Patent classifications
G01R35/002
Method of customized setting as well as measurement system
A method of customized setting at least one measurement device, comprises the steps of setting an intended measurement setup on the at least one measurement device manually via a user interface, recording, via a command recorder, at least one remote control command assigned to the manual setting of the intended measurement setup, converting the at least one remote control command recorded into specific instructions, and generating a standalone executable code at least based on the specific instructions obtained from the remote control command recorded. Further, a measurement system is provided.
Test system and method for testing a device under test having several communication lanes
A test system for testing a device under test that includes several communication lanes is described. The test system is a communication lane test system that includes a measurement instrument and a connecting interface for connecting the device under test, wherein the connecting interface is configured to connect at least two of the several communication lanes with the measurement instrument. The measurement instrument includes s a processor being configured to conduct an automatic conformance test on the at least two communication lanes concurrently. Moreover, a method for testing a device under test that includes s several communication lanes is described.
METHOD OF CUSTOMIZED SETTING AS WELL AS MEASUREMENT SYSTEM
A method of customized setting at least one measurement device, comprises the steps of setting an intended measurement setup on the at least one measurement device manually via a user interface, recording, via a command recorder, at least one remote control command assigned to the manual setting of the intended measurement setup, converting the at least one remote control command recorded into specific instructions, and generating a standalone executable code at least based on the specific instructions obtained from the remote control command recorded. Further, a measurement system is provided.
TEST SYSTEM AS WELL AS METHOD FOR TESTING A DEVICE UNDER TEST
A test system for testing a device under test that comprises several communication lanes is described. The test system is a communication lane test system that comprises a measurement instrument and a connecting interface for connecting the device under test, wherein the connecting interface is configured to connect at least two of the several communication lanes with the measurement instrument. The measurement instrument comprises a processor being configured to conduct an automatic conformance test on the at least two communication lanes concurrently. Moreover, a method for testing a device under test that comprises several communication lanes is described.
Measuring device and a method for measuring a high-frequency signal with deembedding
The invention relates to a measuring device for measuring a high-frequency signal and a method for correcting a high-frequency signal superposed with measurement errors by means of the measuring device. The measurement is a time-domain measurement in real-time. The measuring device provides a measurement-signal input, an analog digital converter and a processing unit, wherein the measurement-signal input is connected to a device under test in order to measure the high-frequency signal. According to the invention a deembedding unit is arranged in the signal path of the measuring device between analog-digital converter and the processing unit in order to compensate measurement errors resulting from the connection of devices under test and measuring devices.
PROBE FOR A SIGNAL ANALYZING DEVICE
A probe connectable to a signal analyzing device, said probe comprising an integrated reference signal generator adapted to generate a reference signal applied to a probe sensing area of said probe; and an integrated measurement circuit adapted to measure a probe signal provided by said probe sensing area in response to the applied reference signal.
MULTIPLE OUTPUT INSTRUMENT CALIBRATOR
A calibration instrument includes a user interface for receiving an input of a waveform type, a waveform generator coupled to the user interface and structured to generate a calibration waveform based on the waveform type, and a plurality of output channels each structured to receive the calibration waveform and to generate a calibration signal independent from other output channels, each of the plurality of output channels including an output amplifier for generating the calibration signal having an output amplitude level and an active head structured to specify the output amplitude level of the calibration signal to its respective output amplifier. Methods of operation are also described.
TEST FIXTURE, CALIBRATION SETUP AND METHOD OF CALIBRATING A TEST AND/OR MEASUREMENT INSTRUMENT
The present disclosure relates to a test fixture for being connected to a calibration device for calibrating a test and/or measurement instrument. The test fixture includes a probing point configured to receive a calibration signal while being in contact with a probe. The test fixture has a memory configured to store fixture data related to the probing point. Further, a calibration setup and a method of calibrating a test and/or measurement instrument are described.