The invention relates to method and system configured for material analysis and mineralogy. At least one image based on first emission from a sample is provided. First spectra of the sample based on second emissions from the second scan locations of the image are provided. A confidence score is calculated for every first spectrum, and second scan location(s) with confidence score(s) below a threshold value are selected. Second emissions from the selected second scan location(s) are acquired to provide new image and determine new second scan locations within the respective new image.

A particle size distribution measurement method includes: an image acquisition step of acquiring a first CT image of a target sample including the granules; a statistical value calculation step of specifying a region of interest by dividing the acquired first CT image into predetermined grids, and calculating a first statistical value including a grid statistical value for each of the grids and an overall statistical value of the entire first CT image regarding a CT value; and a measurement step of measuring a particle size distribution of the granules in the target sample based on the first statistical value and a second statistical value including a grid statistical value and an overall statistical value of a type same as the grid statistical value and the overall statistical value included in the first statistical value in a second CT image of a standard sample including granules having a known particle size.

An X-ray diffraction method measures crystallite size distribution in a polycrystalline sample using an X-ray diffractometer with a two-dimensional detector. The diffraction pattern collected contains several spotty diffraction rings. The spottiness of the diffraction rings is related to the size, size distribution and orientation distribution of the crystallites as well as the diffractometer condition. The invention allows obtaining of the diffraction intensities of all measured crystallites at perfect Bragg condition so that the crystallite size distribution can be measured based on the 2D diffraction patterns.

Automated analysis of particle beam measurement results is facilitated by a device that calculates a spatial parameter distribution representing spatial structure of a sample based on a scattering pattern corresponding to projection of the spatial structure of the sample to wavenumber space, the projection being obtained by detecting scattering of a particle beam which enters the sample and intersects with the sample. The device includes a section to provide estimates for signals on the scattering pattern in association with at which point on a spatial parameter distribution of the sample interactions occur during scattering; a section to aggregate estimation results of the interaction estimation section to calculate a spatial parameter distribution of a sample matching an aggregated result; and a section to perform alternately and repeatedly estimation in the interaction estimation section and calculation in the parameter distribution calculation section in order to improve estimation accuracy in spatial parameter distributions.

The application relates to a method for treating and examining a powder by: generating two-dimensional tomographic representation of an initial small amount of powder granules of the powder; determining and outputting an initial powder granule structural parameter based on the two-dimensional tomographic representation of the initial small amount of powder; producing a solid body including a statistically validatable powder representation of a totality of the powder granules of the powder; tomographically representing the solid body, wherein at least one imaging parameter and/or at least one image recording setting is adjusted based on the initial powder granule structural parameter; and determining and outputting at least one characteristic value of the statistically validatable powder representation of the powder granules of the powder by evaluating the tomographic representation of the solid body.

An analyzing apparatus includes an X-ray measurement device, an optical characteristic measurement device, and a calculation unit. The X-ray measurement device may be configured to measure fluorescent X-rays generated from the measurement object. The optical characteristic measurement device may be configured to obtain optical characteristics other than the fluorescent X-rays of one or more carbon compounds contained in the measurement object. The calculation unit may be configured to calculate information about a quantity of the one or more carbon compounds contained in the measurement object on the basis of the optical characteristics of the carbon compound(s), and correct the information about fluorescent X-rays measured by the X-ray measurement device on the basis of the information about the quantity of the carbon compound(s).

To enable evaluation of a shape of a fine particle and a fine particle type, a substrate is set as a substrate on which an isolated fine particle to be measured and an isolated standard fine particle in the vicinity of the isolated fine particle to be measured are disposed, and a scanning electron microscope body including a detector configured to detect secondary charged particles obtained by scanning a surface of the substrate with an electron beam probe, and a computer that processes a detection signal and generates an image of the isolated fine particle to be measured and the isolated standard fine particle are provided. The computer corrects a shape of the isolated fine particle to be measured by using a measurement result of the isolated standard fine particle disposed in the vicinity of the isolated fine particle to be measured. Further, by attaching a fine particle spreading tank equipped with a fine particle suspension dropping device inside the microscope body, automatic measurement including dropping of fine particle suspension onto a surface of a surface-modified substrate is possible.

An X-ray diffraction method measures crystallite size distribution in a polycrystalline sample using an X-ray diffractometer with a two-dimensional detector. The diffraction pattern collected contains several spotty diffraction rings. The spottiness of the diffraction rings is related to the size, size distribution and orientation distribution of the crystallites as well as the diffractometer condition. The invention allows obtaining of the diffraction intensities of all measured crystallites at perfect Bragg condition so that the crystallite size distribution can be measured based on the 2D diffraction patterns.

To enable evaluation of a shape of a fine particle and a fine particle type, a substrate is set as a substrate on which an isolated fine particle to be measured and an isolated standard fine particle in the vicinity of the isolated fine particle to be measured are disposed, and a scanning electron microscope body including a detector configured to detect secondary charged particles obtained by scanning a surface of the substrate with an electron beam probe, and a computer that processes a detection signal and generates an image of the isolated fine particle to be measured and the isolated standard fine particle are provided. The computer corrects a shape of the isolated fine particle to be measured by using a measurement result of the isolated standard fine particle disposed in the vicinity of the isolated fine particle to be measured. Further, by attaching a fine particle spreading tank equipped with a fine particle suspension dropping device inside the microscope body, automatic measurement including dropping of fine particle suspension onto a surface of a surface-modified substrate is possible.

An analyzing apparatus includes an X-ray measurement device, an optical characteristic measurement device, and a calculation unit. The X-ray measurement device may be configured to measure fluorescent X-rays generated from the measurement object. The optical characteristic measurement device may be configured to obtain optical characteristics other than the fluorescent X-rays of one or more carbon compounds contained in the measurement object. The calculation unit may be configured to calculate information about a quantity of the one or more carbon compounds contained in the measurement object on the basis of the optical characteristics of the carbon compound(s), and correct the information about fluorescent X-rays measured by the X-ray measurement device on the basis of the information about the quantity of the carbon compound(s).