Enhanced probe cards, for testing unpackaged semiconductor die including numerous discrete devices (e.g., LEDs), are described. The die includes anodes and cathodes for the LEDs. Via a single touchdown event, the probe card may simultaneously operate each of the LEDs. The LEDs' optical output is measured and the performance of the die is characterized. The probe card includes a conductive first contact and another contact that are fabricated from a conformal sheet or film. Upon the touchdown event, the first contact makes contact with each of the die's anodes and the other contact makes contact with each of the die's cathodes. The vertical and sheet resistance of the contacts are sufficient such that the voltage drop across the vertical dimension of the contacts is approximately an order of magnitude greater than the operating voltage of the LEDs and current-sharing between adjacent LEDs is limited by the sheet resistance.

A nanocomposite includes a plurality of nanoparticles, where each nanoparticle of the plurality of nanoparticles includes a TiO.sub.2 nanoparticle core characterized by a diameter between about 1 nm and about 20 nm and a surface .OH density below about 6.OH/nm.sup.2, and a nanoparticle shell conformally formed on surfaces of the TiO.sub.2 nanoparticle core. The nanoparticle shell is continuous and is thinner than about 2 nm. The nanoparticle shell includes a transparent material with a refractive index greater than about 1.7 for visible light. A valence band of the nanoparticle shell is more than about 0.1 eV lower than a valence band of the TiO.sub.2 nanoparticle core. A conduction band of the nanoparticle shell is more than about 0.5 eV higher than a conduction band of the TiO.sub.2 nanoparticle core.

Embodiments of the present disclosure relate to methods for controlling etch depth by providing localized heating across a substrate. The method for controlling temperatures across the substrate can include individually controlling a plurality of heating pixels disposed in a dielectric body of a substrate support assembly. The plurality of heating pixels provide temperature distributions on a first surface of the substrate disposed on a support surface of the dielectric body. The temperature distributions correspond to a plurality of portions of at least one grating on a second surface of the substrate to be exposed to an ion beam. Additionally, the temperatures can be controlled by individually controlling light emitting diodes (LEDs) of LED arrays. The substrate is exposed to the ion beam to form a plurality of fins on the at least one grating. The at least one grating has a distribution of depths corresponding to the temperature distributions.

Layered waveguides, multi-layer waveguide displays with layered waveguides, and methods of fabricating layered waveguides with selective bonding material deposition and/or patterning.

Provided is an optical sensing member, comprising a light guide plate 102 which propagates light from a light source unit 108, detecting units 104, 106 which detect scattered light from the light guide plate 102 being touched, an optical member which guides the scattered light to the detecting units, and a primary control unit 118 which computes the touch location upon the light guide plate 102 on the basis of information relating to the detected light. The optical member has arc-shaped curved surfaces formed on the end parts which face each of the detecting units. Each of the detecting units outputs, as the information relating to the light which is detected by the detecting units, location information corresponding to the angle of entry to the detecting units of the light which is radiated from the facing arc-shaped curved surfaces. It is thus possible to clarify contours of the light which is detected by the detecting units, and to improve the precision of the detection of the touch location.

A system comprising a waveguide including an in-coupler and an out-coupler, and a digital micromirror device (DMD) to receive the light from the waveguide via the out-coupler, and to direct modulated light through the waveguide, the modulated light passing through the waveguide before being directed toward a user's eye.

Gray-tone lithography techniques for controlling the thickness profile of an overcoat layer on a surface-relief grating that has a non-uniform grating parameter (e.g., depth, duty cycle, or period), compensating for the non-uniform etch rate in a large area, defining etch/block regions, and/or controlling the thickness of the grating layer.

A waveguide display having an input image generator providing image light projected over a field of view; a waveguide having first and second external surfaces; and at least one grating optically coupled to the waveguide for extracting light towards a viewer. The waveguide has a lateral refractive index variation between said external surfaces that prevents any ray propagated within the waveguide from optically interacting with at least one of the external surfaces.

There is provided an illumination device comprising: a laser; a waveguide comprising at least first and second transparent lamina; a first grating device for coupling light from the laser into a TIR path in the waveguide; a second grating device for coupling light from the TIR path out of the waveguide; and a third grating device for applying a variation of at least one of beam deflection, phase retardation or polarization rotation across the wavefronts of the TIR light. The first second and third grating devices are each sandwiched by transparent lamina.

A display system includes a waveguide plate comprising an in-coupling grating, an expansion grating, and a sampling grating. The display system includes a projection system configured to direct input light toward the in-coupling grating. The in-coupling grating is configured to diffract the input light to propagate within the waveguide plate. The in-coupling grating is configured to (i) cause a display portion of the input light to propagate toward the expansion grating in a manner that avoids diffraction by the expansion grating and (ii) cause a sampling portion of the input light to propagate toward the sampling grating. The expansion grating is configured to (i) diffract the display portion of the input light to cause the display portion of the input light to continue to propagate within the waveguide plate. The sampling grating is configured to diffract the sampling portion of the input light outward from the waveguide plate.