An X-ray imaging system includes an X-ray detector; a plurality of X-ray sources configured to illuminate the detector from different perspectives; a shutter in a transmission plane between each X-ray source controlling transmission of X-rays from each X-ray source to the detector; and a processor configured to receive and process X-ray data from the detector. The shutter may be configured to illuminate the detector alternately with each X-ray source. The processor may determine 3D information about an object from the processed X-ray data. Also provided are methods for processing X-ray data and different embodiments of shutters to alternately illuminate X-ray detectors.

A non-destructive inspection method for inspecting an object to be inspected using a plurality of different types of non-destructive inspection means is shown. The method includes the following, fixedly forming common marks that can be detected by any of the plurality of non-destructive inspection means on the object to be inspected; then detecting the object to be inspected including the marks by the plurality of non-destructive inspection means respectively; and comparing the detection results by the plurality of non-destructive inspection means using the marks as positional references.

An X-ray imaging system includes an X-ray detector; a plurality of X-ray sources configured to illuminate the X-ray detector from different perspectives; a shutter in a transmission plane between each X-ray source controlling transmission of X-rays from each X-ray source to the X-ray detector; and a processor configured to receive and process X-ray data from the X-ray detector. The shutter may be configured to illuminate the X-ray detector alternately with each X-ray source. The processor may determine 3D information about an object from the processed X-ray data. Also provided are methods for processing X-ray data and different embodiments of shutters to alternately illuminate X-ray detectors.