A microscope system is provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, and a processor. The processor is configured to specify a type of a container in which a specimen is placed, and when starting observation of the specimen placed in the container at the second magnification, the processor is configured to specify an observation start position by performing object detection according to the type of container on a first image that includes the container acquired by the microscope at the first magnification, and control a relative position of the microscope with respect to the specimen such that the observation start position is contained in a field of view at the second magnification of the microscope.

A microscope system is provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, and a processor. The processor is configured to specify a type of a container in which a specimen is placed, and when starting observation of the specimen placed in the container at the second magnification, the processor is configured to specify an observation start position by performing object detection according to the type of container on a first image that includes the container acquired by the microscope at the first magnification, and control a relative position of the microscope with respect to the specimen such that the observation start position is contained in a field of view at the second magnification of the microscope.

A system for use in spectral analysis procedures can include a slide and a holder for carrying the slide. The slide includes a substrate forming a plurality of wells that are recessed relative to a surface of the substrate. Each of the wells forms a sample region that is recessed by a sample depth from the surface and a trough region that is recessed by a trough depth from the surface, the trough depth being greater than the sample depth. The holder includes a body defining a cavity between a first side and a second side of the body, a port for receiving the slide into the cavity, one or more first fenestrations on the first side, and one or more second fenestrations on the second side.

Methods to form a surface coating and surface pattern, which are based on adsorption of hydrocarbon chains that can be used with imaging optics to visualize macrophage fusion and multinucleated giant cell formation with living specimens are described.

Methods to form a surface coating and surface pattern, which are based on adsorption of hydrocarbon chains that can be used with imaging optics to visualize macrophage fusion and multinucleated giant cell formation with living specimens are described.

A sample observation device includes: an emission optical system that emits planar light to a sample on an XZ plane; a scanning unit that scans the sample in a Y-axis direction so as to pass through an emission surface of the planar light; an imaging optical system that has an observation axis inclined with respect to the emission surface and forms an image of observation light generated in the sample; an image acquisition unit that acquires a plurality of pieces of XZ image data corresponding to an optical image of the observation light; and an image generation unit 8 that generates XY image data based on the plurality of pieces of XZ image data. The image generation unit extracts an analysis region of the plurality of pieces of XZ image data acquired in the Y-axis direction, integrates brightness values of at least the analysis region in a Z-axis direction to generate X image data, and combines the X image data in the Y-axis direction to generate the XY image data.

An apparatus for imaging a feature within a specimen is provided. According to one implementation the apparatus includes a substrate that is configured to support a specimen on an upper surface of the substrate so that the specimen resides over a hole that extends through the substrate. A heater is located vertically above the upper surface of the substrate. The heater is configured to heat the specimen when the specimen is supported on the substrate. An imaging device is located vertically below the lower surface of the substrate. The imaging device has an unobstructed line of sight to and through the hole in the substrate. The lower surface of the substrate is supported on a heat insulating platform in a manner that permits air to flow between the heat insulating platform and the lower surface of the substrate.

A system for quantitative differential phase contrast microscopy with isotropic transfer function utilizes a modulation mechanism to create a detection light field having a radial or other axial orientation of optical intensity gradient or other distribution. A condenser generates an off-axis light field to project onto an object under examination, thereby generating an object light field, which is then guided to an image capturing device through an objective lens for capturing images. A differential phase contrast algorithm is applied to the images for obtaining a phase, thereby a depth information corresponding to the phase can be obtained to reconstruct the surface profile of the object.

A method (400) and a system (200) for generating a chromatically modified image of one or more components on a microscopic slide (303) is disclosed. In one aspect of the invention, the method includes obtaining the image of the one or more components on the microscopic slide (303). Additionally, the method (400) includes processing the image to identify the one or more components. The method (400) further includes segmenting at least one part of the one or more components identified from the image. Furthermore, the method (400) includes chromatically modifying the at least one part of the one or more components and generating a chromatically modified image of the one or more components.

The invention relates to a method in the preparation of samples for microscopic examination onto which a coverslip is applied. The method is notable for the fact that the coverslipping quality is checked automatically and at least partly optically. The invention further relates to an apparatus for carrying out the method, and to an apparatus for checking the coverslipping quality of samples onto which a coverslip is applied.