Estimating wear on bottom hole assembly (BHA) components utilizes a rock hardness index using analysis of drill cutting. Estimating the amount of wear on borehole assembly components comprises measuring the rock properties in drilled cuttings from a borehole. A hardness value is assigned to each mineral present in the drilled cuttings. A hardness index is calculated for a drilled borehole interval. A wear resistance factor is assigned to each BHA component of the BHA. The wear resistance factor depends on the wear resistance of each BHA component. A wear value for each BHA component is calculated based on the hardness index for the drilled borehole interval, the wear resistance of the BHA component, and drilling parameters.

Estimating wear on bottom hole assembly (BHA) components utilizes a rock hardness index using analysis of drill cutting. Estimating the amount of wear on borehole assembly components comprises measuring the rock properties in drilled cuttings from a borehole. A hardness value is assigned to each mineral present in the drilled cuttings. A hardness index is calculated for a drilled borehole interval. A wear resistance factor is assigned to each BHA component of the BHA. The wear resistance factor depends on the wear resistance of each BHA component. A wear value for each BHA component is calculated based on the hardness index for the drilled borehole interval, the wear resistance of the BHA component, and drilling parameters.

A geological analysis system, device, and method are provided. The geological analysis system includes sensors, including an X-ray fluorescence (XRF) unit, which detect properties of geological sample materials, a sample tray which holds the geological sample materials therein, and a processor. The XRF unit includes a body and a separable head unit and an output port configured to emit helium onto the geological sample materials within the sample tray. The sample tray includes chambers formed in an upper surface, ports, and passages, each providing communication between an interior of a chamber and an interior of a port. The ports are configured to be attachable to vials. The processor is configured to automatically position at least one of the sensors and the sample tray with respect to the other of the at least one of the sensors and the sample tray and to control the sensors.

A cable inspection device non-destructively inspects a cable used for supporting a bridge. The cable inspection device includes a neutron source and a neutron detection device. The neutron source emits neutrons to the cable. The neutron detection device includes a detection surface arranged outside the cable, and detects target neutrons and measures the number of the detected target neutrons when neutrons are emitted to the cable. The target neutrons are among the neutrons released from the cable and incident on the detection surface, and each have an energy equal to or lower than a predetermined value that is lower than an energy of a fast neutron.

A measurement system for obtaining information about a sample comprises an excitation-beam source configured for irradiating the sample with an excitation-beam. The measurement system comprises a probe unit configured for exposing the sample to a probing radiation or a probing field, and a detection unit configured for obtaining a first information about an interaction of the probing radiation or the probing field with the sample, if a plasmon or plasmon-polariton was excited by the excitation-beam, and obtaining a second information about an interaction of the probing radiation of the probing field with the sample, if a plasmon or plasmon-polariton was not excited by the excitation-beam.

A method for multi-parametric x-ray fluorescence imaging with maximized detection sensitivity and minimized radiation dose for a biological/living sample (10) containing a first marker substance comprises the steps of irradiation of the sample (10) with x-ray radiation (1), with x-ray fluorescence (2) of the first marker substance being excited, spatially resolved detection of the x-ray fluorescence (2) of the first marker substance, and determination of a distribution of the first marker substance in the sample (10) from the x-ray fluorescence (2) of the first marker substance, wherein the sample (10) contains at least one further marker substance which is excited to x-ray fluorescence (2) by the x-ray radiation (1), wherein fluorescence lines (3) of the first and the at least one further marker substances are different, at least one of the first and the at least one further marker substances is coupled with active ingredient molecules and/or ligand molecules provided for a specific interaction with the sample (10) or contained in cells, in order to be able to trace these, the detection comprises a spectrally resolved detection of the x-ray fluorescence (2) of the first and the at least one further marker substances, and additionally at least one distribution of the at least one further marker substance in the sample (10) is determined from the detected x-ray fluorescence (2) of the first and the at least one further marker substances. An imaging device (100) for multi-parametric x-ray fluorescence imaging and an optimized selection method for a marker substance kit for introducing marker substances into a sample (10) are also described.

A method for multi-parametric x-ray fluorescence imaging with maximized detection sensitivity and minimized radiation dose for a biological/living sample (10) containing a first marker substance comprises the steps of irradiation of the sample (10) with x-ray radiation (1), with x-ray fluorescence (2) of the first marker substance being excited, spatially resolved detection of the x-ray fluorescence (2) of the first marker substance, and determination of a distribution of the first marker substance in the sample (10) from the x-ray fluorescence (2) of the first marker substance, wherein the sample (10) contains at least one further marker substance which is excited to x-ray fluorescence (2) by the x-ray radiation (1), wherein fluorescence lines (3) of the first and the at least one further marker substances are different, at least one of the first and the at least one further marker substances is coupled with active ingredient molecules and/or ligand molecules provided for a specific interaction with the sample (10) or contained in cells, in order to be able to trace these, the detection comprises a spectrally resolved detection of the x-ray fluorescence (2) of the first and the at least one further marker substances, and additionally at least one distribution of the at least one further marker substance in the sample (10) is determined from the detected x-ray fluorescence (2) of the first and the at least one further marker substances. An imaging device (100) for multi-parametric x-ray fluorescence imaging and an optimized selection method for a marker substance kit for introducing marker substances into a sample (10) are also described.

An X-ray fluorescence analyzer according to an embodiment includes a sample box configured to accommodate a liquid sample, an X-ray generation unit configured to irradiate an X-ray to one side surface of the inside of the sample box, and a detector disposed along one side surface of the sample box at which a distance of a fluorescent X-ray emitted from the inside of the sample box to the outside of the sample box is shortest in order to minimize absorption of the fluorescent X-ray emitted out of the sample box in the air, when the X-ray irradiated by the X-ray generation unit reacts with the liquid sample inside the sample box to emit the fluorescent X-ray out of the sample box, the detector being configured to detect the fluorescent X-ray.

Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).