One embodiment includes an electrometer system that includes a sensor cell and a probe laser to generate a probe beam directed through the sensor cell in a first direction and exiting the sensor cell as a detection beam. The system also includes a coupling laser to generate a coupling beam directed through the sensor cell collinearly and anti-parallel with the probe beam. The system also includes a reference signal generator configured to generate a reference signal having a predetermined polarization and a predetermined frequency through the sensor cell. The system further includes a detection system configured to monitor the detection beam to determine a frequency and a vector component of an external signal based on an intensity of the detection beam and based on the predetermined polarization and the predetermined frequency of the reference signal.

One embodiment includes an electrometer system that includes a sensor cell and a probe laser to generate a probe beam directed through the sensor cell in a first direction and exiting the sensor cell as a detection beam. The system also includes a coupling laser to generate a coupling beam directed through the sensor cell collinearly and anti-parallel with the probe beam. The system also includes a reference signal generator configured to generate a reference signal having a predetermined polarization and a predetermined frequency through the sensor cell. The system further includes a detection system configured to monitor the detection beam to determine a frequency and a vector component of an external signal based on an intensity of the detection beam and based on the predetermined polarization and the predetermined frequency of the reference signal.