A system that includes an interference device including a reference arm on which a reflective surface is arranged, where the interference device produces, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth; an acquisition device suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit that calculates an image representing temporal variations in intensity between said N two-dimensional interferometric signals.

Dual mode imaging systems and methods for macroscopic and microscopic imaging using the same optical imaging system (OIS). The various embodiments enable controllable and/or automated switching between macroscopic imaging and microscopic imaging modes. A dual mode imaging system includes a sample platform movable relative to an OIS between first and second locations, and a light source subsystem configured to generate and project an illumination beam onto a focal plane. When in the first location, the sample platform coincides with the focal plane, and the OIS receives light from the sample platform along a first detection light path. When in the second location, the illumination beam interacts with relay optics and impinges on the sample platform through an objective lens, and the light from the sample platform is directed back through the objective lens and relay optics to the OIS via the first detection path.

The present invention relates to a system and method for digital holographic microscopy. According to an aspect of the invention there is provided an off-axis digital holographic microscope comprising: a light emitter configured to provide a divergent light beam; a sensor position to receive light from the light emitter in a first path and a second path, and thereby to detect a holographic image; a reflector positioned partially in the divergent light beam so that light that encounters the reflector extends towards the sensor in the first path, and light that does not encounter the reflector extends towards the sensor in the second path; and a support structure configured to support a sample in the first path or the second path.

The present invention relates to a system and method for digital holographic microscopy. According to an aspect of the invention there is provided an off-axis digital holographic microscope comprising: a light emitter configured to provide a divergent light beam; a sensor position to receive light from the light emitter in a first path and a second path, and thereby to detect a holographic image; a reflector positioned partially in the divergent light beam so that light that encounters the reflector extends towards the sensor in the first path, and light that does not encounter the reflector extends towards the sensor in the second path; and a support structure configured to support a sample in the first path or the second path.

A detection optical system includes an objective lens, a first relay lens, a second relay lens, and an imaging lens, which are arranged in order from a side of a specimen along an optical path of light from the specimen illuminated by a light source. A primary imaging plane is provided on the optical path between the first relay lens and the second relay lens. An aspherical correction plate that corrects spherical aberration is arranged at a position located between the second relay lens and the imaging lens and substantially conjugate with a pupil position of the objective lens.

A quantitative phase microscopy (QPM) system and methods are provided for sample imaging and metrology in both transmissive and reflective modes. The QPM system includes a first illuminating beam propagating along a transmission-mode path and a second illuminating beam propagating along a reflection-mode path, a microscope objective lens disposed in the reflection-mode path, and a common-path interferometer comprising a diffraction grating, a Fourier lens, a pinhole, and a 2f system lens to collimate the reference beam and the imaging beam such that the collimated reference beam and imaging beam interfere with each other to form an interferogram at a final image plane.

A quantitative phase microscopy (QPM) system and methods are provided for sample imaging and metrology in both transmissive and reflective modes. The QPM system includes a first illuminating beam propagating along a transmission-mode path and a second illuminating beam propagating along a reflection-mode path, a microscope objective lens disposed in the reflection-mode path, and a common-path interferometer comprising a diffraction grating, a Fourier lens, a pinhole, and a 2f system lens to collimate the reference beam and the imaging beam such that the collimated reference beam and imaging beam interfere with each other to form an interferogram at a final image plane.

A vibration damping structure (60), a detection system and a sequencing system. The vibration damping structure (60) is used in the detection system. The vibration damping structure (60) comprises a main body (62) and a support body (64), the main body (62) is connected to the detection system by means of the support body (64), the main body (62) comprises an imaging module (10), an upper layer structure (66), a lower layer structure (68) and an intermediate structure (70), the imaging module (10) is mounted on the upper layer structure (66), the lower layer structure (68) bears the upper layer structure (66) by means of the intermediate structure (70), and the natural frequency of the main body (62) is greater than or equal to √{square root over (2)} times the internal excitation frequency.

A vibration damping structure (60), a detection system and a sequencing system. The vibration damping structure (60) is used in the detection system. The vibration damping structure (60) comprises a main body (62) and a support body (64), the main body (62) is connected to the detection system by means of the support body (64), the main body (62) comprises an imaging module (10), an upper layer structure (66), a lower layer structure (68) and an intermediate structure (70), the imaging module (10) is mounted on the upper layer structure (66), the lower layer structure (68) bears the upper layer structure (66) by means of the intermediate structure (70), and the natural frequency of the main body (62) is greater than or equal to √{square root over (2)} times the internal excitation frequency.

Examples relate to a microscope, and to an apparatus, method and computer program for a microscope. The microscope comprises a light emission module for providing illumination for a sample of organic tissue in a plurality of wavelength bands. The microscope comprises one or more imaging sensor modules configured to independently sense light in a plurality of mutually separated wavelength bands of the plurality of wavelength bands. The microscope comprises a processing module configured to control the light emission module such, that in a first operating mode light in a first subset of the plurality of wavelength bands is emitted towards the sample of organic tissue, and that in a second operating mode light in a second subset of the plurality of wavelength bands is emitted towards the sample of organic tissue. The first and second subset of wavelength bands are at least partially different. The processing module is configured to use the one or more imaging sensor modules to perform reflectance imaging and fluorescence imaging in each of the plurality of mutually separated wavelength bands based on the light emitted in the first and second operating modes.