G02B21/06

Compact Microscope Stage
20230048374 · 2023-02-16 · ·

A microscope stage comprising a planar base (1) with two or more parallel grooves (2) formed extending in a first direction (5). A carriage (3) is mounted on the base with at least two projections (4) that slide in the grooves. The carriage receives a microscope slide or other sample holder (6). The carriage includes at least one guide and a biasing means (7) to urge the sample holder against the guide while permitting it to move relative to the guide in a second direction (8) orthogonal to the first direction.

OPHTHALMOLOGIC MICROSCOPE WITH MICRO-MIRROR BALANCING
20230049486 · 2023-02-16 · ·

The ophthalmologic microscope has an illumination device for projecting light onto an eye to be observed and a microscope device with a camera to view the eye. The illumination device generates pulsed light. The light is pulsed at least at twice the frame rate of the camera to reduce flicker. The illumination device uses an array of micro-mirrors as spatial light modulator, and the mirrors are controlled for a balanced deflection over the frame cycles, which allows to increase the service life of the microscope.

SYSTEM AND METHOD FOR MEASURING DISTORTED ILLUMINATION PATTERNS AND CORRECTING IMAGE ARTIFACTS IN STRUCTURED ILLUMINATION IMAGING

A method for measuring distorted illumination patterns and correcting image artifacts in structured illumination microscopy. The method includes the steps of generating an illumination pattern by interfering multiple beams, modulating a scanning speed or an intensity of a scanning laser, or projecting a mask onto an object; taking multiple exposures of the object with the illumination pattern shifting in phase; and applying Fourier transform to the multiple exposures to produce multiple raw images. Thereafter, the multiple raw images are used to form and then solve a linear equation set to obtain multiple portions of a Fourier space image of the object. A circular 2-D low pass filter and a Fourier Transform are then applied to the portions. A pattern distortion phase map is calculated and then corrected by making a coefficient matrix of the linear equation set varying in phase, which is solved in the spatial domain.

SYSTEM AND METHOD FOR MEASURING DISTORTED ILLUMINATION PATTERNS AND CORRECTING IMAGE ARTIFACTS IN STRUCTURED ILLUMINATION IMAGING

A method for measuring distorted illumination patterns and correcting image artifacts in structured illumination microscopy. The method includes the steps of generating an illumination pattern by interfering multiple beams, modulating a scanning speed or an intensity of a scanning laser, or projecting a mask onto an object; taking multiple exposures of the object with the illumination pattern shifting in phase; and applying Fourier transform to the multiple exposures to produce multiple raw images. Thereafter, the multiple raw images are used to form and then solve a linear equation set to obtain multiple portions of a Fourier space image of the object. A circular 2-D low pass filter and a Fourier Transform are then applied to the portions. A pattern distortion phase map is calculated and then corrected by making a coefficient matrix of the linear equation set varying in phase, which is solved in the spatial domain.

REFLECTIVE FPM USING A PARABOLIC MIRROR

The present disclosure relates to a reflective FPM using a parabolic mirror, and particularly to a reflective FPM using a parabolic mirror including: a first illuminator having a first panel that is provided with numerous LED light sources and composed of a first LED array irradiating a plurality of first LED beams to a measurement object sequentially at different angles through an objective lens; a second illuminator having a second panel that is provided with numerous LED light sources and composed of a second LED array irradiating a plurality of second LED beams to the measurement object sequentially at different angles, following irradiation from the first illuminator; a parabolic mirror reflecting each of second beams generated from the second illuminator, allowing being incident on the measurement object; a lens configured to collect a beam from the measurement object to which the first and second LED beams were irradiated; and a photodetector receiving light from the lens and acquires images for each of a plurality of first and second beams.

REFLECTIVE FPM USING A PARABOLIC MIRROR

The present disclosure relates to a reflective FPM using a parabolic mirror, and particularly to a reflective FPM using a parabolic mirror including: a first illuminator having a first panel that is provided with numerous LED light sources and composed of a first LED array irradiating a plurality of first LED beams to a measurement object sequentially at different angles through an objective lens; a second illuminator having a second panel that is provided with numerous LED light sources and composed of a second LED array irradiating a plurality of second LED beams to the measurement object sequentially at different angles, following irradiation from the first illuminator; a parabolic mirror reflecting each of second beams generated from the second illuminator, allowing being incident on the measurement object; a lens configured to collect a beam from the measurement object to which the first and second LED beams were irradiated; and a photodetector receiving light from the lens and acquires images for each of a plurality of first and second beams.

ANNULAR LIGHT SOURCE DEVICE FOR FUNDUS CAMERAS
20230039680 · 2023-02-09 · ·

A device has a light guide portion and a light collector portion. The light guide portion is cup shaped. The wall of the cup has a cross section defined by sections of two ellipses disposed in a predefined manner with each other. The light collector portion is also cup-shaped, inverted with reference to the light guide portion, by a section of an ellipse and straight lines defined with reference to the light guide portion. The device radiates an annular illumination at the rim of the cup through total internal reflection of light from an LED, collected by the light collector portion. The device is made of a clear, colourless, substantially transparent material by injection moulding, one example being Polycarbonate. An annular light source system and a fundus camera using such a system are also disclosed.

System and method to simultaneously track multiple organisms at high resolution
20230045152 · 2023-02-09 ·

A microscopy includes multiple cameras working together to capture image data of a sample having a group of organisms distributed over a wide area, under the influence of an excitation instrument. A first processor is coupled to each camera to process the image data captured by the camera. Outputs from the multiple first processors are aggregated and streamed serially to a second processor for tracking the organisms. The presence of the multiple cameras capturing images from the sample, configured with 50% or more overlap, can allow 3D tracking of the organisms through photogrammetry.

System and method to simultaneously track multiple organisms at high resolution
20230045152 · 2023-02-09 ·

A microscopy includes multiple cameras working together to capture image data of a sample having a group of organisms distributed over a wide area, under the influence of an excitation instrument. A first processor is coupled to each camera to process the image data captured by the camera. Outputs from the multiple first processors are aggregated and streamed serially to a second processor for tracking the organisms. The presence of the multiple cameras capturing images from the sample, configured with 50% or more overlap, can allow 3D tracking of the organisms through photogrammetry.

Method for illuminating samples in microscopic imaging methods

A method for illuminating samples in microscopic imaging methods, wherein a number m of different wavelengths λ.sub.i, with m>I and i=I, . . . , m, is selected for the illumination. For each of the wavelengths λ.sub.i a target phase function Δφ.sub.i(x, y, λ.sub.i) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function Δφ.sub.i(x, y, λ.sub.i) is effective only for the corresponding wavelength λ.sub.i. The target phase functions Δφ.sub.i are predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions Δφ.sub.i(x, y, λ.sub.i). This total phase mask is then illuminated simultaneously or successively with coherent light of wavelengths λ.sub.i such that the predefined structure of the illumination light is generated in the region of the sample.