A non-invasive temperature verification system used in a TLD system, which comprises at least one thermal sensor, which is placed near each of TLD element, measuring its temperature during heating cycle. The signal data from each thermal sensor is converted to time temperature profile which is used to verify and calibrate the TLD system.

A radiation dosimeter comprising a thermal micro-platform with a plurality of nanowires having phononic structures providing improved thermal isolation of the micro-platform. In embodiments, thermo-luminescent, MOS transistor and PIN diode sensors for x-ray, gamma, charged particles and neutron irradiation are disposed on the micro-platform. In a preferred embodiment the dosimeter is fabricated using a silicon SOI starting wafer.

A radiation dosimeter comprising a thermal micro-platform with a plurality of nanowires having phononic structures providing improved thermal isolation of the micro-platform. In embodiments, thermo-luminescent, MOS transistor and PIN diode sensors for x-ray, gamma, charged particles and neutron irradiation are disposed on the micro-platform. In a preferred embodiment the dosimeter is fabricated using a silicon SOI starting wafer.

The application relates to determining the amount of a predetermined type of radiation irradiated on a sensor material by: a) providing a sensor material; b) exposing the sensor material to the predetermined type of radiation for retaining the predetermined type of radiation in the sensor material for a predetermined period of time; c) subjecting the sensor material, which has been exposed to the predetermined type of radiation, to heat treatment and/or to optical stimulation; and d) determining the amount of visible light emitted by the sensor material as a result of being subjected to the heat treatment and/or to the optical stimulation; wherein the sensor material is represented by the following formula (I).

The application relates to determining the amount of a predetermined type of radiation irradiated on a sensor material by: a) providing a sensor material; b) exposing the sensor material to the predetermined type of radiation for retaining the predetermined type of radiation in the sensor material for a predetermined period of time; c) subjecting the sensor material, which has been exposed to the predetermined type of radiation, to heat treatment and/or to optical stimulation; and d) determining the amount of visible light emitted by the sensor material as a result of being subjected to the heat treatment and/or to the optical stimulation; wherein the sensor material is represented by the following formula (I).

A radiation detector includes an intermediate layer, which is arranged between a detection layer with a number of detection elements and a number of readout units. In an example embodiment of this arrangement, the intermediate layer has a plurality of electrically-conductive connections between the detection elements and the readout units. An example embodiment further specifies a medical imaging system, as well as a method of using the heating apparatus.

A radiation detector includes an intermediate layer, which is arranged between a detection layer with a number of detection elements and a number of readout units. In an example embodiment of this arrangement, the intermediate layer has a plurality of electrically-conductive connections between the detection elements and the readout units. An example embodiment further specifies a medical imaging system, as well as a method of using the heating apparatus.

The application relates to determining the amount of a predetermined type of radiation irradiated on a sensor material by: a) providing a sensor material; b) exposing the sensor material to the predetermined type of radiation for retaining the predetermined type of radiation in the sensor material for a predetermined period of time; c) subjecting the sensor material, which has been exposed to the predetermined type of radiation, to heat treatment and/or to optical stimulation; and d) determining the amount of visible light emitted by the sensor material as a result of being subjected to the heat treatment and/or to the optical stimulation; wherein the sensor material is represented by the following formula (I).

The application relates to determining the amount of a predetermined type of radiation irradiated on a sensor material by: a) providing a sensor material; b) exposing the sensor material to the predetermined type of radiation for retaining the predetermined type of radiation in the sensor material for a predetermined period of time; c) subjecting the sensor material, which has been exposed to the predetermined type of radiation, to heat treatment and/or to optical stimulation; and d) determining the amount of visible light emitted by the sensor material as a result of being subjected to the heat treatment and/or to the optical stimulation; wherein the sensor material is represented by the following formula (I).

An embodiment of a dosimeter apparatus is described that comprises a first radiation sensor configured to measure high energy photons from a radiation field; a second radiation sensor configured to measure accumulated photons from the radiation field over a time interval; an interface; and a processor comprising executable code stored thereon, wherein the executable code: computes a high dose value for the high energy photons measured by the first radiation sensor; computes an event dose value of the photons accumulated over the time interval; determines a total dose value for the time interval that comprises the greater of the high dose value or the event dose value; and communicates the total dose value for the time interval to a user via the interface.