam image, rotating the sample using the movement stage about the rotation axis to a second rotational position, and directing the imaging beam to a second sample location by deflecting the imaging beam in relation to an optical axis of the imaging beam and detecting a second transmitted imaging beam image, wherein the second sample location is spaced apart from the first sample location at least at least in relation to the optical axis. Related systems and apparatus are also disclosed.

An anatomical imaging system comprising: a CT machine; and a transport mechanism mounted to the base of the CT machine, wherein the transport mechanism comprises a fine movement mechanism for moving the CT machine precisely, relative to the patient, during scanning.

An anatomical imaging system comprising: a CT machine; and a transport mechanism mounted to the base of the CT machine, wherein the transport mechanism comprises: a gross movement mechanism for transporting the CT machine relatively quickly across room distances; and a fine movement mechanism for moving the CT machine precisely, relative to the patient, during scanning.

An imaging system comprising: a scanner; and a transport mechanism mounted to the base of the scanner, wherein the transport mechanism comprises: a gross movement mechanism for transporting the scanner relatively quickly across room distances; and a fine movement mechanism for moving the scanner precisely, relative to the object being scanned, during scanning.

A method for scanning a patient comprising: providing an anatomical imaging system, the system comprising: a CT machine; and a transport mechanism mounted to the base of the CT machine, wherein the transport mechanism comprises: a gross movement mechanism for transporting the CT machine relatively quickly across room distances; and a fine movement mechanism for moving the CT machine precisely, relative to the patient, during scanning; transporting the CT machine to the patient, across room distances, using the gross movement mechanism; and scanning the patient while moving the CT machine precisely, relative to the patient, with the fine movement mechanism.

A method for scanning a patient, comprising: moving a CT machine across room distances to the patient; and scanning the patient while moving the CT machine precisely relative to the patient during scanning.

A method for scanning an object, comprising: moving a scanner across room distances to the object; and scanning the object while moving the scanner precisely relative to the object during scanning.

Crystallographic information of crystalline sample can be determined from one or more three-dimensional diffraction pattern datasets generated based on diffraction patterns collected from multiple crystals. The crystals for diffraction pattern acquisition may be selected based on a sample image. At a location of each selected crystal, multiple diffraction patterns of the crystal are acquired at different angles of incidence by tilting the electron beam, wherein the sample is not rotated while the electron beam is directed at the selected crystal.

Methods include holding a sample with a movement stage configured to rotate the sample about a rotation axis, directing an imaging beam to a first sample location with the sample at a first rotational position about the rotation axis and detecting a first transmitted imaging beam image, rotating the sample using the movement stage about the rotation axis to a second rotational position, and directing the imaging beam to a second sample location by deflecting the imaging beam in relation to an optical axis of the imaging beam and detecting a second transmitted imaging beam image, wherein the second sample location is spaced apart from the first sample location at least at least in relation to the optical axis. Related systems and apparatus are also disclosed.

A detector system for an x-ray imaging device includes a detector chassis, a plurality of sub-assemblies mounted to the detector chassis and within an interior housing of the chassis, the sub-assemblies defining a detector surface, where each sub-assembly includes a thermally-conductive support mounted to the detector chassis, a detector module having an array of x-ray sensitive detector elements mounted to a first surface of the support, an electronics board mounted to a second surface of the support opposite the first surface, at least one electrical connector that connects the detector module to the electronics board, where the electronics board provides power to the detector module and receives digital x-ray image data from the detector module via the at least one electrical connector. Further embodiments include x-ray imaging systems, external beam radiation treatment systems having an integrated x-ray imaging system, and methods therefor.

A method includes acquiring a first dataset of projection measurements at a first energy spectrum and a second dataset of projection measurements at a second energy spectrum different from the first energy spectrum by switching between acquiring the first dataset for a set number of consecutive views at different projection angles at the first energy spectrum and acquiring the second dataset for the set number of consecutive views at different projection angles at the second energy spectrum. The set number of consecutive views is greater than one. The method includes supplementing both the first dataset with estimated projection measurements at the first energy spectrum and the second dataset with estimated projection measurements at the second energy spectrum to provide missing projection measurements at different projection angles not acquired during the imaging scan for the first dataset and the second dataset.

Crystallographic information of crystalline sample can be determined from one or more three-dimensional diffraction pattern datasets generated based on diffraction patterns collected from multiple crystals. The crystals for diffraction pattern acquisition may be selected based on a sample image. At a location of each selected crystal, multiple diffraction patterns of the crystal are acquired at different angles of incidence by tilting the electron beam, wherein the sample is not rotated while the electron beam is directed at the selected crystal.

An imaging system including a scanner and a transport mechanism mounted to the base of the scanner, wherein the transport mechanism includes a gross movement mechanism for transporting the scanner relatively quickly across room distances and a fine movement mechanism for moving the scanner precisely, relative to the object being scanned, during scanning.

A detector system for an x-ray imaging device includes a detector chassis, a plurality of sub-assemblies mounted to the detector chassis and within an interior housing of the chassis, the sub-assemblies defining a detector surface, where each sub-assembly includes a thermally-conductive support mounted to the detector chassis, a detector module having an array of x-ray sensitive detector elements mounted to a first surface of the support, an electronics board mounted to a second surface of the support opposite the first surface, at least one electrical connector that connects the detector module to the electronics board, where the electronics board provides power to the detector module and receives digital x-ray image data from the detector module via the at least one electrical connector. Further embodiments include x-ray imaging systems, external beam radiation treatment systems having an integrated x-ray imaging system, and methods therefor.