A method and system for determining concentricity of a multiple layer golf ball are disclosed herein. One or more images of a golf ball are generated using an X-ray source, a camera or a digital detector, and an image intensifier. An edge detection algorithm is preferably utilized. The method also includes calculating Y,Z center coordinates of the a best fit diameter or ellipse of the inner edge layer and outer edge layer of the multiple layer golf ball.

A target inspection system includes a portable x-ray scanner configured to output a scanning beam of x-rays, a transmission detector module to detect x-rays of the scanning beam of x-rays that are transmitted through a target when the target is interposed between the portable x-ray scanner and the transmission detector module, and a coupling arm configured to couple the portable x-ray scanner to the transmission detector module mechanically to form a target inspection assembly, via a mechanical coupling between the coupling arm and the portable x-ray scanner at a proximal end of the coupling arm, and via a mechanical coupling between the coupling arm and the transmission detector module at a distal end of the coupling arm. The transmission detector module and the portable x-ray scanner are mechanically coupled together via the coupling arm, defining an opening to receive the target to be interposed therebetween for an x-ray scanning operation.

An electron beam detection apparatus for a semiconductor device and an electron beam detection assembly are disclosed, the electron beam detection apparatus including a stage, which is configured to carry and hold the semiconductor device at a top surface of the stage, and is translatable in two directions orthogonal to each other, an aiming device, configured to determine a position of the semiconductor device in a coordinate system of the electron beam detection apparatus by capturing an image of the semiconductor device, the aiming device provided with a first field of view and a first optical axis, and an electron beam detection device, configured to detect an emergent electron beam exiting the semiconductor device by projecting an electron beam to the semiconductor device, the electron beam detection device provided with a second field of view and a second optical axis which is not consistent with the first optical axis.

The present embodiments generally relate to methods of non-destructively imaging plant root damage by insect root herbivores and evaluating the efficacy of insecticidal materials associated with the roots of plants against the insect root herbivores, useful for automated high throughput bioassays.

An image acquisition system includes a radiation source configured to output radiation toward an object, a rotating stage configured to rotate the object around a rotation axis, a radiation camera having an input surface to which the radiation transmitted through the object is input and an image sensor capable of TDI control, and an image processing apparatus configured to generate a radiographic image of the object at an imaging plane P based on the image data. The angle formed between the rotation axis of the rotating stage and the input surface of the radiation camera is set in accordance with the FOD which is the distance between the radiation source and an imaging plane in the object. The radiation camera is configured to perform TDI control in the image sensor in synchronization with the rotational speed of the object rotated by the rotating stage.

Described herein are examples of industrial radiography systems that enable rotation of a part about a custom axis that is offset from an actual rotation axis of a rotatable fixture that retains the part. This may be valuable in situations where it is difficult, impractical, and/or impossible to align the center of the part with the center of the rotatable fixture. In some examples, the custom axis rotation may be implemented on existing radiography machines, without requiring physical alteration of the radiography machines, integration of new components into the radiography machines, and/or risk of instability to the part and/or radiography machines.

There are described herein methods and system for generating an inspection image of an object from radiographic imaging. The method comprises obtaining a plurality of digital images of the object positioned between a radiation source and a photon beam detector, the digital images taken at different object-detector distances or source-detector distances to create unique grain diffraction patterns in each one of the digital images, and forming the inspection image from image features common to the digital images at a common scale and removing the unique grain diffraction patterns.

A segmented detector device with backside illumination. The detector is able to collect and differentiate between secondary electrons and backscatter electrons. The detector includes a through-hole for passage of a primary electron beam. After hitting a sample, the reflected secondary and backscatter electrons are collected via a vertical structure having a P+/P−/N+ or an N+/N−/P+ composition for full depletion through the thickness of the device. The active area of the device is segmented using field isolation insulators located on the front side of the device.

A defect inspection system includes an X-ray generator that generates X-ray to be irradiated to a structure, and an X-ray detector that detects the X-ray generated by the X-ray generator and transmitted through the structure. In particular, the X-ray generator is configured to be moved by a first transporting means, and the X-ray detector is configured to be moved by a second transporting means. The system further includes a control unit configured to control and operate the first transporting means and the second transporting means.

Testing systems and methods are provided for a smoking article to determine a characteristic of the smoking article, such as density of a material used therewith. The testing system may include a test fixture and an electromagnetic energy generating device The testing methods may be carried out by subjecting the material to the electromagnetic energy and determining the amount of energy absorbed by the material.