A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning operation, measuring a distance between the calibration device and at least one inner wall of the chamber, scanning the calibration device to produce an image of the calibration device, identifying pixels representing the a geometric feature of the calibration device in the image, determining a position and orientation of the pixels representing the geometric feature in the image and, determining a scanning system property based on the position and orientation of the pixels representing the geometric feature in the image. The position and orientation of the feature in the scanning chamber and the x-ray scanning system property may be determined simultaneously.

A detection scheme for x-ray small angle scattering is described. An x-ray small angle scattering apparatus may include a first grating and a complementary second grating. The first grating includes a plurality of first grating cells. The complementary second grating includes a plurality of second grating cells. The second grating is positioned relative to the first grating. A configuration of the first grating, a configuration of the second grating and the relative positioning of the gratings are configured to pass one or more small angle scattered photons and to block one or more Compton scattered photons and one or more main x-ray photons.

An inspection device includes a ray source that irradiates an object to be inspected with energy rays, a detection unit that detects energy rays that have passed through the object to be inspected, a displacement mechanism that sets a relative position of the object to be inspected and the ray source by displacing at least one of the object to be inspected and the ray source in relation to the other, an internal image generation unit that generates an internal image of the object to be inspected based on a detection amount distribution of the energy rays detected by the detection unit, and a control unit that controls the displacement mechanism based on the detection amount distribution of the energy rays detected by the detection unit.

The present disclosure concerns an electron microscopy method, including the emission of a precessing electron beam and the acquisition, at least partly simultaneous, of an electron diffraction pattern and of intensity values of X rays.

Regarding to a fiber-reinforced material formed by deforming a reinforcing material composed of a plurality of fiber layers from an initial shape and molding into a predetermined shape, an identification device, an identification method, and an identification program generate a first data in which a physical quantity distribution inside the fiber-reinforced material is mapped to the initial shape, perform binarization of the first data to generate a second data in which a label identifying the fiber layer is mapped to the initial shape, and map the second data to a predetermined shape, based on a deformation data.

A detection scheme for x-ray small angle scattering is described. An x-ray small angle scattering apparatus may include a first grating and a complementary second grating. The first grating includes a plurality of first grating cells. The complementary second grating includes a plurality of second grating cells. The second grating is positioned relative to the first grating. A configuration of the first grating, a configuration of the second grating and the relative positioning of the grating are configured to pass one or more small angle scattered photons and to block one or more Compton scattered photons and one or more main x-ray photons.

An image quality indicator (IQI) system includes a crack IQI. The crack IQI includes a penetrameter having a first body and a second body disposed in the first body. The first body has a first body inner surface defining a first body hole. The second body has a second body outer surface disposed adjacent the first body inner surface to form an interface having an interface gap. The IQI system also includes a radiation source spaced from the penetrameter and configured to transmit radiation rays to the penetrameter. The IQI system also includes a radiation detector disposed adjacent the penetrameter and configured to generate an IQI radiographic image indicative of an interface gap characteristic of the interface gap.

A detection scheme for x-ray small angle scattering is described. An x-ray small angle scattering apparatus may include a first grating and a complementary second grating. The first grating includes a plurality of first grating cells. The complementary second grating includes a plurality of second grating cells. The second grating is positioned relative to the first grating. A configuration of the first grating, a configuration of the second grating and the relative positioning of the gratings are configured to pass one or more small angle scattered photons and to block one or more Compton scattered photons and one or more main x-ray photons.

The charged particle beam irradiation apparatus includes: a focused ion beam column; an electron beam column; an electron detector; an image forming unit configured to form an observation image based on a signal output from the electron detector; and a control unit configured to repeatedly perform exposure control in which the focused ion beam column is controlled to expose a cross section of a multilayered sample toward a stacking direction with the focused ion beam, the control unit being configured to perform, every time exposure of an observation target layer at a cross section of the multilayered sample is detected in a process of repeatedly performing the exposure control, observation control in which the electron beam column is controlled to radiate the electron beam, and the image forming unit is controlled to form an observation image of the cross section of the multilayered sample.

A visualization system and method for a multiphase fluids displacement seepage experiment with large viscosity difference in a complex pore structure. The visualization system includes: an injection pump assembly, a visualized complex pore model, a vacuum pressure pump and an image acquisition device; the system and method are printed by a 3D printing device to form the visualized complex pore model with at least two permeability, and displacement fluid mediums of different viscosities are injected into the visualized complex pore model through different injection pumps during an experiment, so that not only is the penetration of the same viscosity in the complex pore structure with different permeability observed, but also the displacement and plugging effect of different viscosities successively entering the complex pore structure with different permeability is realized.