The present specification provides a detector for an X-ray imaging system. The detector includes at least one high resolution layer having high resolution wavelength-shifting optical fibers, each fiber occupying a distinct region of the detector, at least one low resolution layer with low resolution regions, and a single segmented multi-channel photo-multiplier tube for coupling signals obtained from the high resolution fibers and the low resolution regions.

The present specification provides a detector for an X-ray imaging system. The detector includes at least one high resolution layer having high resolution wavelength-shifting optical fibers, each fiber occupying a distinct region of the detector, at least one low resolution layer with low resolution regions, and a single segmented multi-channel photo-multiplier tube for coupling signals obtained from the high resolution fibers and the low resolution regions.

A method of inspecting a structure during additive manufacturing of the structure and additive manufacturing systems are presented. An additive manufacturing system comprises additive manufacturing equipment comprising a casing and an additive manufacturing head configured to form a plurality of layers of a structure within the casing; and an x-ray backscatter imaging system configured to send an x-ray beam into a structure formed within the additive manufacturing equipment and detect scattered x-rays for imaging and analysis of the structure during fabrication.

A method of inspecting a structure during additive manufacturing of the structure and additive manufacturing systems are presented. An additive manufacturing system comprises additive manufacturing equipment comprising a casing and an additive manufacturing head configured to form a plurality of layers of a structure within the casing; and an x-ray backscatter imaging system configured to send an x-ray beam into a structure formed within the additive manufacturing equipment and detect scattered x-rays for imaging and analysis of the structure during fabrication.

The present invention refers to a method for determining a position of a divergent radiation source (1), comprising Irradiating a pixel detector (2) with a predetermined intensity distribution of radiation with wavelength λ originated from the radiation source (1), wherein the pixel detector (2) comprises a plurality of pixels with pixel coordinates (x.sub.i, y.sub.i, z.sub.i); Detecting, for each of the plurality of pixels, an intensity of the incident radiation (10); Determining, for each of the plurality of pixels, an incidence direction of the incident radiation using information on an orientation of an internal periodic structure at the pixel and the predetermined intensity distribution, wavelength λ and the detected intensity; and Determining the position (x.sub.p, y.sub.p, z.sub.p) of the radiation source (1) using the pixel coordinates (x.sub.i, y.sub.i, z.sub.i) and the incidence direction for each of the plurality of pixels. The invention further refers to a system, a computer-related product and a sample (8) for performing such method and to the use of a pixel detector (2) for determining a position of a divergent radiation source (1)

The present invention refers to a method for determining a position of a divergent radiation source (1), comprising Irradiating a pixel detector (2) with a predetermined intensity distribution of radiation with wavelength λ originated from the radiation source (1), wherein the pixel detector (2) comprises a plurality of pixels with pixel coordinates (x.sub.i, y.sub.i, z.sub.i); Detecting, for each of the plurality of pixels, an intensity of the incident radiation (10); Determining, for each of the plurality of pixels, an incidence direction of the incident radiation using information on an orientation of an internal periodic structure at the pixel and the predetermined intensity distribution, wavelength λ and the detected intensity; and Determining the position (x.sub.p, y.sub.p, z.sub.p) of the radiation source (1) using the pixel coordinates (x.sub.i, y.sub.i, z.sub.i) and the incidence direction for each of the plurality of pixels. The invention further refers to a system, a computer-related product and a sample (8) for performing such method and to the use of a pixel detector (2) for determining a position of a divergent radiation source (1)

Provided are an odor sniffing device (11) and a vehicle-mounted security inspection apparatus for a container (1). The odor sniffing device (11) includes a primary sampling front end (116), which has a vent adapter (116-1) having a shape matching with a vent of the ventilator of the container, so that when the primary sampling front end (116) fits with the ventilator, the vent adapter (116-1) and the vent generally cooperate to achieve fluid communication. The vehicle-mounted security inspection apparatus (1) may perform imaging inspection and chemical inspection simultaneously.

Described herein are systems and methods for backscatter imaging. A backscatter imaging system configurable in real-time for imaging an object is provided. The backscatter imaging system includes a source array including a plurality of discrete sources, and a collimator array including a plurality of collimators corresponding to the plurality of discrete sources. The source array is configured to selectively activate the plurality of discrete sources at a frequency that is determined based at least in part on a speed of the object relative to the backscatter imaging system.

Described herein are systems and methods for backscatter imaging. A backscatter imaging system configurable in real-time for imaging an object is provided. The backscatter imaging system includes a source array including a plurality of discrete sources, and a collimator array including a plurality of collimators corresponding to the plurality of discrete sources. The source array is configured to selectively activate the plurality of discrete sources at a frequency that is determined based at least in part on a speed of the object relative to the backscatter imaging system.

A target inspection system includes a portable x-ray scanner configured to output a scanning beam of x-rays, a transmission detector module to detect x-rays of the scanning beam of x-rays that are transmitted through a target when the target is interposed between the portable x-ray scanner and the transmission detector module, and a coupling arm configured to couple the portable x-ray scanner to the transmission detector module mechanically to form a target inspection assembly, via a mechanical coupling between the coupling arm and the portable x-ray scanner at a proximal end of the coupling arm, and via a mechanical coupling between the coupling arm and the transmission detector module at a distal end of the coupling arm. The transmission detector module and the portable x-ray scanner are mechanically coupled together via the coupling arm, defining an opening to receive the target to be interposed therebetween for an x-ray scanning operation.