Patent classifications
G01N2223/405
Methods and Means for Identifying Fluid Type Inside a Conduit
An x-ray-based borehole fluid evaluation tool for evaluating the characteristics of a fluid located external to said tool in a borehole using x-ray backscatter imaging is disclosed, the tool including at least an x-ray source; a radiation shield to define the output faun of the produced x-rays into the borehole fluid outside of the tool housing; at least one collimated imaging detector to record x-ray backscatter images; sonde-dependent electronics; and a plurality of tool logic electronics and power supply units. A method of using an x-ray-based borehole fluid evaluation tool to evaluate the characteristics of a fluid through x-ray backscatter imaging is also disclosed, the method including at least producing x-rays in a shaped output; measuring the intensity of backscatter x-rays returning from the fluid to each pixel of one or more array imaging detectors; and converting intensity data from said pixels into characteristics of the wellbore fluids.
Sensing using inverse multiple scattering with phaseless measurements
A permittivity sensor, for determining an image of a distribution of permittivity of a material of an object in a scene, comprising an input interface, a hardware processor, and an output interface is provided. The input interface is configured to accept phaseless measurements of propagation of a known incident field through the scene and scattered by the material of the object in the scene. The hardware processor is configured to solve a multi-variable minimization problem over unknown phases of the phaseless measurements and unknown image of the permittivity of the material of the object by minimizing a difference of a nonlinear function of the known incident field and the unknown image with a product of known magnitudes of the phaseless measurements and the unknown phases. Further, the output interface is configured to render the permittivity of the material of the object provided by the solution of the multi-variable minimization problem.
AUTOMATED MAPPING METHOD OF CRYSTALLINE STRUCTURE AND ORIENTATION OF POLYCRYSTALLINE MATERIAL WITH DEEP LEARNING
A method for two-dimensional mapping of crystal information of a polycrystalline material may include acquiring a diffraction pattern acquired by scanning an electron beam to a polycrystalline material, generating a plurality of clusters by applying a clustering algorithm to the acquired diffraction pattern based on unsupervised learning, acquiring crystal information of the polycrystalline material by applying a parallel deep convolutional neural network (DCNN) algorithm to each of the plurality of generated clusters based on supervised learning, and generating a two-dimensional image in which the acquired crystal information is mapped.
STRUCTURE INFORMATION ACQUISITION METHOD AND STRUCTURE INFORMATION ACQUISITION APPARATUS
There is provided a technique for non-destructively and relatively easily acquiring orientation information of an anisotropic material even for a large-sized object. An object is irradiated with X-rays in a tangential direction of a curved anisotropic material from a radiation source of a phase-contrast X-ray optical system. A scattering image is then obtained using a detection signal of X-rays having penetrated through the object. Structure information of the anisotropic material is acquired based on the scattering image.
METROLOGY METHOD AND SYSTEM
A metrology method for use in determining one or more parameters of a patterned structure, the method including providing raw measured TEM image data, TEM.sub.meas, data indicative of a TEM measurement mode, and predetermined simulated TEM image data including data indicative of one or more simulated TEM images of a structure similar to the patterned structure under measurements and a simulated weight map including weights assigned to different regions in the simulated TEM image corresponding to different features of the patterned structure, performing a fitting procedure between the raw measured TEM image data and the predetermined simulated TEM image data and determining one or more parameters of the structure from the simulated TEM image data corresponding to a best fit condition.
DATA PROCESSING DEVICE AND DATA PROCESSING METHOD FOR PROCESSING X-RAY DETECTION DATA, AND X-RAY INSPECTION APPARATUS PROVIDED WITH THE DEVICE OR METHOD
A data processing device is applied to an X-ray system which irradiates an object with continuous X-rays and processes data detected by a photon counting X-ray detection device. An n-dimensional vector corresponding to each of “n” energy regions set a spectrum of the continuous X-rays is calculated for each detector pixel based on the data. For each search region virtually set up based on one or more detector pixels, the n-dimensional vectors at the detector pixels belonging to each search pixel are mutually vector added in the n-dimensional space. The n-dimensional representative vector representing each of the plurality of search regions is calculated. Based on the representative vectors and an unit region having a desired size virtually set in a material space with coordinate information of the degree of attenuation of the X-rays, the information indicating the amount, type and properties of the material of the object is obtained.
ATTRIBUTE- INDEXED MULTI-INSTRUMENT LOGGING OF DRILL CUTTINGS
A method according to some embodiments comprises obtaining a formation sample from a borehole, identifying minerals present in a first portion of the formation sample and determining densities of the minerals. The method also comprises determining, using a second portion of the formation sample, material properties associated with the mineral densities. The method further comprises associating the material properties with the identified minerals using the mineral densities, and generating a log comprising the associations.
Method, system and apparatus for measuring comparatively thick materials
A method, system and apparatus are provided to measure magnetic characteristics of a comparatively thick magnetic sample in a magnetic field or nonmagnetic field by X-ray magnetic circular dichroism (XMCD). In particular, the method, system and apparatus measure the magnetic characteristics of the thick magnetic sample by irradiating the sample with X-ray, and detecting transmissive X-ray passing through the sample.
METHODS AND MEANS FOR IDENTIFYING FLUID TYPE INSIDE A CONDUIT
An x-ray-based borehole fluid evaluation tool for evaluating the characteristics of a fluid located external to said tool in a borehole using x-ray backscatter imaging is disclosed, the tool including at least an x-ray source; a radiation shield to define the output faun of the produced x-rays into the borehole fluid outside of the tool housing; at least one collimated imaging detector to record x-ray backscatter images; sonde-dependent electronics; and a plurality of tool logic electronics and power supply units. A method of using an x-ray-based borehole fluid evaluation tool to evaluate the characteristics of a fluid through x-ray backscatter imaging is also disclosed, the method including at least producing x-rays in a shaped output; measuring the intensity of backscatter x-rays returning from the fluid to each pixel of one or more array imaging detectors; and converting intensity data from said pixels into characteristics of the wellbore fluids.
Dynamic spectral acquisition for material studies
Method for determining properties of a sample and a charged particle system for implementing the method are disclosed. The method includes providing at least one image of the sample based on first emissions from a plurality of first scan locations; determining at least one or a plurality of second scan location(s) for at least one or a plurality of region(s) of the at least one image; detecting second emissions from at least one of the second scan locations of at least one of the regions; and adjusting a second dwell period with respect to an average segmentation dwell period.