A scanner for scanning a QA test slide as part of a stain QA method, and method of using the scanner are described. The scanner comprises a housing defining an interior of the scanner, a slide holder within the housing and configured to receive a QA test slide, a digital camera within the housing and arranged to capture an image of the QA test slide when located in the slide holder, and a light source within the housing and arranged to illuminate both a rear side and a front side of the QA test slide when located in the slide holder.

Embodiments disclose a device for testing biological specimen. The device includes a sample carrier and a detachable cover. The sample carrier includes a specimen holding area. The detachable cover is placed on top of the specimen holding area. The detachable cover includes a magnifying component configured to align with the specimen holding area. The focal length of the magnifying component is from 0.1 mm to 8.5 mm. The magnifying component has a linear magnification ratio of at least 1.

Systems and methods for three-dimensional fluorescence polarization excitation that generates maps of positions and orientation of fluorescent molecules in three or more dimensions are disclosed.

A spectral imaging device (12) includes an image sensor (28), a tunable light source (14), an optical assembly (17), and a control system (30). The optical assembly (17) includes a first refractive element (24A) and a second refractive element (24B) that are spaced apart from one another by a first separation distance. The refractive elements (24A) (24B) have an element optical thickness and a Fourier space component of the optical frequency dependent transmittance function. Further, the element optical thickness of each refractive element (24A) (24B) and the first separation distance are set such that the Fourier space components of the optical frequency dependent transmittance function of each refractive element (24A) (24B) fall outside a Fourier space measurement passband.

The present invention relates to fluorescence microscopy and specifically to improvements of method for and a corresponding fluorescence microscopy system for allowing separate detection of a plurality of fluorochromes.

The invention relates to a method for determining an imaging function of a mask inspection microscope, wherein the mask inspection microscope comprises an imaging optical element, a tube, a recording device, an object stage, an illumination unit for measurement with transmitted light and an illumination unit for measurement in reflection, comprising the following method steps: a) measuring the intensities in the pupil plane of the imaging optical element in a reflective measurement, b) measuring the intensities in the pupil plane of the imaging optical element in a transmitted-light measurement, d) Determining the imaging function of the intensities of the imaging optical element, d) determining the imaging function of the intensities of the illumination optical element comprised in the illumination unit for the transmitted-light measurement. Furthermore, the invention relates to a mask inspection microscope for determining the deviation of an actual structure from a desired structure on an object, comprising an imaging optical element, a tube, a recording device, an additional optical module, an illumination unit for measurement with transmitted light, an illumination unit for measurement in reflection, and an object stage, wherein the object stage is configured to move to a position with a deviation of less than 100 nm, in particular of less than 20 nm, a calculation unit, in which the calculation unit is configured to calibrate the mask inspection microscope.

Systems and methods for three-dimensional fluorescence polarization excitation that generates maps of positions and orientation of fluorescent molecules in three or more dimensions are disclosed.

An imaging microscope (12) for generating an image of a sample (10) comprises a beam source (14) that emits a temporally coherent illumination beam (20), the illumination beam (20) including a plurality of rays that are directed at the sample (10); an image sensor (18) that converts an optical image into an array of electronic signals; and an imaging lens assembly (16) that receives rays from the beam source (14) that are transmitted through the sample (10) and forms an image on the image sensor (18). The imaging lens assembly (16) can further receive rays from the beam source (14) that are reflected off of the sample (10) and form a second image on the image sensor (18). The imaging lens assembly (16) receives the rays from the sample (10) and forms the image on the image sensor (18) without splitting and recombining the rays.

An illumination device for an optical device, a microscope or a macroscope includes a first illumination source configured to emit light which is directed via an illumination beam path onto an object to be illuminated that is arranged in an object plane. At least one second illumination source is positionable in the illumination beam path, and is transparent or semitransparent as well as self-luminous. The at least one second illumination source is configured to allow light emitted from the first illumination source to pass through at least in part. The object plane having the object to be illuminated is configured to be illuminated both by the first and by the at least one second illumination source.

A measurement system includes a focused light source, a first mirror, a plurality of first lenses, a second mirror, a plurality of second lenses and an imaging device. The first mirror is positioned on a first side of a sample and configured to receive light from the light source. The plurality of first lenses are positioned between the first mirror and the sample. The second mirror is positioned on a second side of the sample. The plurality of second lenses are positioned between the second mirror and the sample. The imaging device is positioned adjacent to the second mirror and configured to receive the light from the light source after the light propagates a number of propagations between the first mirror and the second mirror, and through the first lenses and the second lenses.