A circuit system for providing thermal stability to a transistor may include: a comparing circuit in electrical communication with the transistor for receiving a present voltage from the transistor and comparing a present voltage to a predetermined bias voltage; a logic gate electronically coupled to an output of the comparing circuit, the logic gate, gate having a high, open position and a low, closed position; and a heating element thermally coupled to the transistor and electrically coupled to the output of the comparing circuit, wherein when the present voltage is lower than the predetermined bias voltage, the gate is in the high, open position providing current to the heating element, and wherein when the present voltage is higher than the predetermine bias voltage the gate is in the low, closed position.

An active discharge circuit discharges an X capacitor and includes a sensor circuit that generates a sensor signal indicative of an AC voltage at the X capacitor. A processing unit generates a reset signal as a function of a comparison signal. A comparator circuit generates the comparison signal by comparing the sensor signal with a threshold. A timer circuit sets a discharge enable signal to a first logic level when the timer circuit is reset via a reset signal. The timer circuit determines the time elapsed since the last reset and tests whether the time elapsed exceeds a given timeout value. If the time elapsed exceeds the given timeout value, the timer circuit sets the discharge enable signal to a second logic level. A dynamic threshold generator circuit varies the threshold of the comparator circuit as a function of the sensor signal.

An active discharge circuit discharges an X capacitor and includes a sensor circuit that generates a sensor signal indicative of an AC voltage at the X capacitor. A processing unit generates a reset signal as a function of a comparison signal. A comparator circuit generates the comparison signal by comparing the sensor signal with a threshold. A timer circuit sets a discharge enable signal to a first logic level when the timer circuit is reset via a reset signal. The timer circuit determines the time elapsed since the last reset and tests whether the time elapsed exceeds a given timeout value. If the time elapsed exceeds the given timeout value, the timer circuit sets the discharge enable signal to a second logic level. A dynamic threshold generator circuit varies the threshold of the comparator circuit as a function of the sensor signal.

A differential signal measurement system is provided. The differential signal measurement system includes a measurement device, with at least one differential signal input, a differential connection interface configured to connect the at least one differential signal input of the measurement device to a device under test, and a differential signal source, with at least one differential signal output, configured to generate at least one differential output signal. The differential connection interface is further configured to pass the at least one differential output signal to the at least one differential signal input of the measurement device, and the measurement device is configured to capture the at least one differential output signal.

A semiconductor device is provided which can detect a fluctuation of a power supply voltage. The semiconductor device includes a counter circuit that outputs a signal when a period during which a power supply voltage of a system to be monitored is lower than or equal to a first voltage value exceeds a predetermined time, a first flag circuit that sets a first flag based on the signal, a second flag circuit that sets a second flag when the power supply voltage becomes a second voltage value or lower, and a circuit that outputs a reset signal that resets the system when both the first and the second flags are set. The first voltage value and the second voltage value are higher than a minimum voltage that guarantees normal operation of the system. The first voltage value is higher than the second voltage value.

A discrete input determining circuit is disclosed, which includes an input biasing network connected to a discrete input for providing a first input voltage, a voltage divider network for dividing the first input voltage into a second input voltage and a third input voltage, a first comparator, wherein a non-inverting input terminal of the first comparator receives the second input voltage, and a second comparator, wherein an inverting input terminal of the second comparator receives the third input voltage, wherein an inverting input terminal of the first comparator and a non-inverting input terminal of the second comparator receive a reference voltage, and an output terminal of the first comparator and an output terminal of the second comparator are configured to provide a logic output. A discrete input determining method is also disclosed.

A method and a system for diagnosing a fault of a three-phase three-level rectifier are relate to the technical field of fault diagnosis of power electronic equipment, and provided to implement identification and location of an open-circuit fault of a power switching device thereof. A deviation between an expected value and an actual value of a phase-to-phase voltage is adopted as a diagnosis variable. The diagnosis variable is calculated by adopting a screening technique, thereby reducing calculation error to ensure accuracy of diagnosis. Only existing voltage current signals in a control system of the rectifier are required to calculate the diagnosis variable, so no additional hardware is required and low-cost fault diagnosis can be implemented. Different voltage thresholds are adopted for different fault characteristic sections, and the voltage thresholds are updated in real time according to a direct current side voltage, which improves diagnosis speed while ensuring higher robustness.

The present disclosure relates to a voltage detection apparatus and method for determining whether a high voltage at an input terminal exceeds a preset value. The device includes a high-voltage arm and a low-voltage arm, and the low-voltage arm includes a capacitor charging/discharging module, a signal indication module, a threshold selection module, a control module, a signal transmission module, and a signal processing module. The high-voltage arm includes a precision resistor R1, the capacitor charging/discharging module includes a charging/discharging capacitor C1 and a diode VD2, the signal indication module includes an optical-fiber emitting diode V1 and a voltage stabilizing diode VD, the threshold selection module includes four parallel resistors and corresponding switch contacts S1, S2, S3, and S4 thereof, the control module includes a comparator D1 and a transistor switch VT1 controlled by D1, and the signal transmission module includes one optical-fiber emitting diode V2 and one optical-fiber emitting diode V3 connected in series; the signal processing module is an upper computer or an optical signal acquisition system. The apparatus in the present disclosure has a long-term high voltage resistance, detects a high voltage at an input terminal, compares the same with a threshold voltage, and transmits and displays a comparison result, so as to provide a logical basis of determination for reliable operation of a circuit breaker.

An active discharge circuit discharges an X capacitor and includes a sensor circuit that generates a sensor signal indicative of an AC voltage at the X capacitor. A processing unit generates a reset signal as a function of a comparison signal. A comparator circuit generates the comparison signal by comparing the sensor signal with a threshold. A timer circuit sets a discharge enable signal to a first logic level when the timer circuit is reset via a reset signal. The timer circuit determines the time elapsed since the last reset and tests whether the time elapsed exceeds a given timeout value. If the time elapsed exceeds the given timeout value, the timer circuit sets the discharge enable signal to a second logic level. A dynamic threshold generator circuit varies the threshold of the comparator circuit as a function of the sensor signal.

A discrete input determining circuit is disclosed, which includes an input biasing network connected to a discrete input for providing a first input voltage, a voltage divider network for dividing the first input voltage into a second input voltage and a third input voltage, a first comparator, wherein a non-inverting input terminal of the first comparator receives the second input voltage, and a second comparator, wherein an inverting input terminal of the second comparator receives the third input voltage, wherein an inverting input terminal of the first comparator and a non-inverting input terminal of the second comparator receive a reference voltage, and an output terminal of the first comparator and an output terminal of the second comparator are configured to provide a logic output. A discrete input determining method is also disclosed.