The invention relates to a sample holder for a microscopy system comprising a material with a low thermal conductivity for reducing a drift of the sample holder when inserted into a microscope. The invention also relates to a cold trap for a microscopy system comprising a sample holder, wherein the cold trap comprises a coating with a high thermal emissivity to increase a heat load between the sample holder and the cold trap. The invention also relates to a microscopy system comprising a first element configured to have a first temperature, a second element configured to have a second temperature, and a third element configured to have a third temperature, wherein the third element is configured to be located at a plurality of different distances from the first element, wherein the microscopy system is configured to image a sample and to reduce a drift of the image.

The invention relates to a sample holder for a microscopy system comprising a material with a low thermal conductivity for reducing a drift of the sample holder when inserted into a microscope. The invention also relates to a cold trap for a microscopy system comprising a sample holder, wherein the cold trap comprises a coating with a high thermal emissivity to increase a heat load between the sample holder and the cold trap. The invention also relates to a microscopy system comprising a first element configured to have a first temperature, a second element configured to have a second temperature, and a third element configured to have a third temperature, wherein the third element is configured to be located at a plurality of different distances from the first element, wherein the microscopy system is configured to image a sample and to reduce a drift of the image.

A compact microscope including an enclosure, a support element, a primary optical support element located within the enclosure and supported by the support element, at least one vibration isolating mount between the support element and the primary optical support element, a sample stage supported on the primary optical support element to support a sample, a return optical system to receive returned light from a sample and transmit returned light to a detection apparatus, wherein the return optical system is mounted on the primary optical support element, and wherein the compact microscope include a at least one of the following elements; a) an objective lens system, b) a temperature-control system, and c) the return optical system being operable to separate returned light into at least a first wavelength band and a second wavelength band.

A compact microscope including an enclosure, a support element, a primary optical support element located within the enclosure and supported by the support element, at least one vibration isolating mount between the support element and the primary optical support element, a sample stage supported on the primary optical support element to support a sample, a return optical system to receive returned light from a sample and transmit returned light to a detection apparatus, wherein the return optical system is mounted on the primary optical support element, and wherein the compact microscope include a at least one of the following elements; a) an objective lens system, b) a temperature-control system, and c) the return optical system being operable to separate returned light into at least a first wavelength band and a second wavelength band.

A device for mounting an object holder on a carrier that can be inserted into a cryostat includes at least one clamping element may be provided for non-positive connection of the object holder with the carrier. The at least one clamping element is arranged to enable damage-free mounting of the object holder on the carrier even in the case of large temperature changes, so that reproducible measuring conditions are created at large temperature changes. The at least one clamping element may be drive-connected via a lever to a piezoelectric element, which may be subjected to voltage by a control device as a function of temperature and of a bearing specification and is supported against the object holder or the carrier.

A device for mounting an object holder on a carrier that can be inserted into a cryostat includes at least one clamping element may be provided for non-positive connection of the object holder with the carrier. The at least one clamping element is arranged to enable damage-free mounting of the object holder on the carrier even in the case of large temperature changes, so that reproducible measuring conditions are created at large temperature changes. The at least one clamping element may be drive-connected via a lever to a piezoelectric element, which may be subjected to voltage by a control device as a function of temperature and of a bearing specification and is supported against the object holder or the carrier.

A microscope includes: a sample chamber; a microscope stage arranged below the sample chamber for having a sample carrier arranged thereon; a pipetting device for pipetting the sample carrier; and a moving mechanism for moving the pipetting device between a non-operating position in which the pipetting device is arranged outside the sample chamber sample carrier and an operating position in which the pipetting device is arranged inside the sample chamber facing the sample carrier.

A system and method for combining multiple emitters into a multi-wavelength output beam having a certain band and combining a plurality of these bands into a single output using non-free space combining modules.

Methods and systems are provided for an imaging system. In one example, the imaging system includes a plurality of microscope assemblies arranged radially around a central axis of the imaging system, coupled to vertically oriented plates with a set of objectives arranged at tops of the plurality of microscope assemblies and wherein the plates are oriented to extend away from the central axis in a radial direction to form an x-shaped configuration.

Methods and systems are provided for an imaging system. In one example, the imaging system includes a plurality of microscope assemblies arranged radially around a central axis of the imaging system, coupled to vertically oriented plates with a set of objectives arranged at tops of the plurality of microscope assemblies and wherein the plates are oriented to extend away from the central axis in a radial direction to form an x-shaped configuration.