G01N33/40

METHOD FOR EVALUATING ABRASIVE GRAINS, AND METHOD FOR MANUFACTURING SILICON WAFER
20170343528 · 2017-11-30 · ·

An evaluation method of abrasive grains used in an ingot-cutting slurry includes: an evaluation solution preparation step in which abrasive grains including polishing grains and impurities are dissolved in a solvent to prepare an evaluation solution; a sedimentation step in which a container containing the evaluation solution is left still to settle the polishing grains; a measurement step in which a turbidity of supernatant of the evaluation solution is measured using the measurement device; and an estimation step in which an amount of the impurities is estimated based on the measurement result of the turbidity of the supernatant.

METHOD FOR EVALUATING ABRASIVE GRAINS, AND METHOD FOR MANUFACTURING SILICON WAFER
20170343528 · 2017-11-30 · ·

An evaluation method of abrasive grains used in an ingot-cutting slurry includes: an evaluation solution preparation step in which abrasive grains including polishing grains and impurities are dissolved in a solvent to prepare an evaluation solution; a sedimentation step in which a container containing the evaluation solution is left still to settle the polishing grains; a measurement step in which a turbidity of supernatant of the evaluation solution is measured using the measurement device; and an estimation step in which an amount of the impurities is estimated based on the measurement result of the turbidity of the supernatant.

Method for evaluating abrasive grains, and method for manufacturing silicon wafer
10416145 · 2019-09-17 · ·

An evaluation method of abrasive grains used in an ingot-cutting slurry includes: an evaluation solution preparation step in which abrasive grains including polishing grains and impurities are dissolved in a solvent to prepare an evaluation solution; a sedimentation step in which a container containing the evaluation solution is left still to settle the polishing grains; a measurement step in which a turbidity of supernatant of the evaluation solution is measured using the measurement device; and an estimation step in which an amount of the impurities is estimated based on the measurement result of the turbidity of the supernatant.

Method for evaluating abrasive grains, and method for manufacturing silicon wafer
10416145 · 2019-09-17 · ·

An evaluation method of abrasive grains used in an ingot-cutting slurry includes: an evaluation solution preparation step in which abrasive grains including polishing grains and impurities are dissolved in a solvent to prepare an evaluation solution; a sedimentation step in which a container containing the evaluation solution is left still to settle the polishing grains; a measurement step in which a turbidity of supernatant of the evaluation solution is measured using the measurement device; and an estimation step in which an amount of the impurities is estimated based on the measurement result of the turbidity of the supernatant.

Device for detecting profile in refiner and method therefore
10161894 · 2018-12-25 · ·

The invention regards a measuring device, comprising a conductor body (7), for detecting the degree of fiber concentration and/or steam point (SP) of a fiber pad (33) being pulped, during use of the device (3), in a grinding gap (15) between refiner discs (11, 13) of a refiner (1). The conductor body (7) exhibits a first electric contact surface (17) adapted to provide electrical contact with a second electric contact surface (19) for transferring an electric current via the fiber pad (33) material. The invention also regards a method for detecting the degree of fiber concentration and/or steam point (SP) of a fiber pad (33). The method comprises the steps of mounting of the conductor body (7) to one of the refiner discs (13), grinding the fiber pad (33) material between the refiner discs (11, 13), detecting alteration of the conductivity and/or electrical resistivity of the fiber pad (33) material, and adjusting inflow of water and/or fiber material from said detected alteration.

Device for detecting profile in refiner and method therefore
10161894 · 2018-12-25 · ·

The invention regards a measuring device, comprising a conductor body (7), for detecting the degree of fiber concentration and/or steam point (SP) of a fiber pad (33) being pulped, during use of the device (3), in a grinding gap (15) between refiner discs (11, 13) of a refiner (1). The conductor body (7) exhibits a first electric contact surface (17) adapted to provide electrical contact with a second electric contact surface (19) for transferring an electric current via the fiber pad (33) material. The invention also regards a method for detecting the degree of fiber concentration and/or steam point (SP) of a fiber pad (33). The method comprises the steps of mounting of the conductor body (7) to one of the refiner discs (13), grinding the fiber pad (33) material between the refiner discs (11, 13), detecting alteration of the conductivity and/or electrical resistivity of the fiber pad (33) material, and adjusting inflow of water and/or fiber material from said detected alteration.