Methods and systems for determining sensitization of an alloy includes correlating laser-induced breakdown spectroscopy (LIBS) measurements with degree of sensitization (DoS) values to determine the sensitization of an alloy. Sensitization is characterized by new phase precipitates preferably along the grain boundaries (GBs). In an embodiment, the method includes the features of (1) selective chemical etching of the new phase precipitate of an alloy to induce quantitative chemical composition change, correlated with the DoS values, on the alloy surface, (2) LIBS measurements to semi-quantitatively probe the chemical composition change on the etched surface due to selective chemical etching, (3) establishing calibration models by correlating the LIBS spectra with the DoS using artificial intelligence (AI) algorithms/approaches to determine a sensitization of an alloy.

Methods and systems for determining sensitization of an alloy includes correlating laser-induced breakdown spectroscopy (LIBS) measurements with degree of sensitization (DoS) values to determine the sensitization of an alloy. Sensitization is characterized by new phase precipitates preferably along the grain boundaries (GBs). In an embodiment, the method includes the features of (1) selective chemical etching of the new phase precipitate of an alloy to induce quantitative chemical composition change, correlated with the DoS values, on the alloy surface, (2) LIBS measurements to semi-quantitatively probe the chemical composition change on the etched surface due to selective chemical etching, (3) establishing calibration models by correlating the LIBS spectra with the DoS using artificial intelligence (AI) algorithms/approaches to determine a sensitization of an alloy.

This invention patent application addresses a system for the detection and quantification of mineralogical species via x-ray diffraction (XRD) of the concentrate of dry copper before it is injected into a converter or melting furnace. Specifically, it addresses a device that performs a mineralogical analysis, in line and in real time, of the concentrate of copper in the bath smelting furnace via x-ray diffraction (XRD), which allows for control over the ideal mixture for the optimal process for copper sulfide (Cu2S)-white metal, iron sulfide (FeS)-Slag and pyritic sulfur (S2)-temperature.

This invention patent application addresses a system for the detection and quantification of mineralogical species via x-ray diffraction (XRD) of the concentrate of dry copper before it is injected into a converter or melting furnace. Specifically, it addresses a device that performs a mineralogical analysis, in line and in real time, of the concentrate of copper in the bath smelting furnace via x-ray diffraction (XRD), which allows for control over the ideal mixture for the optimal process for copper sulfide (Cu2S)-white metal, iron sulfide (FeS)-Slag and pyritic sulfur (S2)-temperature.

A collecting device includes a stage configured to place a substrate. A magnetic field generating unit holds, by a magnetic field, a first liquid containing a magnetic fluid and a collecting liquid to bring the first liquid into contact with at least an end portion of the substrate. A collecting unit collects the first liquid from the magnetic field generating unit. A separating unit separates the collecting liquid from the first liquid.

A collecting device includes a stage configured to place a substrate. A magnetic field generating unit holds, by a magnetic field, a first liquid containing a magnetic fluid and a collecting liquid to bring the first liquid into contact with at least an end portion of the substrate. A collecting unit collects the first liquid from the magnetic field generating unit. A separating unit separates the collecting liquid from the first liquid.

A device, and corresponding method, for determining a material composition of the pipe includes a probe, a resonance frequency measurement circuit, and a material analyzer. The probe includes an oscillator circuit and can be inserted into an interior cavity of the type. The probe also can emit electromagnetic radiation into the interior cavity via the oscillator circuit. The frequency measurement circuit is in operative communication with the oscillator circuit and is configured to output resonant frequency measurement data indicative of a resonance frequency of the oscillator circuit when inserted into the interior cavity. The material analyzer can receive the resonance frequency measurement data, and an additional measurement, and can output an indication of material composition of the pipe based on the resonance frequency measurement data and the additional measurement.

The present invention relates to a method for analyzing the color of a color alloy and, more particularly, to a method for analyzing the color of a color alloy wherein, on the basis of the fact that a different color appears according to the composition of an alloy, the wavelength-wise reflectance related to a color, which is held according to each alloy composition, and that related to a color, which is held by a measurement object that is to be measured, are compared, thereby determining the color held by the measurement object.

A spectroscopic analysis apparatus includes: a light projecting device; a light receiving device; and an output device, wherein the light receiving device includes: a separator configured to separate reflected light into s-polarized light and p-polarized light; a detector for s-polarized light configured to output an electric signal indicating an intensity of the s-polarized light; and a detector for p-polarized light configured to output an electric signal indicating an intensity of the p-polarized light; and the output device is configured to: calculate an absorbance based on a ratio between the intensities of the s-polarized light and the p-polarized light using the electric signals output from the detector for s-polarized light and the detector for p-polarized light; and calculate either or both of the composition and the composition ratio of the surface of the measurement target object using an intensity of the absorbance at any desired wavenumber.

A spectroscopic analysis apparatus includes: a light projecting device; a light receiving device; and an output device, wherein the light receiving device includes: a separator configured to separate reflected light into s-polarized light and p-polarized light; a detector for s-polarized light configured to output an electric signal indicating an intensity of the s-polarized light; and a detector for p-polarized light configured to output an electric signal indicating an intensity of the p-polarized light; and the output device is configured to: calculate an absorbance based on a ratio between the intensities of the s-polarized light and the p-polarized light using the electric signals output from the detector for s-polarized light and the detector for p-polarized light; and calculate either or both of the composition and the composition ratio of the surface of the measurement target object using an intensity of the absorbance at any desired wavenumber.