An ion beam profiling system include a beam profiling element, an ion sensitive element electrically isolated from the beam profiling element, an ion source configured to emit an ion beam at the beam profiling element and the ion sensitive element, and a current measuring device coupled to the ion sensitive element. The beam profiling element includes a plate of material having two parallel major surfaces, a first slit aperture extending through the plate of material and having a first longitudinal length extending in a direction parallel to the two parallel major surfaces, and a second slit aperture extending through the plate of material and having a second longitudinal length extending in a direction parallel to the two parallel major surfaces, wherein the first longitudinal length of the first slit aperture is perpendicular to the second longitudinal length of the second slit aperture.

The present disclosure provides a gamma camera imaging method and a gamma camera imaging device. The method includes: selecting, from energy spectrums captured by a gamma camera on one or more radioactive materials, one or more energy ranges of each radioactive material among the one or more radioactive materials as one or more monitored energy regions of the radioactive material; performing image reconstruction on the monitored energy regions of each radioactive material among the one or more radioactive materials; performing normalization on images obtained through the image reconstruction; and performing superimposing on the normalized images to form a composite image.

A radiographic capturing apparatus includes the following. A wireless communication circuit or a wireless communication device establishes wireless communication with an external unit. A power supply circuit feeds electrical power to the wireless communication circuit or the wireless communication device and is switchable between a low-load mode and a high-load mode. The power supply circuit is able to feed a current having a larger value in the high-load mode than in the low-load mode. A power supply efficiency of the power supply circuit in the high-load mode is lower than that in the low-load mode when a current having a small value as in the low-load mode is fed in the high-load mode. A switcher switches a load mode of the power supply circuit based on the detected or obtained load state. A built-in power supply feeds electrical power to the power supply circuit.

A method and apparatus are provided for positron emission imaging to calibrate energy measurements of a pixilated gamma-ray detector using energy calibration based on a calibration with a distribution energy signature (i.e., having more spectral features than just a single full-energy peak). The energy calibration can be performed using a deep learning (DL) network or a physics-based model. Using the DL network, a calibration spectrum is applied to either generate the measured-signal values of known energy values (e.g., spectral peaks for spectra of various radioactive isotopes) or the parameters of an energy-calibration function/model.

An apparatus for characterizing a focused charged beam is provided. The apparatus includes a plurality of parallel conducting channels and at least one current sensing unit configured to measure current across each of the plurality of parallel conducting channels.

An ion beam profiling system include a beam profiling element, an ion sensitive element electrically isolated from the beam profiling element, an ion source configured to emit an ion beam at the beam profiling element and the ion sensitive element, and a current measuring device coupled to the ion sensitive element. The beam profiling element includes a plate of material have two parallel major surfaces, a first slit aperture extending through the plate of material and having a first longitudinal length extending in a direction parallel to the two parallel major surfaces, and a second slit aperture extending through the plate of material and having a second longitudinal length extending in a direction parallel to the two parallel major surfaces, wherein the first longitudinal length of the first slit aperture is perpendicular to the second longitudinal length of the second slit aperture.

A system for characterising a beam of charged particles. The system includes a stack comprising an ultra-thin pattern formed from an electrically conductive material; a thin substrate bearing the pattern. The stack forms an emitting electrode able to emit secondary electrons in proximity to a surface of the pattern when the emitting electrode is passed through by the beam of charged particles.

A radiation image capturing apparatus includes, as a plurality of pixels two-dimensionally arranged in an image capturing area, a plurality of image pixels configured to output electric signals for acquiring a radiation image and a plurality of detection pixels configured to output electric signals for detecting information about irradiation of the image capturing area with the irradiation. The plurality of detection pixels is arranged as a line-shaped detection pixel group in the image capturing area, and a plurality of detection driving lines is connected to the line-shaped detection pixel group. A readout circuit reads out, at different timings, the electric signals group by group to each of which a different one of the plurality of detection driving lines is connected in the line-shaped detection pixel group.

To optimize an image quality and/or a sensitivity, a Compton camera is adaptable. A scatter detector and/or a catcher detector may move closer to and/or further away from a patient and/or each other. This adaptation allows a balancing of the image quality and the sensitivity by altering the geometry.

A radiation image capturing apparatus includes, as a plurality of pixels two-dimensionally arranged in an image capturing area, a plurality of image pixels configured to output electric signals for acquiring a radiation image and a plurality of detection pixels configured to output electric signals for detecting information about irradiation of the image capturing area with the irradiation. The plurality of detection pixels is arranged as a line-shaped detection pixel group in the image capturing area, and a plurality of detection driving lines is connected to the line-shaped detection pixel group. A readout circuit reads out, at different timings, the electric signals group by group to each of which a different one of the plurality of detection driving lines is connected in the line-shaped detection pixel group.