In an X-ray imaging apparatus, an image processor is configured to generate a super-resolved image having higher resolution in an X direction than a first fluoroscopic X-ray image and a second fluoroscopic X-ray image by dividing, in the X direction, a pixel value of a first pixel in the first fluoroscopic X-ray image based on pixel values of two pixels in the second fluoroscopic X-ray image that overlap the first pixel when the first fluoroscopic X-ray image and the second fluoroscopic X-ray image are shifted in the X direction by an amount corresponding to a movement amount (of an X-ray detection position) and displayed in an overlapping manner

A fluorescent X-ray analyzer includes a sample stage, an X-ray source that irradiates a sample with primary X-rays, a detector that detects secondary X-rays generated from the sample, a position adjustment mechanism that adjusts relative positions of the sample stage and the primary X-rays, an observation mechanism that obtains an observation image of the sample, and a computer having a display unit and an input unit. The computer has a function of, in response to a pointer being moved from a central region of the observation screen to a certain position by dragging the input unit while maintaining a state in which an input element of the input unit is held, moving the sample stage in a movement direction and at a movement speed corresponding to a direction and a distance of the certain position relative to the central region.

An X-ray imaging apparatus and method are provided. The X-ray imaging apparatus according to an aspect includes an X-ray source configured to radiate X-rays onto a subject region, an X-ray detector configured to detect the radiated X-rays and obtain a plurality of frame images of the subject region, and an ROI filter located between the X-ray source and the X-ray detector, configured to move toward the X-ray source and the X-ray detector, and configured to filter the X-rays radiated from the X-ray source.

The charged particle beam apparatus includes a charged particle beam optical system that irradiates a sample mounted on a sample stage with a charged particle beam; a detector that detects a signal generated from the sample; a charged particle beam imaging device that acquires an observation image from the signal detected by the detector; an optical imaging device that captures an optical image of the sample; a stage that rotatably holds the sample stage; a stage control device that controls movement and rotation of the stage; and an image composition unit that combines the plurality of optical images to generate a composite image. The stage control device is configured to move the stage so that the center of an imaging range of the optical imaging device is located at a position different from the rotation center of the stage and then, to rotate the stage, the optical imaging device acquires a plurality of optical images relating to different positions of the sample by rotation operation, and the image composition unit combines the plurality of optical images obtained by the rotation operation to generate a composite image.

In this X-ray phase imaging apparatus, at least one of a plurality of gratings is composed of a plurality of grating portions arranged along a third direction perpendicular to a first direction along which a subject or an imaging system is moved by a moving mechanism and a second direction along which an X-ray source, a detection unit, and a plurality of grating portions are arranged. The plurality of grating portions are arranged such that adjacent grating portions overlap each other when viewed in the first direction.

Methods and systems for performing electron microscopy are provided. Microscopy images candidate sub-regions at different magnification levels are captured and provided to a trained sub-region quality assessment application trained to output a quality score for each candidate sub-region. From the quality scores, group-level features for the larger magnification images are determined using a group-level feature extraction application. The quality scores for the candidate sub-regions and the group-level extraction features are provided to a trained Q-learning network that identifies a next sub-region amongst the candidate sub-regions for capturing a micrograph image, where reinforcement learning may be used with the Q-learning network for such identification, for example using a decisional cost.

The charged particle beam apparatus includes a charged particle beam optical system that irradiates a sample mounted on a sample stage with a charged particle beam; a detector that detects a signal generated from the sample; a charged particle beam imaging device that acquires an observation image from the signal detected by the detector; an optical imaging device that captures an optical image of the sample; a stage that rotatably holds the sample stage; a stage control device that controls movement and rotation of the stage; and an image composition unit that combines the plurality of optical images to generate a composite image. The stage control device is configured to move the stage so that the center of an imaging range of the optical imaging device is located at a position different from the rotation center of the stage and then, to rotate the stage, the optical imaging device acquires a plurality of optical images relating to different positions of the sample by rotation operation, and the image composition unit combines the plurality of optical images obtained by the rotation operation to generate a composite image.

A charged particle beam apparatus includes a charged particle beam optical system that irradiates a sample on a sample stage with a charged particle beam; a detector that detects a signal generated from the sample; a charged particle beam imaging device that acquires an observation image from the signal; an optical imaging device that captures an optical image of the sample; a stage that rotatably holds the sample stage; a stage control device that controls movement and rotation of the stage; and an image composition unit that combines a plurality of optical images. The stage is moved so that the center of an imaging range of the optical imaging device is located at a position different from the rotation center of the stage, and then rotated. A plurality of optical images relating to different positions of the sample by rotation operation are acquired and combined to generate the composite image.

Disclosed herein is a method, comprising: sending one by one M radiation beams (radiation beams (i), i=1, . . . , M) toward a same scene, M being an integer greater than 1; for i=1, . . . , M, capturing with a same image sensor a partial image (i) of the scene using radiation of the radiation beam (i) after the radiation of the radiation beam (i) passes through the scene; and stitching the partial images (i), i=1, . . . , M of the scene resulting in a stitched image of the scene, wherein said stitching is based on relative positions of the M radiation beams with respect to each other.

An object of the invention is to easily acquire images of a position corresponding among a plurality of sample sections in an imaging device that acquires images of the plurality of sample sections. The imaging device according to the invention generates a cursor for specifying a first observation region and a contour portion of a first sample section, and superimposes the cursor on a contour portion of a second sample section so as to calculate coordinates of a second observation region of the second sample section.