Devices and methods for characterization of analyte mixtures are provided. Some methods described herein include performing enrichment steps on a device before expelling enriched analyte fractions from the device for subsequent analysis. Also included are devices for performing these enrichment steps.

A mask member is provided at an entrance opening of a mirror unit. Of a first diffraction grating and a second diffraction grating, when the second diffraction grating is used, the mask member masks preceding mirrors. With this process, aberration caused by reflective X-ray is suppressed. When the first diffraction grating is used, the mask member does not function. Alternatively, the mask member and another mask member may be selectively used.

Devices and methods for characterization of analyte mixtures are provided. Some methods described herein include performing enrichment steps on a device before expelling enriched analyte fractions from the device for subsequent analysis. Also included are devices for performing these enrichment steps.

A spent and/or decommissioned accumulator treatment plant and process, wherein a plurality of objects originating from separate waste collection of spent and/or decommissioned accumulators, nominally comprising lead-acid accumulators and accumulators and objects of a different type, are subject to an X-ray scan. If an analysis of the X-ray scan indicates that an object is not a lead-acid accumulator, and in particular is a lithium-ion battery or accumulator, it is deviated out of the treatment workflow, that comprises grinding the objects and separating lead from other materials.

One embodiment provides a method for predicting the performance of a device based upon parameters of an underlying material, comprising: measuring a predetermined parameter of a material to be used in manufacturing the device; identifying, from a value generated from the measuring, a value of a property of the material; and determining a predicted performance of the device by correlating the value of the property to a performance value. Other aspects are described and claimed.

Devices and methods for characterization of analyte mixtures are provided. Some methods described herein include performing enrichment steps on a device before expelling enriched analyte fractions from the device for subsequent analysis. Also included are devices for performing these enrichment steps.

An on-line energy dispersive X-ray diffraction (EDXRD) analyser for mineralogical analysis of material in a process stream or a sample is disclosed. The analyser includes a collimated X-ray source to produce a diverging beam of polychromatic X-rays, and an energy resolving X-ray detector, and a substantially X-ray transparent member having the form of a solid of revolution which is circularly symmetric about a central axis between the collimated X-ray source and the energy resolving X-ray detector, an outer surface of the X-ray transparent member positionable adjacent the material to be analysed. A primary beam collimator is disposed adjacent to or within the substantially X-ray transparent member to substantially prevent direct transmission of polychromatic X-rays emitted from the source to the detector. The analyser is configured such that the diverging beam of polychromatic X-rays are directed towards the substantially X-ray transparent member, and where the energy resolving X-ray detector collects a portion of the beam of X-rays diffracted by the material and outputs a signal containing energy information of the collected, diffracted X-rays.

A method and apparatus for diagnosing and/or calibrating underperforming pixels in detectors in a small pixelated photon counting CT system utilizes a series of tests on image data acquired in-situ as part of a series of calibration scans in the CT system. Tests are performed on the acquired data to determine the existence of underperforming pixels within the detectors such that the information acquired by those pixels can be replaced by alternate data from surrounding pixels (e.g. by interpolation). The underperforming pixels are stored in “bad” pixel tables and may be specific to a type of image (e.g., spectral or counting) and a specific protocol.

An X-ray inspection apparatus suppresses anomalies in inspection results caused by the X-ray inspection apparatus being used while an unsuitable setting is in effect. The X-ray inspection apparatus is provided with an inspection unit, a setting unit, a storage unit, an assessment unit, and a notification unit. The inspection unit inspects an irradiated article using detection data obtained by detecting X-rays. The setting unit sets a setting value used in inspection of the article by the inspection unit. The storage unit stores a detection value based on the detection data. The assessment unit assesses, on the basis of the detection value stored in the storage unit, whether or not the setting value set by the setting unit is suitable. When the assessment unit has assessed that the setting value is not suitable, the notification unit issues a notification to indicate that the setting value is not suitable.

A flexible digital radiographic detector assembly uses a conformable bag having granular media therein to enclose the detector and to help fit the detector onto a curved object. The conformable bag is evacuated to hold the detector against the object to be imaged. An image of the object is acquired by aiming x-rays through the object toward the detector.