G01N2223/615

Method acquiring projection image, control apparatus, control program, processing apparatus, and processing program
11543367 · 2023-01-03 · ·

There is provided an acquiring method of a projection image of a sample whose shape is uneven with respect to a rotation center, the method comprising the steps of setting the sample S0 at a position of the rotation center C0 provided between an X-ray source 116a and a detector 117, and acquiring the projection image of the sample S0 at each different rotation angle for each different magnification ratio over a rotation angle of 180° or more by rotating the sample S0 around the rotation center C0, and by relatively changing a separation distance between the X-ray source and the rotation center, or a separation distance between the rotation center and the detector in an optical axis direction according to the shape of the sample S0 and the rotation angle of the sample S0.

VARIABLE ZOOM X-RAY COMPUTED TOMOGRAPHY METHOD FOR COMPOSITES
20220381705 · 2022-12-01 ·

A variable zoom X-ray CT method can significantly improve resolution for structures with large in-plane dimensions, for example to detect complex structural damage due to low-velocity impact in large thin composite laminate panels. The variable zoom method comprises emitting an X-ray beam from an X-ray source to project a region of interest (ROI) of a specimen within a field of view (FOV) onto a detector. Projections of the ROI are scanned with the detector while rotating the specimen about a rotational axis of a specimen stage and translating the specimen stage along an acquisition trajectory between the X-ray source and the detector. The acquisition trajectory specifies a source-to-object distance (SOD) between the X-ray source and the rotational axis of the specimen stage at each rotation angle of the specimen stage. A reconstruction computer reconstructs a three-dimensional volume of the specimen from the projections scanned by the detector.

METHOD OF PRODUCING 3D TOMOSYNTHESIS IMAGES OF A COMPOSITE MATERIAL
20220351354 · 2022-11-03 ·

To identify and/or assess structural integrity of a composite material comprising fiduciary markers which attenuate x-rays to an extent greater than the rest of the material, a method is provided wherein x-ray 3D tomosynthesis images of the composite material are created using an array of x-ray emitters and a digital x-ray detector wherein the array of x-ray emitters and the digital x-ray detector are maintained in fixed relation to one another and to the composite material, the 3D tomosynthesis images being used to determine the relative location of at least some of the fiduciary markers with respect to one another; a database is provided for storing the relative location of at least some of the fiduciary markers with respect to one another, further x-ray 3D tomosynthesis images of the same, or a different, composite material may be checked against the data in the database to ascertain structural integrity and/or identity of the material.

Real time additive manufacturing process inspection using x-ray emission and detection through a build chamber
11474052 · 2022-10-18 · ·

Systems and methods for real time, nondestructive inspection of an object being formed by additive manufacturing is provided. The disclosed systems and methods can be used with any additive manufacturing system and can detect defects introduced during fabrication. In operation, additive manufacturing of the object can be paused and the object rotated within the build chamber. An x-ray pulse can then be directed through a linear aperture towards the object being formed inside the build chamber. A linear x-ray detector array can detect the x-ray pulse and an x-ray image of the object being formed can be created. By rotating the object being formed during exposure to the x-ray pulse at least one half of one full rotation, the entire volume of the object can be inspected.

ROTATION MECHANISM FOR X-RAY INSPECTION APPARATUS, X-RAY INSPECTION APPARATUS, AND METHOD OF ADJUSTING ROTATION MECHANISM FOR X-RAY INSPECTION APPARATUS
20230119131 · 2023-04-20 ·

In the rotation mechanism for an X-ray inspection apparatus, a plurality of adjustment members configured to adjust the shape of an outer race of a bearing by deforming the outer race are arranged in a circumferential direction of the bearing. The adjustment members are movable relative to an adjustment member holder in a diameter direction of the bearing and contactable with an outer circumferential surface of the outer race. A gap S configured to allow deformation of the outer race is formed between the outer circumferential surface of the outer race and the adjustment member holder in the diameter direction of the bearing.

STRUCTURE INFORMATION ACQUISITION METHOD AND STRUCTURE INFORMATION ACQUISITION APPARATUS

There is provided a technique for non-destructively and relatively easily acquiring orientation information of an anisotropic material even for a large-sized object. An object is irradiated with X-rays in a tangential direction of a curved anisotropic material from a radiation source of a phase-contrast X-ray optical system. A scattering image is then obtained using a detection signal of X-rays having penetrated through the object. Structure information of the anisotropic material is acquired based on the scattering image.

SYSTEM FOR EVALUATING DISTRIBUTION OF FIBER BUNDLES IN FIBER REINFORCED MATERIAL
20230112177 · 2023-04-13 · ·

A system for evaluating a distribution of fiber bundles in a fiber reinforced material by three-dimensional vector data of the fiber bundles is provided with: a calculator configured to divide the fiber reinforced material into a plurality of three-dimensional cells, selecting data respectively belonging to the cells, and averaging the selected data to calculate reference vector data; and a display configured to display the reference vector data two-dimensionally or three-dimensionally.

IDENTIFICATION DEVICE, IDENTIFICATION METHOD, AND IDENTIFICATION PROGRAM FOR IDENTIFYING FIBER LAYER IN FIBER-REINFORCED MATERIAL
20230191727 · 2023-06-22 · ·

Regarding to a fiber-reinforced material formed by deforming a reinforcing material composed of a plurality of fiber layers from an initial shape and molding into a predetermined shape, an identification device, an identification method, and an identification program generate a first data in which a physical quantity distribution inside the fiber-reinforced material is mapped to the initial shape, perform binarization of the first data to generate a second data in which a label identifying the fiber layer is mapped to the initial shape, and map the second data to a predetermined shape, based on a deformation data.

COMPRESSION MOULDING MACHINE AND METHOD
20230182355 · 2023-06-15 ·

A compression moulding machine comprises: an extrusion unit configured to extrude a rod of pasty polymeric material; a cutting element, configured to portion the rod into individual charges; a rotary carousel, including a plurality of moulds, each mould being configured to receive a respective charge and to form a corresponding object from the charge; a feeder, configured to convey each charge to a respective mould at a feed position; an inspecting device, configured to capture inspection data, representing a composition of the rod or of the charges.

Method and Apparatus for Determining Lattice Parameters of a Strained III-V Semiconductor Layer
20170343491 · 2017-11-30 ·

A multi-layer arrangement of III-V semiconductor layers includes a strained III-V semiconductor layer having a concentration of a constituent element which effects intensity of a conductive channel formed in the multi-layer arrangement. Lattice parameters of the strained III-V semiconductor layer are determined by generating a first scan in a Qx direction for a chosen reflection in reciprocal space based on diffracted X-Ray beam intensity measurements in the Qx direction. A second scan is generated in a Qz direction for the chosen reflection in the reciprocal space based on diffracted X-Ray beam intensity measurements in the Qz direction. The second scan is aligned with a diffracted X-Ray peak in the first scan which identifies the strained III-V semiconductor layer. The degree of strain of the strained III-V semiconductor layer is determined based on the first scan and the concentration of the constituent element based on the second scan.