A semiconductor device includes a semiconductor substrate: a vertical Hall element formed in the semiconductor substrate, and having a magnetosensitive portion; a first excitation wiring disposed above the magnetosensitive portion, and configured to apply a first calibration magnetic field (M1) to the magnetosensitive portion; and second excitation wirings disposed above the magnetosensitive portion on one side and on another side of the first excitation wiring, respectively, along the first excitation wiring as viewed in plan view from immediately above a front surface of the semiconductor substrate, and configured to apply second calibration magnetic fields (M2) to the magnetosensitive portion.

A microelectronic device has a Hall sensor that includes a Hall plate in a semiconductor material. The Hall sensor includes contact regions in the semiconductor material, contacting the Hall plate. The Hall sensor includes an isolation structure with a dielectric material contacting the semiconductor material, on at least two opposite sides of each of the contact regions. The isolation structure is laterally separated from the contact regions by gaps. The Hall sensor further includes a conductive spacer over the gaps, the conductive spacer being separated from the semiconductor material by an insulating layer.

A sensor, comprising: a substrate having a reference crystal orientation and a plurality of vertical Hall element pairs that are formed on the substrate. Each vertical Hall element pair includes: (i) a respective first vertical Hall element that is oriented at a respective first angle relative to the reference crystal orientation of the substrate and (ii) a respective second vertical Hall element that is oriented at a respective second angle relative to the reference crystal orientation of the substrate. The substrate has a rectangular shape, and each of the vertical Hall element pairs is disposed in a different respective corner of the substrate.

A position sensing system has a trim unit to trim hall voltages generated by a first sensor and a second sensor in response to an excitation current, to compensate a non-orthogonality of the first sensor and the second sensor.

The present invention relates to a Hall effect sensor which is integrated in a semiconductor substrate and enables measurement of a magnetic field component. perpendicularly to the surface of the semiconductor substrate. The Hall effect sensor comprises several Hall elements having an electrically conductive semiconductor region which has a straight-line row of electrical measuring and control contacts on an end face on the substrate surface. The Hall elements are designed or can be operated in such manner that they have a sensitivity both to a magnetic field component parallel to and the magnetic field component perpendicular to the substrate surface of the semiconductor substrate (1). Several of the Hall elements are arranged such that their sensitivity to a magnetic field component parallel to the substrate surface of the semiconductor substrate can be compensated mutually by circuitry or in a signal evaluation. In this way, a sensitivity of these Hall elements to the magnetic field component perpendicular to the substrate surface of the semiconductor substrate is obtained. By using these Hall elements for measuring the magnetic field component perpendicularly to the substrate surface, a very low sensitivity to mechanical stresses can be achieved.

A magnetic sensor that includes a Hall element; a switch circuit configured to switch a direction of a drive current supplied to the Hall element between a first direction and a second direction; a magnetic field detection circuit configured to execute a detection operation for detecting a target magnetic field acting on the Hall element, based on a first difference between a Hall voltage generated in the Hall element when the drive current is supplied to the Hall element in the first direction and a Hall voltage generated in the Hall element when the drive current is supplied to the Hall element in the second direction; and a test magnetic field generation circuit configured to generate a test magnetic field different from the target magnetic field in a test operation.

A displacement detection apparatus includes a magnetic field generator, a first soft magnetic body, a second soft magnetic body, and a magnetic detection element. The magnetic field generator extends along a plane orthogonal to a first direction and includes a first portion and a second portion. The first soft magnetic body entirely overlaps the first portion in the first direction. The second soft magnetic body entirely overlaps the second portion in the first direction. The magnetic detection element is disposed in a region between the first soft magnetic body and the second soft magnetic body, and is configured to be subjected to a magnetic field generated by the magnetic field generator. The magnetic field generator, the first soft magnetic body, and the second soft magnetic body are provided to be integrally rotatable, with respect to the magnetic detection element, around a rotation axis extending in the first direction.

A tire or tread detection device for the classification of vehicular traffic. The invention allows the detection of tires by identifying with certainty the number of axles that make up a vehicle, thus determining its traffic category or classification, for the determination of loads, toll collection and evaluation of traffic supply and demand. The invention is a development integrated by hardware and software, electronic control devices, signal analysis and communications. The device is made up of Hall Effect sensors for detecting the magnetic field and magnetic field reinforcement magnets, geometrically arranged and interconnected to a microcomputer that interprets analog signals, to obtain the detection of the tire.

A Hall sensor includes a first Hall element pair configured to provide a first measurement signal, a second Hall element pair configured to provide a second measurement signal, and a third Hall element pair configured to provide a third measurement signal. Each element in the third Hall element pair is arranged between Hall elements of the first Hall element pair and Hall elements of the second Hall element pair. The Hall element pairs are configured to be actuated such that the first, second, and third measurement signals can be combined into one aggregate measurement signal which corrects an error in an angle of rotation determination caused by an external magnetic field.

A Hall sensor including multiple Hall elements which have a first terminal contact and a second terminal contact and a third terminal contact, the multiple Hall elements being electrically connected in series. The first terminal contacts and the third terminal contacts of the individual Hall elements are connected to each other, and the second terminal contacts of the Hall elements are supply voltage terminals or as Hall voltage taps. A beginning of a first branch being electrically connected in series to an end of a second branch, in such a way that the direction of the current flow through the Hall elements of the first branch is counter to the direction of the current flow through the Hall elements of the second branch.