G01R29/06

Precise signal swing squelch detector
09729132 · 2017-08-08 · ·

A squelch detector, including: an input configured to receive an input signal; a peak detector connected to the input configured to detect a maximum value of the input signal wherein the peak detector includes a refresh input configured to receive a refresh signal to refresh the output of the peak detector, a valley detector connected to the input configured to detect a minimum value of the input signal wherein the valley detector includes a refresh input configured to receive the refresh signal to refresh the output of the valley detector, and a comparator including a first signal input connected to an output of the peak detector, a second input connected to an output of the valley detector, and a first reference input, wherein the comparator is configured to compare a difference between an output of the peak detector and an output of the valley detector and a reference value received at the first reference input and configured to produce an output based upon the comparison.

RIPPLE DETECTION DEVICE AND RIPPLE SUPPRESSION DEVICE

A ripple detection device and a ripple suppression device. The ripple detection device includes: a ripple sampling unit, at least two DC sampling units, and a digital signal processing unit; the ripple sampling unit outputs a first voltage signal at an output port of a non-isolated DC/DC bidirectional energy conversion unit to the digital signal processing unit; the DC sampling unit outputs a first DC signal in a second voltage signal at a connected port of the non-isolated DC/DC bidirectional energy conversion unit to the digital signal processing unit and blocks an AC signal in the second voltage signal to be output to the digital signal processing unit; the digital signal processing unit determines a ripple noise signal at the output port of the non-isolated DC/DC bidirectional energy conversion unit according to the first voltage signal and the first DC signal.

Frequency spacings to prevent intermodulation distortion signal interference

A system (800) for determining frequency spacings to prevent intermodulation distortion signal interference is provided. The system (800) includes a sensor assembly (810) and a meter verification module (820) communicatively coupled to the sensor assembly (810). The meter verification module (820) is configured to determine a frequency of a first signal to be applied to a sensor assembly (810) of a vibratory meter and set a demodulation window about the frequency of the first signal. The meter verification module (800) is also configured to determine a frequency of the second signal to be applied to the sensor assembly such that a frequency of an intermodulation distortion signal generated by the first signal and the second signal is outside the demodulation window.

Frequency spacings to prevent intermodulation distortion signal interference

A system (800) for determining frequency spacings to prevent intermodulation distortion signal interference is provided. The system (800) includes a sensor assembly (810) and a meter verification module (820) communicatively coupled to the sensor assembly (810). The meter verification module (820) is configured to determine a frequency of a first signal to be applied to a sensor assembly (810) of a vibratory meter and set a demodulation window about the frequency of the first signal. The meter verification module (800) is also configured to determine a frequency of the second signal to be applied to the sensor assembly such that a frequency of an intermodulation distortion signal generated by the first signal and the second signal is outside the demodulation window.

Fast Convergence Method for Cross-Correlation Based Modulation Quality Measurements
20220065972 · 2022-03-03 ·

Techniques are disclosed related to determining a modulation quality measurement of a device-under-test (DUT). A modulated signal is received from a source a plurality of times, and each received modulated signal is transmitted to each of a first vector signal analyzer (VSA) and a second VSA. The first VSA and the second VSA demodulate the received modulated signals to produce first error vectors and second error vectors, respectively. A cross-correlation calculation is performed on the first error vectors and second error vectors of respective received modulated signals to produce a complex-valued cross-correlation measurement, and a real component of the cross-correlation measurement is averaged over the plurality of received modulated signals. A modulation quality measurement is determined based on the averaged cross-correlation measurement.

Cross-correlation measurements for modulation quality measurements

Techniques are disclosed related to determining a modulation quality measurement of a device-under-test (DUT). A modulated signal is received from a source a plurality of times, and each received modulated signal is transmitted to each of a first vector signal analyzer (VSA) and a second VSA. The first VSA and the second VSA demodulate the received modulated signals to produce first error vectors and second error vectors, respectively. A cross-correlation calculation is performed on the first error vectors and second error vectors of respective received modulated signals to produce a cross-correlation measurement, and the cross-correlation measurement is averaged over the plurality of received modulated signals. A modulation quality measurement is determined based on the averaged cross-correlation measurement.

Method of measuring the AM/PM conversion of a device under test

A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.

Method of measuring the AM/PM conversion of a device under test

A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.

FREQUENCY SPACINGS TO PREVENT INTERMODULATION DISTORTION SIGNAL INTERFERENCE

A system (800) for determining frequency spacings to prevent intermodulation distortion signal interference is provided. The system (800) includes a sensor assembly (810) and a meter verification module (820) communicatively coupled to the sensor assembly (810). The meter verification module (820) is configured to determine a frequency of a first signal to be applied to a sensor assembly (810) of a vibratory meter and set a demodulation window about the frequency of the first signal. The meter verification module (800) is also configured to determine a frequency of the second signal to be applied to the sensor assembly such that a frequency of an intermodulation distortion signal generated by the first signal and the second signal is outside the demodulation window.

METHOD OF MEASURING THE AM/PM CONVERSION OF A DEVICE UNDER TEST

A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.