A fast calibration method for slide-screw impedance tuners employs a reduced calibration algorithm, which creates appropriately distributed calibration points over the Smith chart compatible with already existing interpolation and tuning algorithms for high accuracy and high-speed impedance tuning. The method uses one vertical scaling of the tuning probe followed by a limited number of vertical positioning operations at pre-set horizontal intervals and applies this data to generate accurate interpolated high-density tuner calibration data points at a fraction of previously required calibration times.

A method of tuning a production module using a reference module with virtual gain correction is provided. The method includes selecting a counterpart reference module created for a select application. The production module is commutatively coupled to the selected counterpart reference module to generate a production module pair. A production module gain curve for the production module pair is measured for each frequency band to be used by the production module. The production module is tuned based at least in part on offset gain values at select number of frequency observation points for each frequency band associated with the counterpart reference module and gain values at the select number of frequency observation points of the measured production module gain curve for each frequency band.

Measurement of power distribution network (PDN) Z-parameters and S-parameters of a programmable logic device (PLD), such as field programmable gate array (FPGA) or complex programmable logic device (CPLD), is performed by configuring and using only logic blocks and I/O blocks commonly available in any existing programmable logic device, without the need of built-in dedicated circuits. The measured models include the PDN elements on the PLD die, PLD package, and PCB. The S-parameter and Z-parameter models can be then used in circuit simulation tools to evaluate the power supply noise in the PLD logic core and the timing jitter in the PLD I/O data links.

A system for vector network analysis of a device under test, comprising at least two measurement receivers, at least one signal generator device formed separately from the at least two measurement receivers, and at least one data processing unit connected with the measurement receivers. The connection between the data processing unit and at least one of the measurement receivers is flexible so that the position of the measurement receiver is adjustable. Further, a method for vector network analysis of a device under test is described.

A system for vector network analysis of a device under test, comprising at least two measurement receivers, at least one signal generator device formed separately from the at least two measurement receivers, and at least one data processing unit connected with the measurement receivers. The connection between the data processing unit and at least one of the measurement receivers is flexible so that the position of the measurement receiver is adjustable. Further, a method for vector network analysis of a device under test is described.

Systems and methods relating to bio-impedance analysis. The system eliminates the need for hardware phase measurements by using the K-K transform to extract the phase from the magnitude detected. The system has a magnitude detection sub-system that includes a signal generation block, a DC cancellation block, and an amplitude control block. An A/D converter converts the detected magnitude into a digital signal and signal processing is performed to extract the phase of the signal from the magnitude detected.

Systems and methods relating to bio-impedance analysis. The system eliminates the need for hardware phase measurements by using the K-K transform to extract the phase from the magnitude detected. The system has a magnitude detection sub-system that includes a signal generation block, a DC cancellation block, and an amplitude control block. An A/D converter converts the detected magnitude into a digital signal and signal processing is performed to extract the phase of the signal from the magnitude detected.

An electronic instrument is described. The electronic instrument includes a transmitter circuit, wherein the transmitter circuit is configured to transmit a test signal to a device under test. The electronic instrument further includes a receiver circuit, wherein the receiver circuit is configured to receive an output signal from the device under test. The electronic instrument further includes a processing circuit, wherein the processing circuit is configured to determine at least one signal quality indicator based on the output signal received from the device under test. The at least one signal quality indicator is indicative of a signal quality of the output signal. Further, a signal analysis method of analyzing a signal received from a device under test is described.

Provided is a measurement apparatus including a signal source configured to output a binary digital signal configuring a multi-tone waveform, a waveform acquisition unit configured to acquire an analog signal waveform generated in response to application of the digital signal to a device under test, and a computation unit configured to calculate a frequency characteristic of the device under test from the waveform acquired by the waveform acquisition unit, in which the signal source is configured to repeatedly output a signal upconverted by multiplying a pseudo-random binary sequence (PRBS) signal by a repeating rectangular wave with a reference frequency and a reference duty ratio.

An example method includes following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal and intermodulation interference; (iv) obtaining a power spectral density value, where the power spectral density value comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal, the noise signal, and the intermodulation interference; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.