Provided is a measurement apparatus including a signal source configured to output a binary digital signal configuring a multi-tone waveform, a waveform acquisition unit configured to acquire an analog signal waveform generated in response to application of the digital signal to a device under test, and a computation unit configured to calculate a frequency characteristic of the device under test from the waveform acquired by the waveform acquisition unit, in which the signal source is configured to repeatedly output a signal upconverted by multiplying a pseudo-random binary sequence (PRBS) signal by a repeating rectangular wave with a reference frequency and a reference duty ratio.

Systems and methods relating to bio-impedance analysis. The system eliminates the need for hardware phase measurements by using the K-K transform to extract the phase from the magnitude detected. The system has a magnitude detection sub-system that includes a signal generation block, a DC cancellation block, and an amplitude control block. An A/D converter converts the detected magnitude into a digital signal and signal processing is performed to extract the phase of the signal from the magnitude detected.

Systems and methods relating to bio-impedance analysis. The system eliminates the need for hardware phase measurements by using the K-K transform to extract the phase from the magnitude detected. The system has a magnitude detection sub-system that includes a signal generation block, a DC cancellation block, and an amplitude control block. An A/D converter converts the detected magnitude into a digital signal and signal processing is performed to extract the phase of the signal from the magnitude detected.

A method of tuning a production module using a reference module with virtual gain correction is provided. The method includes selecting a counterpart reference module created for a select application. The production module is commutatively coupled to the selected counterpart reference module to generate a production module pair. A production module gain curve for the production module pair is measured for each frequency band to be used by the production module. The production module is tuned based at least in part on offset gain values at select number of frequency observation points for each frequency band associated with the counterpart reference module and gain values at the select number of frequency observation points of the measured production module gain curve for each frequency band.

A method of tuning a production module using a reference module with virtual gain correction is provided. The method includes selecting a counterpart reference module created for a select application. The production module is commutatively coupled to the selected counterpart reference module to generate a production module pair. A production module gain curve for the production module pair is measured for each frequency band to be used by the production module. The production module is tuned based at least in part on offset gain values at select number of frequency observation points for each frequency band associated with the counterpart reference module and gain values at the select number of frequency observation points of the measured production module gain curve for each frequency band.

A system for vector network analysis of a device under test, comprising at least two measurement receivers, at least one signal generator device formed separately from the at least two measurement receivers, and at least one data processing unit connected with the measurement receivers. The connection between the data processing unit and at least one of the measurement receivers is flexible so that the position of the measurement receiver is adjustable. Further, a method for vector network analysis of a device under test is described.

A system for vector network analysis of a device under test, comprising at least two measurement receivers, at least one signal generator device formed separately from the at least two measurement receivers, and at least one data processing unit connected with the measurement receivers. The connection between the data processing unit and at least one of the measurement receivers is flexible so that the position of the measurement receiver is adjustable. Further, a method for vector network analysis of a device under test is described.

A double-balance electronic test apparatus can measure inductance, capacitance, and resistance more accurately than a single-balance meter. The double-balance electronic test apparatus includes two circuits to balance the impedance of a device under test, and uses the balance to calculate the inductance, capacitance, and resistance of the impedance device under test.

A double-balance electronic test apparatus can measure inductance, capacitance, and resistance more accurately than a single-balance meter. The double-balance electronic test apparatus includes two circuits to balance the impedance of a device under test, and uses the balance to calculate the inductance, capacitance, and resistance of the impedance device under test.

A method for measuring electrical response of a DUT includes using a measurement instrument, generating a radio frequency (RF) test signal via the measurement instrument at one or more initial frequencies, propagating the RF test signal at the one or more initial frequencies to the DUT, measuring a response of the DUT at the one or more initial frequencies and aggregating the measured response of the DUT at the one or more initial frequencies as response measurement data. The method then includes iteratively performing, until characterization of the DUT achieves a minimum criterion, the steps of adaptively selecting an additional frequency at which to generate a RF test signal based on the response measurement data based on a predetermined adaptive frequency algorithm, generating the RF test signal at the adaptively selected additional frequency, measuring a response of the DUT at the adaptively selected additional frequency, and adding the measured response of the DUT at the adaptively selected additional frequency to the response measurement data.