The technology disclosed present systems and methods to produce an enhanced resolution image from images of a target using structured illumination microscopy (SIM). The method includes transforming at least three images of the target captured by a sensor in a spatial domain into a Fourier domain to produce at least three frequency domain matrices that each include first blocks of complex coefficients and redundant second blocks of complex coefficients that are conjugates to the first blocks. The method includes reducing computing resources required to produce the enhanced resolution image by using first blocks of complex coefficients to produce at least three phase-separated half-matrices in the Fourier domain. The method includes performing one or more intermediate transformation on the phase-separated half-matrices to produce realigned shifted half-matrices. The method includes calculating complex coefficients of second blocks in the Fourier domain to produce full matrices from half-matrices.

An electromagnetic wave detecting device comprising: an emission unit configured to emit electromagnetic waves having coherence; an electromagnetic wave modulating unit configured to modulate one or both of a phase and an amplitude of the emitted electromagnetic waves and to change a state of the modulation relative to an imaging target; and a post-modulation electromagnetic wave intensity detecting unit configured to detect an intensity of post-modulation electromagnetic waves, which are the modulated electromagnetic waves acquired by modulating the electromagnetic waves emitted from the emission unit using the imaging target and the electromagnetic wave modulating unit, using one pixel.

An electromagnetic wave detecting device comprising: an emission unit configured to emit electromagnetic waves having coherence; an electromagnetic wave modulating unit configured to modulate one or both of a phase and an amplitude of the emitted electromagnetic waves and to change a state of the modulation relative to an imaging target; and a post-modulation electromagnetic wave intensity detecting unit configured to detect an intensity of post-modulation electromagnetic waves, which are the modulated electromagnetic waves acquired by modulating the electromagnetic waves emitted from the emission unit using the imaging target and the electromagnetic wave modulating unit, using one pixel.

An electromagnetic wave detecting device comprising: an emission unit configured to emit electromagnetic waves having coherence; an electromagnetic wave modulating unit configured to modulate one or both of a phase and an amplitude of the emitted electromagnetic waves and to change a state of the modulation relative to an imaging target; and a post-modulation electromagnetic wave intensity detecting unit configured to detect an intensity of post-modulation electromagnetic waves, which are the modulated electromagnetic waves acquired by modulating the electromagnetic waves emitted from the emission unit using the imaging target and the electromagnetic wave modulating unit, using one pixel.

According to the present disclosure, an optical signal emitted from a single molecule is received to measure a central location of the single molecule while changing a phase of a structured illumination having a periodic pattern to measure a phase of a pattern in which a fluorescence intensity is periodically changed in accordance with a distance between the pattern and the single molecule while displacing the periodic pattern by a specific interval to measure the central location of the single molecule, thereby improving an accuracy of the central location of the single molecule with low photons and as a result, the resolution of the image may be enhanced.

According to the present disclosure, an optical signal emitted from a single molecule is received to measure a central location of the single molecule while changing a phase of a structured illumination having a periodic pattern to measure a phase of a pattern in which a fluorescence intensity is periodically changed in accordance with a distance between the pattern and the single molecule while displacing the periodic pattern by a specific interval to measure the central location of the single molecule, thereby improving an accuracy of the central location of the single molecule with low photons and as a result, the resolution of the image may be enhanced.

Systems, methods, and apparatus for differential phase contrast microscopy by transobjective differential epi-detection of forward scattered light are provided. In some embodiments, a microscope objective comprises: a housing with mounting threads at a second end; optical components defining an optical axis, comprising: an objective lens mounted at a first end, configured to collect light from a sample placed in a field of view, the plurality of optical components create a pupil plane at a first distance along the optical axis at which rays having the same angle of incidence on the objective lens converge at the same radial distance from the optical axis; a photodetector within the housing offset from the optical axis at a second distance along the optical axis; and another photodetector within the housing at second distance along the optical axis and offset from the optical axis in the opposite direction from the first photodetector.

Systems, methods, and apparatus for differential phase contrast microscopy by transobjective differential epi-detection of forward scattered light are provided. In some embodiments, a microscope objective comprises: a housing with mounting threads at a second end; optical components defining an optical axis, comprising: an objective lens mounted at a first end, configured to collect light from a sample placed in a field of view, the plurality of optical components create a pupil plane at a first distance along the optical axis at which rays having the same angle of incidence on the objective lens converge at the same radial distance from the optical axis; a photodetector within the housing offset from the optical axis at a second distance along the optical axis; and another photodetector within the housing at second distance along the optical axis and offset from the optical axis in the opposite direction from the first photodetector.

A system that includes an interference device including a reference arm on which a reflective surface is arranged, where the interference device produces, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth; an acquisition device suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit that calculates an image representing temporal variations in intensity between said N two-dimensional interferometric signals.

A system that includes an interference device including a reference arm on which a reflective surface is arranged, where the interference device produces, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth; an acquisition device suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit that calculates an image representing temporal variations in intensity between said N two-dimensional interferometric signals.