G01R31/00
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/00
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/28
Testing of electronic circuits, e.g. by signal tracer
G01R31/28
Testing of electronic circuits, e.g. by signal tracer
G01R31/2886
Features relating to contacting the IC under test, e.g. probe heads; chucks
G01R31/2886
Features relating to contacting the IC under test, e.g. probe heads; chucks
G01R31/2887
involving moving the probe head or the IC under test; docking stations
G01R31/2887
involving moving the probe head or the IC under test; docking stations